Systems and apparatuses for a configurable temperature dependent reference voltage generator

1. An apparatus comprising:

control logic configured to receive temperature data and produce a signal based on the temperature data, the signal indicative of at least a temperature slope; and

a temperature slope reference generator configured to produce a reference voltage having a temperature dependence and the temperature slope based on the signal,

wherein the temperature slope reference generator further comprises a temperature slope trim resistance stack configured to change in resistance based at least in part on the signal produced by the control logic.

2. The apparatus of claim 1 , wherein the control logic produces the signal indicative of the temperature dependence.

3. The apparatus of claim 2 , wherein the temperature dependence is one of a proportional to absolute temperature, a complementary to absolute temperature, or a flat temperature dependence.

4. The apparatus of claim 1 , wherein the temperature slope is determined, at least in part, by a temperature sensitivity of the reference voltage, wherein temperature sensitivity determines a threshold change in temperature data needed to cause a voltage change in the reference voltage, and wherein the control logic is configured to adjust the temperature sensitivity of the reference voltage.

5. The apparatus of claim 1 , wherein the temperature slope is based at least in part on the temperature slope trim resistance stack, wherein the temperature slope trim resistance stack defines the amount of voltage change in the reference voltage in relation to a change in the temperature data.

6. The apparatus of claim 1 , wherein the temperature slope reference generator further comprises a voltage shift resistance stack configured to cause a direct-current voltage shift in the reference voltage.

7. The apparatus of claim 1 , wherein the control logic is communicatively coupled with a process monitor, wherein the process monitor is configured to provide one or more control signals indicative of a process corner to the control logic, wherein the control logic determines at least one of the temperature dependence and the temperature slope based, at least in part, on the process corner.

8. The apparatus of claim 1 , wherein the control logic is configured to produce the signal indicative of clipping behavior at least one of a high threshold temperature or a low threshold temperature.

9. The apparatus of claim 8 , wherein the temperature slope reference generator is further configured to clip the reference voltage at the at least one of the high threshold temperature or the low threshold temperature.

10. A method comprising:

receiving temperature data, via control logic, and generating a signal based on the temperature data, the signal indicative of at least a temperature slope associated with the temperature data;

generating a reference voltage, via a temperature slope reference generator, the reference voltage having the temperature slope, based on the signal; and

determining the temperature slope, at least in part, by a temperature sensitivity of the reference voltage, wherein the temperature sensitivity determines a threshold change in the temperature data sufficient to cause a voltage change in the reference voltage, and wherein the control logic is configured to adjust the temperature sensitivity of the reference voltage.

11. The method of claim 10 , wherein generating the signal based on the temperature data comprises generating the signal indicative of a temperature dependence.

12. The method of claim 11 , wherein generating the signal indicative of the temperature dependence includes generating the signal indicative of a proportional to absolute temperature, a complementary to absolute temperature, or a flat temperature dependence.

13. The method of claim 10 , further comprising changing resistance of a temperature slope trim resistance stack based at least in part on the signal produced by the control logic.

14. The method of claim 13 , further comprising defining, via the temperature slope trim resistance stack, the amount of voltage change in the reference voltage in relation to a change in the temperature data.

15. The method of claim 10 , further comprising actuating, via the temperature slope reference generator, a direct-current voltage shift in the reference voltage.

16. The method of claim 10 , further comprising providing, via a process monitor, one or more control signals indicative of a process corner to the control logic.

17. The method of claim 16 , further comprising determining, via the control logic, at least one of the temperature dependence and the temperature slope based, at least in part, on the process corner.

18. The method of claim 10 , wherein generating the signal includes generating the signal indicative of clipping behavior at least one of a high threshold temperature or a low threshold temperature.

19. The method of claim 18 , further comprising clipping, via the temperature slope reference generator, the reference voltage at the at least one of the high threshold temperature or the low threshold temperature.

20. An apparatus comprising:

control logic configured to receive temperature data and produce a signal based on the temperature data, the signal indicative of at least a temperature slope; and

a temperature slope reference generator configured to produce a reference voltage having a temperature dependence and the temperature slope based on the signal, wherein the temperature slope reference generator further comprises a voltage shift resistance stack configured to cause a direct-current voltage shift in the reference voltage.