Measurement circuit

1. A measurement circuit for monitoring at least one parameter of an input signal received from an external signal source, the measurement circuit comprising:

at least one first measurement element coupled to the input signal and configured to provide an analog output signal indicative of a respective one or more of the at least one parameter of the input signal;

an analog to digital converter (ADC) coupled to receive a signal indicative of the analog output signal at a first input and a reference voltage at a second input and configured to provide a digital output signal representative of the analog output signal at an output thereof, wherein the ADC has an associated gain and a gain level, the ADC gain related to a voltage level of the reference voltage;

at least one second measurement element configured to have a characteristic indicative of a stress condition associated with the at least one first measurement element; and

a compensation circuit responsive to an output of the at least one second measurement element and to a reference signal to generate a compensation signal indicative of a difference between the output of the at least one second measurement element and the reference signal, the difference indicating a change from a calibrated level for the stress condition associated with the at least one first measurement element, wherein the voltage level of the reference voltage is adjusted in response to the compensation signal.

2. The measurement circuit of claim 1 , wherein the at least one first measurement element comprises a plurality of measurement elements.

3. The measurement circuit of claim 1 , wherein the at least one second measurement element comprises a plurality of measurement elements.

4. The measurement circuit of claim 1 , wherein the at least one first measurement element comprises a resistor.

5. The measurement circuit of claim 1 , wherein the at least one second measurement element comprises a resistor.

6. The measurement circuit of claim 1 , wherein the at least one second measurement element comprises a plurality of parallel-coupled measurement elements.

7. The measurement circuit of claim 1 , wherein the at least one parameter includes at least one of voltage, current, power, frequency, power factor, demand and energy.

8. The measurement circuit of claim 1 , wherein an amount by which the voltage level is adjusted is selected to provide for an end to end system gain of about zero from nominal.

9. The measurement circuit of claim 1 , wherein the at least one second measurement element is substantially the same as the at least one first measurement element.

10. The measurement circuit of claim 1 , wherein the stress condition is at least one of a temperature condition or an exposure to humidity and/or chemical interactions greater than a predetermined level.

11. The measurement circuit of claim 1 , wherein the at least one first measurement element is supported by a same material substrate as the at least one second measurement element.

12. The measurement circuit of claim 1 , wherein the at least one first measurement element is supported by a different material substrate than the at least one second measurement element.

13. The measurement circuit of claim 1 , wherein the measurement circuit is a measurement circuit for use in a metering device.

14. The measurement circuit of claim 13 , wherein the metering device is a metering device for use in a power system.

15. A method for monitoring at least one parameter of an input signal received from an external signal source, comprising:

providing at least one first measurement element coupled to the input signal and configured to provide an analog output signal indicative of a respective one or more of the at least one parameter of the input signal;

providing an analog to digital converter (ADC) coupled to receive a signal indicative of the analog output signal at a first input and a reference voltage at a second input and configured to provide a digital output signal representative of the analog output signal at an output thereof, wherein the ADC has an associated gain and a gain level, the ADC gain related to a voltage level of the reference voltage;

providing at least one second measurement element configured to have a characteristic indicative of a stress condition associated with the at least one first measurement element;

comparing an output of the at least one second measurement element to a reference signal using a compensation circuit to generate a compensation signal indicative of a difference between the output of the at least one second measurement element and the reference signal, the difference indicating a change from a calibrated level for the stress condition associated with the at least one first measurement element; and

adjusting the voltage level of the reference voltage in response to the compensation signal.

16. The method of claim 15 , wherein the at least one second measurement element comprises a resistor.

17. The method of claim 15 , wherein the at least one parameter includes at least one of voltage, current, power, frequency, power factor, demand and energy.

18. The method of claim 15 , wherein an amount by which the voltage level is adjusted is selected to provide for an end to end system gain of about zero from nominal.

19. The method of claim 15 , wherein the at least one second measurement element is substantially the same as the at least one first measurement element.

20. The method of claim 15 , wherein the stress condition is at least one of a temperature condition or an exposure to humidity and/or chemical interactions greater than a predetermined level.