IP Library Patent Application 16002025
Patent Application
App. No. 16/002,025

METHODS OF FABRICATING ELECTRONIC AND MECHANICAL STRUCTURES

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Patent No.
US None
App. No.
16/002,025
Abstract

The present invention relates to the fabrication of complicated electronic and/or mechanical structures and devices and components using homogeneous or heterogeneous 3D additive build processes. In particular the invention relates to selective metallization processes including electroless and/or electrolytic metallization.

Claims (33)

1 - 20 . (canceled)

21 . A method of fabricating a 3D structure, comprising:

providing a substrate having at least one integrated circuit disposed thereon;

depositing onto the substrate using 3D printing a first dielectric material to create a first patterned layer having at least one region in which the first dielectric material is deposited and at least one void region in which no first dielectric material is deposited;

depositing, on the first patterned layer, a second dielectric material to create a second patterned layer having at least one region in which the second dielectric material is deposited and at least one void region in which no second dielectric material is deposited; and

depositing a metal into selected portions of one or both of the at least one void regions of the first and second patterned layers, thereby providing a 3D structure.

22 . The method of claim 21 , wherein the 3D structure is an electronic structure.

23 . The method of claim 21 , wherein the substrate comprises a circuit board.

24 . The method of claim 21 , wherein the substrate comprises a nonplanar surface.

25 . The method of claim 21 , wherein one or both of the first and second patterned layers have portions of differing thickness.

26 . The method of claim 21 , wherein the first and second dielectric materials comprise the same material.

27 . The method of claim 21 , wherein the first and second dielectric materials comprise different materials.

28 . The method of claim 21 , wherein one or both of the first and second dielectric materials comprise a photoimageable material.

29 . The method of claim 28 , comprising patterning the photoimageable material using a photolithographic technique.

30 . The method of claim 21 , wherein one or both of the first and second dielectric materials comprise a metallization catalyst disposed therethrough.

31 . The method of claim 30 , comprising etching the dielectric material comprising the metallization catalyst to increase the number of catalyst sites in a surface thereof.

32 . The method of claim 30 , comprising exposing the first and second dielectric materials with metal-containing material to selectively deposit metal on the dielectric material containing the metallization catalyst.

33 . The method of claim 32 , wherein the metal-containing material comprises a gas or a vapor.

34 . The method of claim 21 , wherein only one of the first and second dielectric materials comprise a metallization catalyst disposed therethrough.

35 . The method of claim 34 , comprising exposing the first and second dielectric materials with a process that selectively deposits metal on the dielectric containing the metallization catalyst while not depositing metal on the other dielectric material.

36 . The method of claim 35 , wherein the process comprises atomic layer deposition.

37 . The method of claim 21 , comprising removing one or both of the first and second dielectric materials.

38 . The method of claim 21 , comprising milling one or both of the first and second layers to planarize the surface of the layer.

39 . The method of claim 21 , wherein the step of depositing the metal comprises deposition by electroless metallization.

40 . The method of claim 39 , wherein the metal comprises copper.

41 . The method of claim 21 , wherein the step of depositing the metal comprises deposition by electrolytic plating.

42 . The method of claim 41 , wherein the metal comprises copper.

43 . The method of claim 21 , wherein the metal comprises copper.

44 . A method of fabricating a 3D structure, comprising:

providing a substrate having at least one integrated circuit disposed thereon;

depositing onto the substrate using 3D printing a first dielectric material to create a patterned layer having at least one region in which the first dielectric material is deposited and at least one void region in which no first dielectric material is deposited;

depositing, on the first patterned layer, a second dielectric material different from the first dielectric material to create a second patterned layer having at least one region in which the second dielectric material is deposited and at least one void region in which no second dielectric material is deposited; and

exposing the first and second dielectric materials with a process that selectively deposits metal on only one of the first and second dielectric materials.

Assignments (4)
CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE INSIDE THE ASSIGNMENT DOCUMENTATION PREVIOUSLY RECORDED AT REEL: 048698 FRAME: 0301. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Apr 10, 2019
From: NUVOTRONICS, INC.
To: CUBIC CORPORATION
Reel/Frame 048843/0801 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 26, 2019
From: NUVOTRONICS, INC.
To: CUBIC CORPORATION
Reel/Frame 048698/0301 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 18, 2018
From: CARDWELL, DARA
To: NUVOTRONICS, INC
Reel/Frame 046901/0025 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 17, 2018
From: SHERRER, DAVID W
To: NUVOTRONICS, INC
Reel/Frame 046888/0936 →