IP Library › Granted Patent US 10,156,525
Granted Patent B2
US 10,156,525 · App. 16/009,244 · Granted Dec 18, 2018

Inspection apparatus, inspection method, and program

Inventor: Hajime Matsuda (Osaka, JP)
Assignee: Keyence Corporation
G01N21/8806G01N21/8851G06K9/2027G06K9/325G06T7/0004G06T7/0008G06T7/586G01N2021/845G01N2201/062G01N2201/12G06T2207/10152G06T2207/20016G06T2207/20221G06T2207/30164
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Quick Facts
Patent No.
US 10,156,525
App. No.
16/009,244
Granted
Dec 18, 2018
Kind
B2
Abstract

To facilitate adjusting of a distance from an inspection target to an illumination section by providing a movable illumination section that is movable independently of the imaging section. An illumination apparatus has a plurality of LEDs arranged in a substantially annular form, a light diffusion member for diffusing light emitted from the plurality of LEDs, and a lighting control part for lighting the plurality of light sources in accordance with a predetermined lighting pattern when designated to start lighting. In particular, the illumination apparatus moves independently of a camera to adjust a distance to a workpiece.

Claims (18)

1. An inspection apparatus comprising:

an illumination section which has a plurality of light segments to illuminate the inspection target from three or more illumination directions;

a processor for controlling the illumination section to light the plurality of light segments;

an imaging section for capturing a plurality of luminance images of an inspection target;

an inspection image generating section for obtaining a normal vector of a surface of the inspection target based on the three or more luminance images acquired by the imaging section and generating an inspection image based on the normal vector by a photometric stereo method;

a reference image setting section for setting a reference image acquired from a non-defective product;

an inspection region setting section for executing a pattern search on the inspection image by using the reference image to set a flaw inspection region in the inspection image; and

a flaw inspecting section for inspecting a flaw in the flaw inspection region,

wherein the determination section determines defectiveness/non-defectiveness of the inspection target based on a result of inspection by using the inspection image by the flaw inspection section.

2. The inspection apparatus according to claim 1 , wherein the setting section sets flaw detecting conditions including a flaw segment size and a flaw level.

3. The inspection apparatus according to claim 1 , further comprising:

a setting section for setting a character recognition region for the inspection image; and

a character recognizing section for recognizing a character in the character recognition region, wherein

the determination section determines defectiveness/non-defectiveness of the inspection target based on a result of recognition by using the inspection image by the character recognizing section.

4. The inspection apparatus according to claim 1 , further comprising

an adjustment section for adjusting a characteristic size which is a parameter that is required at the time of creating the inspection image.

5. The inspection apparatus according to claim 4 , wherein the inspection image generating section generates a plurality of inspection images based on respectively different characteristic sizes designated by the adjustment section.

6. The inspection apparatus according to claim 1 , wherein the inspection image generating section generates, as the inspection image, a surface shape image based on a normal vector of the surface of the inspection target or a texture image based on a reflectance of the surface of the inspection target.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 15, 2018
From: MATSUDA, HAJIME
To: KEYENCE CORPORATION
Reel/Frame 046096/0009 →
Priority Claims (1)
JP 2014-119102 · Jun 9, 2014 · national
Continuity (5)
Continuation 15686185 · Aug 25, 2017
Continuation 15586303 · May 4, 2017
Continuation 15290020 · Oct 11, 2016
Continuation 14718113 · May 21, 2015
Related Publication 20180292327A1 · Oct 11, 2018
Cited By (1)
US 12,682,590