Conveyor assembly

1. A sample processing system comprising:

an instrument comprising a housing; and

a conveyor assembly configured to transport a carrier coupled to a receptacle to a processing position located within the housing of the instrument, wherein the conveyor assembly comprises:

a buffer conveyor subassembly for transporting the carrier coupled to the receptacle from a host conveyor assembly to a spur conveyor subassembly;

the spur conveyor subassembly, wherein the spur conveyor subassembly comprises:

a gripper configured to grasp the carrier coupled to the receptacle and

a diverter defining a first recess configured to receive the carrier, the diverter being rotatable between:

(i) a first position at which the first recess is aligned with and positioned to receive the carrier from an input section of the buffer conveyor subassembly,

(ii) a second position at which the first recess and the carrier received into the first recess at the first position are aligned with the gripper of the spur conveyor subassembly, and

(iii) a third position at which the first recess is aligned with and returns the carrier to an output section of the buffer conveyor assembly,

wherein the gripper is configured to grasp the carrier at the second position outside the housing of the instrument and to move the carrier along a linear path between the second position and the processing position located within the housing of the instrument; and

a cover enclosing at least a portion of the linear path between the second position and the processing position.

2. The sample processing system of claim 1 , wherein the input section of the buffer conveyor subassembly comprises a first track for transporting the carrier from the host conveyor assembly to the spur conveyor subassembly, and wherein the output section of the buffer conveyor subassembly comprises a second track for transporting the carrier away from the spur conveyor subassembly.

3. The sample processing system of claim 2 , wherein each of the first and second tracks comprises a movable component for transporting the carrier.

4. The sample processing system of claim 1 , wherein the buffer conveyor subassembly is perpendicular to the spur conveyor subassembly.

5. The sample processing system of claim 1 , wherein the diverter further defines a second recess, the second recess being at the first position when the first recess is at the second position.

6. The sample processing system of claim 5 , wherein the diverter further defines a third recess and is rotatable between the first position, the second position, and the third position at which the first recess is aligned with one of the input and output sections of the buffer conveyor subassembly, the second recess is aligned with the gripper, and the third recess is aligned with the other one of the input and output sections of buffer conveyor subassembly, wherein the first, second and third recesses are equally spaced about a periphery of the diverter.

7. The sample processing system of claim 6 , wherein the diverter is configured to simultaneously (i) return the carrier coupled to the receptacle from the first recess to the output section of the buffer conveyor subassembly, (ii) position a second carrier coupled to a second receptacle for transfer from the second recess to the gripper, and (iii) position the third recess at the first position to receive a third carrier coupled to a third receptacle into the third recess from the input section of the buffer conveyor subassembly.

8. The sample processing system of claim 6 , wherein the gripper comprises at least two movable prongs configured to contact the receptacle coupled to the carrier.

9. The sample processing system of claim 1 , wherein the linear path of the spur conveyor subassembly is a single path for transporting the carrier coupled to the receptacle from the second position to the processing position.

10. The sample processing system of claim 1 , wherein the spur conveyor subassembly comprises a track configured to transport the gripper along the linear path between the second position and the processing position.

11. The sample processing system of claim 1 , wherein the gripper is movably coupled to a base of the spur conveyor subassembly, and wherein the spur conveyor subassembly comprises a drive assembly coupled to the base, the drive assembly being configured to selectively move the gripper along the linear path between the second position and the processing position.

12. The sample processing system of claim 1 , wherein the gripper is configured to move between (i) an open configuration in which the carrier coupled to the receptacle is not secured by the gripper in the second position and (ii) a closed configuration in which the carrier coupled to the receptacle is secured by the gripper.

13. The sample processing system of claim 12 , wherein the gripper comprises at least two movable prongs configured to secure the carrier coupled to the receptacle to the gripper.

14. The sample processing system of claim 13 , wherein the at least two movable prongs comprise a first movable prong and a second movable prong, each being pivotally coupled to a base of the gripper.

15. The sample processing system of claim 14 , wherein the first movable prong and the second movable prong each comprise a first prong portion having an inner surface shaped to correspond to a perimeter of the carrier coupled to the receptacle.

16. The sample processing system of claim 15 , wherein the first movable prong and the second movable prong each comprise a second prong portion extending laterally from the first prong portion and overlapping at least a portion of the carrier coupled to the receptacle when the gripper is in the closed configuration.

17. The sample processing system of claim 16 , wherein the second prong portion of each of the first and second movable prongs is configured such that a distal end of each second prong portion contacts the receptacle coupled to the carrier when the gripper is in the closed configuration.

18. The sample processing system of claim 17 , wherein the distal end of each second prong portion comprises an elastomer that contacts the receptacle coupled to the carrier when the gripper is in the closed configuration.

19. The sample processing system of claim 15 , wherein the first prong portion of each of the first and second movable prongs defines a protrusion on the face of the first prong portion, the protrusion being configured to mate with a corresponding groove defined by the carrier coupled to the receptacle when the gripper is in the closed configuration.

20. The sample processing system of claim 1 , wherein the cover defines an opening which is aligned with the processing position and configured to permit a distal end of a pipettor of the instrument or an associated pipette tip of the pipettor to pass therethrough such that the opening of the cover allows the pipettor to access the contents of the receptacle coupled to the carrier at the processing position.

21. The sample processing system of claim 20 , wherein the cover comprises an alignment plate that defines a tapered surface surrounding the opening defined by the cover.

22. The sample processing system of claim 20 , wherein the spur conveyor subassembly comprises a receptacle alignment block, the receptacle alignment block defining a recess configured to receive a portion of the receptacle coupled to the carrier at the processing position, such that the orientation of the receptacle is aligned with the opening of the cover and the direction of travel of the pipettor of the instrument.