IP Library Granted Patent US 10,950,469
Granted Patent B2
US 10,950,469 · App. 16/032,285 · Granted Mar 16, 2021

Semiconductor manufacturing apparatus and method of manufacturing semiconductor device

Inventors: Jun Takagi (Yokkaichi, JP); Shinichi Hirasawa (Mie, JP)
Assignee: TOSHIBA MEMORY CORPORATION
H01L21/67092B24B37/015B24B37/042B24B37/107B24B37/20B24B57/02
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Quick Facts
Patent No.
US 10,950,469
App. No.
16/032,285
Granted
Mar 16, 2021
Kind
B2
Abstract

In one embodiment, a semiconductor manufacturing apparatus includes a polishing table configured to hold a polishing pad, a polishing head configured to hold a substrate to be polished by the polishing pad, and a polishing liquid feeder configured to feed a polishing liquid to the polishing pad. The apparatus further includes a heat exchanger configured to be placed on the polishing pad and control temperatures of the polishing pad and the polishing liquid, and one or more protruding portions provided on a side face or a bottom face of the heat exchanger.

Claims (30)

1. A semiconductor manufacturing apparatus comprising:

a polishing table configured to hold a polishing pad;

a polishing head configured to hold a substrate to be polished by the polishing pad;

a polishing liquid feeder configured to feed a polishing liquid to the polishing pad;

a heat exchanger configured to be placed on the polishing pad and control temperatures of the polishing pad and the polishing liquid; and

one or more protruding portions provided on a side face or a bottom face of the heat exchanger.

2. The apparatus of claim 1 , wherein the protruding portions have shapes linearly extending from the side face of the heat exchanger.

3. The apparatus of claim 2 , wherein the protruding portions have planar shapes of straight lines, curved lines or bent lines.

4. The apparatus of claim 1 , wherein the protruding portions are provided on the side face of the heat exchanger, and are provided at positions to come into contact with the polishing liquid fed to the polishing pad.

5. The apparatus of claim 1 , wherein the protruding portions are provided on the side face of the heat exchanger, and are located on an upstream side of a rotation direction of the polishing pad from the heat exchanger.

6. The apparatus of claim 1 , wherein the protruding portions are provided on the side face of the heat exchanger, and are located on a downstream side of a rotation direction of the polishing pad from the heat exchanger.

7. The apparatus of claim 1 , wherein bottom faces of the protruding portions are flat faces.

8. The apparatus of claim 1 , wherein at least one of the protruding portions includes a convex portion or a concave portion on the bottom face of the protruding portion.

9. The apparatus of claim 8 , wherein the at least one of the protruding portions alternately includes a plurality of convex portions and a plurality of concave portions on the bottom face of the protruding portion.

10. The apparatus of claim 1 , wherein the protruding portions are provided on the heat exchanger so as to be movable in a vertical direction relative to the heat exchanger.

11. A method of manufacturing a semiconductor device, comprising:

holding a polishing pad by a polishing table;

feeding a polishing liquid to the polishing pad;

placing, on the polishing pad, a heat exchanger provided with one or more protruding portions on a side face or a bottom face thereof;

controlling temperatures of the polishing pad and the polishing liquid by the heat exchanger; and

polishing a substrate by the polishing pad on which the polishing liquid is fed.

12. The method of claim 11 , wherein the protruding portions have shapes linearly extending from the side face of the heat exchanger.

13. The method of claim 12 , wherein the protruding portions have planar shapes of straight lines, curved lines or bent lines.

14. The method of claim 11 , wherein the protruding portions are provided on the side face of the heat exchanger, and are provided at positions to come into contact with the polishing liquid fed to the polishing pad.

15. The method of claim 11 , wherein the protruding portions are provided on the side face of the heat exchanger, and are located on an upstream side of a rotation direction of the polishing pad from the heat exchanger.

16. The method of claim 11 , wherein the protruding portions are provided on the side face of the heat exchanger, and are located on a downstream side of a rotation direction of the polishing pad from the heat exchanger.

17. The method of claim 11 , wherein bottom faces of the protruding portions are flat faces.

18. The method of claim 11 , wherein at least one of the protruding portions includes a convex portion or a concave portion on the bottom face of the protruding portion.

19. The method of claim 18 , wherein the at least one of the protruding portions alternately includes a plurality of convex portions and a plurality of concave portions on the bottom face of the protruding portion.

20. The method of claim 11 , wherein the protruding portions are provided on the heat exchanger so as to be movable in a vertical direction relative to the heat exchanger.

Assignments (4)
CHANGE OF NAME AND ADDRESS Recorded Feb 4, 2022
From: K.K PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 058957/0124 →
CHANGE OF NAME AND ADDRESS Recorded Jan 31, 2022
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 058905/0582 →
MERGER Recorded Jan 31, 2022
From: TOSHIBA MEMORY CORPORATION
To: K.K PANGEA
Reel/Frame 058946/0675 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 11, 2018
From: TAKAGI, JUN; HIRASAWA, SHINICHI
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 046317/0978 →