IP Library › Granted Patent US 10,763,001
Granted Patent B2
US 10,763,001 · App. 16/002,304 · Granted Sep 1, 2020

Liquid precursor compositions, preparation methods thereof, and methods for forming layer using the composition

Inventors: Won Seok Han (Pyeongtaek-si, KR); Wonyong Koh (Daejeon, KR)
Assignee: UP CHEMICAL CO., LTD.
H01B1/02C07F15/065C09D11/52C23C16/18H01B1/08C23C16/06C23C16/45553H01L21/28556
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Quick Facts
Patent No.
US 10,763,001
App. No.
16/002,304
Granted
Sep 1, 2020
Kind
B2
Abstract

Liquid precursor compositions are provided, along with methods of preparing the liquid precursor compositions, and methods for forming layers using the liquid precursor composition, for example in vapor deposition processes such as CVD and ALD. In some embodiments, the liquid precursor compositions comprise a metal compound of the formula M(DAD) 2 , where M is Co or Ni and DAD is a diazadiene ligand.

Claims (21)

1. A method for forming a layer by vapor deposition, comprising:

depositing a layer containing a metal or metal compound using a liquid precursor composition comprising a metal compound of Chemical Formula 1:

M(DAD) 2 ;  <Chemical Formula 1>

wherein in the Chemical Formula 1,

M denotes Co, and

DAD denotes a diazadiene ligand represented by R 1 NC(R 3 )C(R 4 )NR 2 ,

wherein R 1 and R 2 are isopropyl groups and R 3 and R 4 are independently H or a linear or branched alkyl group of C 1-5 ,

wherein the metal compound is 90% or more of the liquid precursor composition, and

wherein the liquid precursor composition is liquid at room temperature.

2. The method of claim 1 ,

wherein depositing the layer comprises a metal organic chemical vapor deposition process or an atomic layer deposition process.

3. The method of claim 1 ,

wherein the liquid precursor composition comprises less than 10% impurities.

4. The method of claim 1 ,

wherein the liquid precursor composition consists essentially of the metal compound.

5. The method of claim 4 , wherein the liquid precursor composition consists essentially of Co( i PrNCHCHN i Pr) 2 .

6. The method of claim 1 , wherein the layer comprises greater than 80% Co.

7. A vapor deposition process for forming a Co-containing film on a substrate comprising contacting a substrate with a vapor phase reactant, wherein the vapor phase reactant is formed from a liquid precursor composition that is at least about 90% X( i PrNCHCHN i Pr) 2 , wherein X is Co, and wherein the liquid precursor composition is liquid at room temperature.

8. The vapor deposition process of claim 7 , wherein the vapor phase reactant is formed by vaporizing a liquid source material comprising the liquid precursor composition.

9. The vapor deposition process of claim 7 , wherein the film comprises greater than 80% Co.

10. The vapor deposition process of claim 7 , wherein the vapor deposition process is a chemical vapor deposition (CVD) or atomic layer deposition (ALD) process.

Assignments (2)
LICENSE Recorded Apr 21, 2022
From: UP CHEMICAL CO., LTD.
To: JIANGSU SHEKOY SEMICONDUCTOR NEW MATERIAL CO., LTD.
Reel/Frame 059671/0175 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 6, 2020
From: HAN, WON SEOK; KOH, WONYONG
To: UP CHEMICAL CO., LTD.
Reel/Frame 053125/0846 →
Priority Claims (1)
KR 10-2014-0072274 · Jun 13, 2014 · national
Continuity (3)
Continuation 15199705 · Jun 30, 2016
Continuation PCTKR2015005945 · Jun 12, 2015
Related Publication 20180286529A1 · Oct 4, 2018