IP Library › Granted Patent US 10,497,688
Granted Patent B2
US 10,497,688 · App. 15/926,040 · Granted Dec 3, 2019

Semiconductor device having stacked logic and memory chips

Inventors: Satoshi Tsukiyama (Yokohama, JP); Yoichiro Kurita (Minato, JP); Hideo Aoki (Yokohama, JP); Kazushige Kawasaki (Yokohama, JP)
Assignee: Toshiba Memory Corporation
H01L25/18H01L25/0657H01L25/043H01L25/074H01L25/0756H01L25/117H01L2225/06513H01L2225/06517H01L2225/06541H01L2225/06555H01L2225/06572H01L2225/06586H01L2225/06589
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Quick Facts
Patent No.
US 10,497,688
App. No.
15/926,040
Granted
Dec 3, 2019
Kind
B2
Abstract

A semiconductor device according to an embodiment includes a first memory chip having a first front surface and a first back surface and having a first memory circuit provided on the first front surface side; a second memory chip having a second front surface and a second back surface facing the first front surface, having a second memory circuit provided on the second front surface side, and being electrically connected to the first memory chip; and a logic chip having the first memory chip provided between the logic chip and the second memory chip, having a third front surface and a third back surface, having a logic circuit provided on the third front surface side, and being electrically connected to the first memory chip.

Claims (42)

1. A semiconductor device comprising:

a first memory chip having a first front surface and a first back surface, and the first memory chip including a first memory circuit provided on a first front surface side;

a second memory chip having a second front surface and a second back surface, the second back surface facing the first front surface, the second memory chip including a second memory circuit provided on a second front surface side, and the second memory chip being electrically connected to the first memory chip;

a logic chip, the first memory chip provided between the logic chip and the second memory chip, the logic chip having a third front surface and a third back surface, the logic chip including a logic circuit provided on a third front surface side, and the logic chip being electrically connected to the first memory chip;

a wiring body having a fourth front surface and a fourth back surface, the wiring body being provided between the logic chip and the first memory chip, either the third front surface or the third back surface of the logic chip facing the fourth back surface, the wiring body having a width larger than the first memory chip, the wiring body having a wiring, and the wiring body electrically connecting the first memory chip and the logic chip;

a first resin covering the first memory chip and the second memory chip, and the first resin being provided between the wiring body and the first memory chip; and

a plurality of second resins being different from the first resin provided between the wiring body and the first memory chip.

2. The semiconductor device according to claim 1 , wherein the wiring body has a resin layer, and the wiring is provided in the resin layer.

3. The semiconductor device according to claim 1 , further comprising:

an external terminal being provided on a fourth back surface side of the wiring body, and the external terminal being electrically connected to the wiring; and

a connection terminal being provided between the logic chip and the wiring body, and the connection terminal electrically connecting the logic chip and the wiring.

4. The semiconductor device according to claim 1 , wherein the first back surface and the third back surface face each other.

5. The semiconductor device according to claim 4 , wherein the logic chip includes a through electrode being provided in the logic chip, and the through electrode electrically connecting the logic circuit and the first memory chip.

6. A semiconductor device comprising:

a first memory chip having a first front surface and a first back surface, and the first memory chip including a first memory circuit provided on a first front surface side;

a second memory chip having a second front surface and a second back surface, the second memory chip including a second memory circuit provided on a second front surface side, the second front surface facing the first front surface, and the second memory chip being electrically connected to the first memory chip;

a logic chip, the first memory chip provided between the logic chip and the second memory chip, the logic chip having a third front surface and a third back surface, the logic chip including a logic circuit provided on a third front surface side, and the logic chip being electrically connected to the first memory chip;

a wiring body having a fourth front surface and a fourth back surface, the wiring body being provided between the logic chip and the first memory chip, either the third front surface or the third back surface of the logic chip facing the fourth back surface, the wiring body having a width larger than the first memory chip, the wiring body having a wiring, and the wiring body electrically connecting the first memory chip and the logic chip;

a first resin covering the first memory chip and the second memory chip, and the first resin being provided between the wiring body and the first memory chip; and

a plurality of second resins being different from the first resin provided between the wiring body and the first memory chip.

7. The semiconductor device according to claim 6 , wherein the wiring body has a resin layer, and the wiring is provided in the resin layer.

8. The semiconductor device according to claim 6 , further comprising:

an external terminal being provided on a fourth back surface side of the wiring body, and the external terminal being electrically connected to the wiring; and

a connection terminal being provided between the logic chip and the wiring body, and the connection terminal electrically connecting the logic chip and the wiring.

9. The semiconductor device according to claim 8 , wherein the external terminal and the connection terminal are electrically connected to each other without passing through a conductor closer to the fourth front surface than the wiring.

10. The semiconductor device according to claim 6 , wherein the volume ratio of a filler contained in the first resin is larger than the volume ratio of a filler contained in the second resin.

11. The semiconductor device according to claim 6 , wherein the first resin contains a filler, and the second resin does not contain a filler.

12. A semiconductor device comprising:

a first memory chip having a first front surface and a first back surface, and the first memory chip including a first memory circuit provided on a first front surface side;

a second memory chip having a second front surface and a second back surface, the second memory chip including a second memory circuit provided on a second front surface side, either the second front surface or the second back surface facing the first front surface, and the second memory chip being electrically connected to the first memory chip;

a logic chip, the first memory chip provided between the logic chip and the second memory chip, the logic chip having a third front surface and a third back surface, the logic chip including a logic circuit provided on a third front surface side, either the third front surface or the third back surface of the logic chip facing the first back surface, a width of the logic chip being smaller than a width of the first memory chip and a width of the second memory chip and the logic chip being electrically connected to the first memory chip;

a wiring body having a fourth front surface and a fourth back surface, the logic chip being provided between the wiring body and the first memory chip, either the third front surface or the third back surface of the logic chip facing the fourth front surface, the wiring body having a width larger than the first memory chip, the wiring body having a wiring, and the wiring body electrically connecting the first memory chip and the logic chip;

a first resin covering the first memory chip, the second memory chip and the logic chip, the first resin being provided between the wiring body and the first memory chip, and the first resin being provided between the wiring body and the logic chip; and

a plurality of second resins being different from the first resin, a first part of the plurality of second resins provided between the wiring body and the first memory chip.

13. The semiconductor device according to claim 12 , wherein a second part of the plurality of second resins are provided between the first memory chip and the second memory chip, the second part of the plurality of second resins is thinner than the first part of the plurality of second resins.

14. The semiconductor device according to claim 12 , wherein the first front surface facing the second back surface.

15. The semiconductor device according to claim 12 , wherein the first back surface facing the third front surface and the third back surface facing the fourth front surface.

16. The semiconductor device according to claim 12 , wherein the first back surface facing the third back surface and the third front surface facing the fourth front surface.

17. The semiconductor device according to claim 16 , wherein the logic chip includes a through electrode being provided in the logic chip, and the through electrode electrically connecting the logic circuit and the first memory chip.

18. The semiconductor device according to claim 12 , wherein a third part of the plurality of second resins is provided between the wiring body and the logic chip.

19. The semiconductor device according to claim 12 , further comprising:

an external terminal being provided on a fourth back surface side of the wiring body, and the external terminal being electrically connected to the wiring.

Assignments (4)
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 1, 2018
From: TSUKIYAMA, SATOSHI; KURITA, YOICHIRO; AOKI, HIDEO; KAWASAKI, KAZUSHIGE
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 045961/0076 →
Priority Claims (1)
JP 2017-179328 · Sep 19, 2017 · national
Continuity (1)
Related Publication 20190088634A1 · Mar 21, 2019
Cited By (2)
US 12,412,870 US 12,690,439