Apparatus for modelling ocular structures
An apparatus for motion compensated modelling of a parameter of an eye, comprising: a first measuring means for measuring a plurality of position parameters of the eye with respect to an optical reference coordinate system of the apparatus; a second measuring means for measuring an interference signal at a plurality of optical reference coordinates, wherein the measurement of the plurality of position parameters and measurement of the interference signal are time synchronised; means for correcting the interference signal to account for a displacements of a parameter of the plurality of position parameters; and means for modelling the eye parameter based at least in part on the corrected interference signal.
1. An apparatus for motion compensated modelling of a parameter of an eye, comprising:
a light source for illuminating a targeted ocular surface with a least one incident light beam and directing at least two light beams returning from the illuminated targeted ocular surface to an image forming device;
an imaging device for measuring a plurality of position parameters of the eye with respect to an optical reference coordinate system of the apparatus based on an image formed in the image forming device;
an Optical Coherence Tomography (OCT) device for directing an OCT imaging beam at the targeted ocular surfaces for measuring an interference signal associated with the OCT imaging beam at a plurality of optical reference coordinates, wherein the measurement of the plurality of position parameters and measurement of the interference signal are time synchronized;
a controller comprising a processor and a computer-readable containing instructions which, when executed by the processor, cause the controller to correct the interference signal to account for a displacements of a parameter of the plurality of position parameters and modelling the eye parameter based at least in part on the corrected interference signal.
2. The apparatus according to claim 1 , wherein the plurality of position parameters include one or more of a lateral displacement along an x axis of the optical reference coordinate system, lateral displacement along a y axis of the optical reference coordinate system and axial displacement along a z axis of the optical reference coordinate system.
3. The apparatus according to claim 1 , wherein the plurality of position parameters include cyclorotation around the z-axis.
4. The apparatus according to claim 1 , wherein the plurality of position parameters include rotation around the x axis and rotation around the y axis.
5. The apparatus according to claim 1 , wherein measuring a plurality of position parameters includes interpolating between measurements of the plurality of position parameters.
6. The apparatus according to claim 1 , wherein the instructions further cause the controller to determine a reference location of the second measuring device and correct said reference location based on the measured position parameters.
7. The apparatus according to claim 1 , wherein the instructions further cause the controller to correct an optical path length based on a difference in an optical path length between an off-axis ray-traced path length and a path length along the z axis of the optical reference coordinate system.
8. The apparatus according to claim 1 , wherein the imaging device measures a position parameter based on a retinal reflex.
9. The apparatus according to claim 7 , wherein the instructions further cause the controller to iteratively correct the optical path length.
10. The apparatus according to claim 1 , wherein the ocular surface includes one or more of an anterior corneal surface, a posterior corneal surface, an anterior lens surface, a posterior lens surface or a retinal surface.
11. The apparatus according to claim 10 , wherein the imaging device is selected from a list including a Purkinje Mirror Imaging device, an Optical coherence Tomography Device or a Scheimpflug Imaging System.
12. The apparatus according to claim 10 , wherein the instructions further cause the controller to determine refraction at the ocular surface and correct the modelled eye parameter based on the determined refraction.
13. The apparatus of claim 12 , wherein the instructions further cause the controller to correct the interference signal to account for a displacement of a parameter of the plurality of position parameters by correcting for an optical path difference associated with the interference signal using the determined refraction.