IP Library Granted Patent US 10,761,119
Granted Patent B2
US 10,761,119 · App. 15/961,698 · Granted Sep 1, 2020

Voltage threshold sensing systems and related methods

Inventors: Catalin Ionut Petroianu (Bucharest, RO); Alexandra-Oana Petroianu (Bucharest, RO); Pavel Londak (Hutisko Solanec, CZ)
Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
G01R19/16576G01R19/16519G01R19/16523
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,761,119
App. No.
15/961,698
Granted
Sep 1, 2020
Kind
B2
Abstract

Implementations of voltage sensing systems may include: a high side current mirror coupled to a reference current source coupled to at least one diode. The at least one diode may be coupled to a resistor and to a comparator. The resistor may be coupled to the ground. The comparator may be coupled with a reference voltage. The comparator may be configured to receive a comparison voltage from the diode and output whether the comparison voltage is higher or lower than the reference voltage.

Claims (20)

1. A voltage sensing system comprising:

a first high side current mirror comprising a first transistor and a second transistor, the first high side current mirror coupled to a first reference current;

a second high side current mirror comprising a third transistor and a fourth transistor, the second high side current mirror coupled to a second reference current;

a fifth transistor coupled between the second high side current mirror and the comparator;

at least one diode coupled between the first high side current mirror and the second high side current mirror, the at least one diode coupled to a comparator;

wherein the first high side current, the second high side current, and the at least one diode are coupled to ground;

wherein a current passed by the second transistor is greater than a current passed by the fourth transistor; and

wherein the comparator is coupled with a reference voltage and configured to receive a comparison voltage from the at least one diode and output whether the comparison voltage is one of higher and lower than the reference voltage.

2. The system of claim 1 , wherein the fifth transistor is an n-channel metal-oxide-semiconductor field-effect (NMOS) transistor.

3. The system of claim 1 , wherein the at least one diode is a Zener diode.

4. The system of claim 1 , wherein a gate of the first transistor and a gate of the second transistor are coupled to a drain of one of the first transistor and the second transistor.

5. The system of claim 1 , wherein a gate of the third transistor and a gate of the fourth transistor are coupled to a drain of one of the third transistor and the fourth transistor.

6. The system of claim 1 , wherein the first current mirror and the second current mirror further comprise two PMOS transistors coupled together.

7. The system of claim 1 , wherein the gate of the fifth transistor is coupled to the output of the fifth transistor.

8. A voltage threshold sensing system comprising:

two p-channel metal-oxide-semiconductor field-effect (PMOS) transistors coupled together, the gates of the two PMOS transistors coupled to the drain of a first one of the two PMOS transistors, the drain of the first one of the two PMOS transistors coupled with a constant current source, and a drain of a second one of the two PMOS transistors coupled to a diode;

wherein the diode is coupled with a high impedance input of a comparator and to a resistor coupled to ground; and

wherein the comparator is configured to determine whether a supply voltage coupled to the second one of the two PMOS transistors is one of above and below a reference voltage coupled to another high impedance input of the comparator.

9. The system of claim 8 , wherein the diode is a Zener diode.

10. The system of claim 8 , further comprising a second comparator coupled with a second reference voltage and configured to receive a second comparison voltage from the diode and output whether the comparison voltage is one of higher and lower than the reference voltage.

Assignments (3)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 047864, FRAME 0611 Recorded Jun 23, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064077/0298 →
PATENT SECURITY AGREEMENT Recorded Oct 16, 2018
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 047864/0611 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 24, 2018
From: PETROIANU, CATALIN IONUT; PETROIANU, ALEXANDRA-OANA; LONDAK, PAVEL
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 045627/0030 →
Continuity (2)
Provisional Application 62546701 · Aug 17, 2017
Related Publication 20190056435A1 · Feb 21, 2019