Dual-rail delay insensitive asynchronous logic processor with single-rail scan shift enable
There is disclosed a self-timed processor. The self-timed processor includes combinatorial logic comprising multi-rail delay insensitive asynchronous logic (DIAL) to output one or more multi-rail data values to a multiplexer. It also includes a test pattern input to output a test pattern bit stream of multi-rail test data values to the multiplexer. The multiplexer has Boolean logic to output one or more multi-rail multiplexed values to a latch. The multiplexer also has a single rail selector input to select whether the multi-rail multiplexed values are the multi-rail data values or the multi-rail test data values.
1. A self-timed processor comprising:
combinatorial logic comprising multi-rail delay insensitive asynchronous logic (DIAL) to output one or more multi-rail data values to a multiplexer;
a test pattern input to output a test pattern bit stream of multi-rail test values to the multiplexer;
the multiplexer comprising Boolean logic to output one or more multi-rail multiplexed values to a latch, the multiplexer having a single rail selector input to select whether the multi-rail multiplexed values are the multi-rail data values or the multi-rail test values;
the Boolean logic comprising:
a first multiplexer logic that is I) a first Boolean AND gate to receive a) a first-rail input of the multi-rail data values, and b) an inverse of a first Boolean input from the single rail selector input; II) a second Boolean AND gate to receive a) a first-rail input of the multi-rail test values, and b) the first Boolean input from the single rail selector input; and III) a Boolean OR gate to receive outputs of the first and second Boolean AND gates of the first multiplexer logic; and
a second multiplexer logic that is I) a first Boolean AND gate to receive a) a second-rail input of the multi-rail data values, and b) the inverse of the first Boolean input from the single rail selector input; II) a second Boolean AND gate to receive a) a second-rail input of the multi-rail test values, and b) the first Boolean input from the single rail selector input; and III) a Boolean OR gate to receive outputs of the first and second Boolean AND gates of the second multiplexer logic.
2. The self-timed processor of claim 1 , further comprising the latch, the latch comprising multi-rail delay insensitive asynchronous logic (DIAL) to receive the multi-rail multiplexed values.
3. The self-timed processor of claim 2 , wherein the latch comprises flip-flops or storage elements for storing the multi-rail multiplexed values.
4. The self-timed processor of claim 3 , wherein the latch includes multi-rail delay insensitive asynchronous logic (DIAL) to output one or more multi-rail data values based on the stored multi-rail multiplexed values.
5. The self-timed processor of claim 1 , wherein the test pattern bit stream comprises a sequence of predetermined serial test pattern of multi-rail test data values.
6. The self-timed processor of claim 1 , wherein the combinatorial logic and latch include threshold gates.
7. The self-timed processor of claim 1 , wherein the test pattern input is configured to receive data from a source external to the processor.
8. An asynchronous processor comprising:
combinatorial logic comprising delay insensitive asynchronous logic (DIAL) to output one or more dual-rail data values to a multiplexer;
a test pattern input to output a test pattern of dual-rail test values to the multiplexer;
the multiplexer comprising an inverter and Boolean logic to output one or more dual-rail multiplexed values to a latch, the multiplexer having a Boolean value selector input to select whether the dual-rail multiplexed values are the dual-rail data values or the dual-rail test values;
the Boolean logic comprising:
a first multiplexer logic that is I) a first Boolean AND gate to receive a) a first-rail input of the dual-rail data values, and b) an inverse of a first Boolean input from the Boolean value selector input; II) a second Boolean AND gate to receive a) a first-rail input of the dual-rail test values, and b) an inverse of the first Boolean input from the Boolean value selector input; and III) a Boolean OR gate to combine outputs of the first and second Boolean AND gates of the first multiplexer logic; and
a second multiplexer logic that is I) a first Boolean AND gate to receive a) a second-rail input of the dual-rail data values, and b) the inverse of the first Boolean input from the Boolean value selector input; II) a second Boolean AND gate to receive a) a second-rail input of the dual-rail test values, and b) the first Boolean input from the Boolean value selector input; and III) a Boolean OR gate to combine outputs of the first and second Boolean AND gates of the second multiplexer logic.
9. The asynchronous processor of claim 8 , wherein the combinatorial logic and latch include threshold gates.
10. The asynchronous processor of claim 8 , wherein the test pattern input is configured to receive data from a source external to the processor.
11. A method of processing data within a self-timed processor, comprising:
receiving one or more multi-rail DIAL data values;
receiving a test pattern bit stream of multi-rail DIAL test values; and
selecting to output the multi-rail DIAL data values to use a latch or the multi-rail test values to test the latch based on a single rail selector input,
wherein selecting includes:
first multiplexer logic I) first Boolean AND gating a) a first-rail input of the multi-rail DIAL data values, and b) an inverse of a first Boolean input from the single rail selector input; II) second Boolean AND gating a) a first-rail input of the multi-rail DIAL test values, and b) the first Boolean input from the single rail selector input; and III) Boolean OR gating only outputs of the first and second Boolean AND gates of the first multiplexer logic; and
second multiplexer logic I) first Boolean AND gating a) a second-rail input of the multi-rail DIAL values, and b) the inverse of the first Boolean input from the single rail selector input; II) second Boolean AND gating a) a second-rail input of the multi-rail DIAL test values, and b) the first Boolean input from the single rail selector input; and III) Boolean OR gating only outputs of the first and second Boolean AND gates of the second multiplexer logic.
12. The method of claim 11 , further comprising receiving the single rail selector input.
13. The method of claim 11 , wherein selecting comprises:
receiving at the first multiplexer logic a) the first-rail inputs of the multi-rail DIAL data values and of the multi-rail DIAL test values, and b) the Boolean inputs based on the single rail selector input; and
receiving at the second multiplexer logic a) the second-rail inputs of the multi-rail DIAL data values and of the multi-rail DIAL test values, and b) the Boolean inputs based on the single rail selector input.
14. The method of claim 11 , further comprising:
outputting the selected multi-rail DIAL data values or multi-rail DIAL test values to a latch as one or more multi-rail multiplexed values; and
receiving the multi-rail multiplexed values at the latch.
15. The method of claim 14 , further comprising:
storing the received the multi-rail multiplexed values in multi-rail delay insensitive asynchronous logic (DIAL) of the latch; and
outputting one or more multi-rail data values based on the stored multi-rail multiplexed values.
16. The method of claim 11 , wherein receiving the test pattern bit stream comprises receiving a sequence of predetermined serial test pattern of multi-rail test data values from a source external to the processor.