Method and apparatus for improved direct transfer of semiconductor die
A system to effectuate improved transfer of semiconductor die. A first frame secures a first substrate having the semiconductor die. A second frame secures a second substrate adjacent the first substrate. A needle is disposed adjacent to the first frame. The needle includes: a longitudinal surface extending in a direction toward the second frame, and a base end having a cross-sectional dimension being based, at least in part, on a cross-sectional dimension of the semiconductor die. A needle actuator is operably connected to the needle and is configured to actuate the needle such that, during the transfer operation, when the first substrate is secured in the first frame and the second substrate is secured in the second frame, the needle presses the semiconductor die into contact with the second substrate so as to transfer the semiconductor die onto the second substrate.
1. A system to effectuate improved transfer of semiconductor die during a transfer operation, the system comprising:
a first frame configured to secure a first substrate having the semiconductor die thereon;
a second frame configured to secure a second substrate adjacent the first substrate;
a needle disposed adjacent to the first frame, the needle including:
a longitudinal surface extending in a direction toward the second frame, and
a base end, a cross-sectional dimension of the base end being based, at least in part, on a cross-sectional dimension of the semiconductor die; and
a needle actuator operably connected to the needle, the needle actuator configured to actuate the needle such that, during the transfer operation, when the first substrate is secured in the first frame and the second substrate is secured in the second frame, the needle presses the semiconductor die into contact with the second substrate so as to transfer the semiconductor die onto the second substrate.
2. The system of claim 1 , wherein the second substrate includes a conductive trace, and
wherein the needle actuator is configured to actuate the needle to press the semiconductor die into contact with the conductive trace and transfer the semiconductor die onto the second substrate.
3. The system of claim 1 , wherein the needle further includes a tapered portion interposed between the longitudinal surface and the base end, and
wherein a height of the tapered portion is greater than a distance traveled by the needle during the transfer operation.
4. The system of claim 3 , wherein the needle includes a longitudinal central axis, and
wherein an angle between the longitudinal central axis and the tapered portion is about 10 degrees to about 15 degrees.
5. The system of claim 1 , wherein the needle further includes a radius of curvature interposed between the longitudinal surface and the base end, and
wherein the radius of curvature is based, at least in part, on the cross-sectional dimension of the semiconductor die.
6. The system of claim 1 , wherein the first substrate includes a first wafer tape, and
wherein the second substrate includes at least one of a second wafer tape or a product substrate.