Methods and apparatuses including a string of memory cells having a first select transistor coupled to a second select transistor

1. An apparatus comprising:

a memory cell string, comprising,

multiple memory cells, each memory cell including a control gate transistor,

a select gate drain transistor between the multiple memory cells and a bit line, the select gate transistor having a gate;

a first select gate source transistor on the opposite side of the multiple memory cells from the select gate drain transistor, and between the multiple memory cells and a source, the first select gate source transistor having a gate;

a second select gate source transistor coupled in series with the first select gate source transistor, and between the first select gate source transistor and the source, the second select gate source transistor having a gate; and

a first drive transistor coupled to both,

the gate of the select gate drain transistor; and

the gate of either the first select gate source transistor or the gate of the second select gate source transistor; and

wherein the first or second select gate source transistor that is coupled to the first drive transistor has a shorter channel length than that of the other select gate source transistor.

2. The apparatus of claim 1 , further comprising a second drive transistor coupled to the remaining gate of the first select gate source transistor or the second select gate source transistor, that is not coupled to the first drive transistor.

3. The apparatus of claim 1 , wherein the memory cell string further comprises a pillar arranged to form a channel for the multiple memory cells of the string, wherein the pillar is selectively coupled to the bit line by the select gate drain transistor.

4. The apparatus of claim 3 , wherein the memory cell string extends vertically between the source and the bit line, and wherein the pillar extends vertically adjacent vertically disposed memory cells of the memory cell string.

5. The apparatus of claim 4 , wherein the source extends beneath the first select gate source transistor, the second select gate source transistor, and the multiple memory cells of the memory cell string; and

wherein the bit line extends above the multiple memory cells of the memory cell string.

6. The apparatus of claim 1 , wherein the pillar is U-shaped, and wherein the source extends above a first leg of the U-shape, and wherein the bit line extends above the second leg of the U-shape;

wherein the first select gate source transistor and the second select gate source transistor extend between the source and a first group of the multiple memory cells adjacent the first leg of the U-shape; and

wherein the select gate drain transistor extends between the hit line and a second group of the multiple memory cells adjacent the second leg of the U-shape.

7. The apparatus of claim 1 , wherein a first group of memory cells of the multiple memory cells is serially coupled to a second group of memory cells of the multiple memory cells through a pass transistor.

8. A memory array, comprising:

multiple memory cell strings situated in a grid comprising rows and columns of memory cell strings, each memory cell string extending between a connection to a source and a connection to a respective bit line, each memory cell string comprising,

multiple charge storage memory cells connected in series, each charge storage memory cell including a control gate transistor and a charge storage structure;

a select gate drain transistor electrically between the multiple memory cells and a respective bit line, the select gate transistor having a gate;

a first select gate source transistor on the opposite side of the multiple memory cells from the select gate drain transistor, and between the multiple memory cells and a source, the first select gate source transistor having a gate;

a second select gate source transistor coupled in series with the first select gate source transistor, and between the multiple memory cells and the source, the second select gate source transistor having a gate; and

a first drive transistor coupled to both,

the gates of select gate drain transistors of a first group of memory cell strings, the first group of memory cell strings extending in a first row or a first column of the grid, and

the gates of the first select gate source transistors of the first group of memory cell strings;

a second drive transistor coupled to both,

the gates of select gate drain transistors of a second group of memory cell strings, the second group of memory cell strings extending in a second row or a second column of the grid, and

the gates of the first select gate source transistors of the second group of memory cell strings; and

a third drive transistor coupled to gates of the second select gate source transistors in the memory cell strings of the first and second groups of memory cell strings.

9. The memory array of claim 8 , wherein the second select gate source transistors have a channel length greater than that of the first select gate source transistors.

10. The memory array of claim 8 , wherein the second select gate source transistor in each of the memory strings is located between the first select gate source transistor and the source.

11. A method of performing a read operation of a memory array, comprising:

precharging channels of a group of multiple strings of memory cells to a precharge voltage;

through use of a first drive transistor, cutting off the channels of multiple unselected strings of memory cells by driving a gate of a drain select transistor in each of the multiple unselected strings of memory cells and a gate of a first source select transistor in each of the multiple unselected strings of memory cells to a reference voltage to turn off the transistors;

driving a gate of a selected memory cell of a selected string of memory cells to a read voltage; and

determining a stored data value of the selected memory cell based on a signal on a data line.

12. The method of claim 11 , wherein each of the multiple strings of memory cells further includes a second source select transistor, and wherein pre-charging channels of the group of multiple strings of memory cells to a precharge voltage comprises driving the gates of the drain select transistor and of the first and second source select transistors to place the transistors in a conductive state.

13. The method of claim 11 , further comprising:

driving a gate of an unselected memory cell of the selected string of memory cells to a voltage greater than the read voltage.