Patent Assignment
Reel/Frame 058946/0675
Merger
Recorded: 2022-01-31
Pages: 12
Assignor
TOSHIBA MEMORY CORPORATION
Executed: 2018-08-01
Assignee
K.K PANGEA
PALACE BUILDING 5TH FLOOR, 1-1, MARUNOUCHI 1-CHOME, CHIYODA-KU, TOKYO, JAPAN
Covered Properties
(197)
Information Processing Apparatus and Nonvolatile Semiconductor Memory Drive
Memory System
Memory System
Memory System Having a Plurality of Writing Modes
Command Load Balancing for Nvme Dual Port Operations
Manufacturing Method of Semiconductor Device and Semiconductor Manufacturing Apparatus
Semiconductor Manufacturing Apparatus
Memory Device That Controls Timing of Receiving Write Data from a Host
Analysis Pretreatment Device
Data Processing Device, Data Processing Method, and Non-Transitory Computer Readable Medium
Semiconductor Memory Device Including an Asymmetrical Memory Core Region
Magnetic Memory Device
Reconstruction of Address Mapping in a Host of a Storage System
Multi-Chip Package and Memory System
Patent:
48,449 →
Application:
15/366,617 →
Namespace - Resizing
Mold and Transfer Molding Apparatus
Integrated Heterogeneous Solid State Storage Drive
Performance Based Method and System for Patrolling Read Disturb Errors in a Memory Unit
Memory System, Host Device and Information Processing System for Error Correction Processing
Extending Ssd Longevity
Managing Function Level Reset in an Io Virtualization-Enabled Storage Device
Credit Based Command Scheduling
Memory System That Constructs Virtual Storage Regions for Virtual Machines
Memory Controller
Memory System That Stores Data Designated by a Deletion Request in Nonvolatile Memory
Semiconductor Device and Manufacturing Method Thereof
Storage System
Mold
Semiconductor Memory Device and Method for Manufacturing Same
Manufacturing Method of Semiconductor Device and Semiconductor Device Manufacturing Apparatus
Memory Device and Non-Transitory Computer Readable Recording Medium
Semiconductor Storage Device and Control Method of Semiconductor Storage Device with Detecting Levels of a Multi-Ary Signal
Guide Layout Creating Apparatus, Guide Layout Creating Method and Recording Medium
Method of Manufacturing Semiconductor Device
Template, Template Component, and Semiconductor Device Manufacturing Method
Semiconductor Storage Device Having a Group Adjacent Bit Lines Connected to Sense Circuits That Are Each Connected to a Different Data Bus
Film Forming Apparatus and Film Forming Method
Memory Device
Three-dimensional NAND memory device with source line comprising metallic and semiconductor layers
Memory System Including Multiple Memories Connected in Series
Reflection Type Exposure Mask and Pattern Forming Method
Memory Device Including Non-Volatile Memory and Method of Managing Data Thereof
Mask Manufacturing Method and Mask Set
Polishing Apparatus, Polishing Method, and Polishing Control Apparatus
Memory Device
Semiconductor Manufacturing Apparatus
Polishing Device, Polishing Method, and Record Medium
Semiconductor Device and Method for Manufacturing Same
Workload-Adaptive Overprovisioning in Solid State Storage Drive Arrays
Pattern Formation Method and Pattern Formation Material
Memory Device
Magnetoresistive Effect Element and Method of Manufacturing the Same
Semiconductor Memory Device
Memory System Including an Error Correction Function
Substrate Treatment Apparatus and Manufacturing Method of Semiconductor Device
Memory System
Memory System and Control Method for Garbage Collection in a Memory System
Storage Device and Communication Control Method
Memory System and Method for Controlling Nonvolatile Memory
Memory System and Method of Controlling Nonvolatile Memory
Memory Device
Solid-State Drive with Non-Volatile Random Access Memory
Memory Controller Configured to Transmit Interrupt Signal If Volatile Memory Has No Data Corresponding to Address Requested from Source
Tester Calibration Device and Tester Calibration Method
Production Method of Semiconductor Device
Semiconductor Manufacturing Apparatus and Method of Manufacturing Semiconductor Device
Substrate Processing Control Apparatus, Recording Medium, and Method of Manufacturing Photomask
Information Processing Apparatus, Storage Device, and Method Performed by Host System
Electronic Device
Patent:
48,664 →
Application:
16/038,299 →
Failure Analyzing Apparatus and Failure Analyzing Method
Memory System and Method of Controlling Memory System
Semiconductor Processing Device
Storage Device and Computer System
Electronic Device, Computer System, and Control Method
Equalizer Circuit and Control Method of Equalizer Circuit
Semiconductor Memory and Method of Manufacturing the Same
Imprint Apparatus, Imprint Method, and Method of Manufacturing Semiconductor Device
Manufacturing Method of Replica Template, Manufacturing Method of Semiconductor Device, and Master Template
Imprinting System, Method of Manufacturing Semiconductor Device, and Recording Medium
Memory Device with Multiple Layers
Semiconductor Device
Semiconductor Memory
Semiconductor Memory Device
Sample Analyzer and Sample Analysis Method
Electrolytic Plating Apparatus
Semiconductor Measurement Device and Method of Measuring Semiconductor
Measurement Apparatus for Measuring Height or Shape of a Surface of a Material
Semiconductor Device Package with Radiation Shield
Semiconductor Storage Device
Semiconductor Memory Device and Manufacturing Method Therefor
Semiconductor Memory Device
Information Processing Device, Storage Device, and Method of Calculating Evaluation Value of Data Storage Location
Semiconductor Device and Manufacturing Method Thereof
Clock and Data Recovery Device, Memory System, and Data Recovery Method
Semiconductor Device
Defect Inspection Device and Defect Inspection Method
Memory System, Read Method, Program, and Memory Controller
Semiconductor Device
Memory System
Memory Device Managing Data in Accordance with Command and Non-Transitory Computer Readable Recording Medium
Semiconductor Memory Device
Storage and Storage System
Semiconductor Device and Method of Fabricating the Same
Template, Imprint Apparatus, Imprint Method and Imprint Apparatus Management Method
Memory Device
Memory System
Semiconductor Memory Device
Semiconductor Memory Device and Method of Controlling the Same
Semiconductor Storage Device with Volatile and Nonvolatile Memories to Allocate Blocks to a Memory and Release Allocated Blocks
Electronic Apparatus
Multi-Bit Memory System with Adaptive Read Voltage Controller
Magnetoresistive Memory Device with Different Write Pulse Patterns
Magnetic Storage Device with Voltage Generator That Varies Voltages According to Temperature
Information Processing Device, External Storage Device, Host Device, Relay Device, Control Program, and Control Method of Information Processing Device
Semiconductor Memory Device having a Bonded Circuit Chip including a Solid State Drive Controller connected to a Control Circuit
Memory System
Memory Controller, Memory System, and Memory Control Method
Memory System
Memory System with Block Rearrangement to Secure a Free Block Based on Read Valid First and Second Data
Memory System
Dynamic Processing of Storage Command Based on Internal Operations of Storage System
Semiconductor Memory Device
Memory System Performing Read of Nonvolatile Semiconductor Memory Device
Semiconductor Memory Device having an Array Chip Bonded to a Circuit Chip by a Bonding Metal
Method of Controlling Memory Device Including Pluralities of Memory Cells
Memory System Storing Management Information and Method of Controlling Same
On the Fly Raid Parity Calculation
Wafer Conveying Apparatus and Wafer Conveying Method
Semiconductor Memory Device
Memory System
Storage Device and Server Device
Semiconductor Memory Device
Memory System
Memory System and Method for Controlling Nonvolatile Memory
Just a Bunch of Flash (Jbof) Appliance with Physical Access Application Program Interface (Api)
Information Processing Apparatus, Method for Controlling Information Processing Apparatus, Non-Transitory Recording Medium Storing Control Tool, Host Device, Non-Transitory Recording Medium Storing Performance Evaluation Tool, and Performance Evaluation Method For
Randomization of Data Using a Plurality of Types of Pseudorandom Number Generators
Semiconductor Memory Device
Storage System Having a Host Directly Manage Physical Data Locations of Storage Device
Semiconductor Device and Memory System
Memory System in Which Controller Acquires Status of Nonvolatile Memory and Control Method Thereof
Semiconductor Memory Device
Hyper-Converged Flash Array System
Semiconductor Memory Device
Memory System and Method for Controlling Nonvolatile Memory
Electronic Apparatus
Storage Device Having a Serial Communication Port
Memory System with Selective Access to First and Second Memories
Semiconductor Memory System Including a Plurality of Semiconductor Memory Devices
Integrated Circuit Device and Method for Manufacturing Same
Semiconductor Device and Method for Manufacturing Same
Semiconductor Memory Device for Executing a Read Operation at High Speed
Memory System
Memory System Capable of Accessing Memory Cell Arrays in Parallel
Semiconductor Memory Device Applying Different Voltages to Respective Select Gate Lines
Manufacturing Method of Stacked Multilayer Structure
Memory System and Method for Controlling Nonvolatile Memory
Information Processing Apparatus, Information Processing Method, and Computer Program Product
Semiconductor Device for Bonding Conductive Layers Exposed from Surfaces of Respective Interconnection Layers
Memory System and Method for Controlling Nonvolatile Memory
Semiconductor Device Having Stacked Chips
Semiconductor Memory Device
Semiconductor Memory Device and Method for Manufacturing Same
Semiconductor Device and Manufacturing Method Thereof
Semiconductor Memory Device
Freeze Cleaning Apparatus
Semiconductor Storage Device and Memory System
Semiconductor Memory Device Including a Laminated Body with a Plurality of Semiconductor Layers
Memory Device and Manufacturing Methods Thereof
Memory Device
Memory System Having Semiconductor Memory Device That Performs Verify Operations Using Various Verify Voltages
Semiconductor Device Manufacturing Method
Semiconductor Device and Manufacturing Method Thereof
Deterministic Read Disturb Counter-Based Data Checking for Nand Flash
Semiconductor Device
Memory System and Method for Controlling Nonvolatile Memory
Semiconductor Memory Device
Resistance-Change Type Memory Device
Semiconductor Memory Device
Semiconductor Storage Device Including Variable Resistance Elements
Semiconductor Device and Method for Manufacturing Same
Semiconductor Memory Device
Stacked Type Semiconductor Memory Device
Semiconductor Memory Device
Semiconductor Memory Device
Nonvolatile Semiconductor Memory Device
Semiconductor Memory Device
Nonvolatile Memory and Writing Method
Semiconductor Memory
Electronic Apparatus
Semiconductor Storage Device and Memory System
Semiconductor Memory Device and Production Method Thereof
Non-Volatile Semiconductor Storage Device
Nonvolatile Semiconductor Memory Device Including a Memory Cell Array and a Control Circuit Applying a Reading Voltage
Semiconductor Memory Device
Pattern Formation Method, Block Copolymer, and Pattern Formation Material
Semiconductor Memory Device
Related Assignments
(25)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Mar 31, 2015
From: TOSHIBA AMERICA ELECTRONIC COMPONENTS, INC.
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 035301/0469 →
Assignment of Assignor's Interest
Mar 31, 2015
From: OLCAY, SANCAR KUNT; LAI, DISHI
To: TOSHIBA AMERICA ELECTRONIC COMPONENTS, INC.
Reel/Frame 035301/0373 →
Assignment of Assignor's Interest
Sep 4, 2015
From: MATSUI, YUKITERU; KAWASAKI, TAKAHIKO; GAWASE, AKIFUMI; SUZUKI, SHUJI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 036498/0148 →
Assignment of Assignor's Interest
Sep 8, 2015
From: NAKAHARA, KOJI; MATSUO, KAZUHIRO
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 036510/0994 →
Assignment of Assignor's Interest
Mar 14, 2016
From: WU, JIAHONG; MIZUNO, AYAKO; YAMADA, YUJI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 037967/0142 →
Assignment of Assignor's Interest
May 4, 2016
From: TANAKA, SHINGO
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 038457/0717 →
Assignment of Assignor's Interest
May 17, 2016
From: KOJIMA, YOSHIHISA
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 038623/0004 →
Assignment of Assignor's Interest
Aug 4, 2016
From: SHIMURA, YASUHIRO
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 039346/0597 →
Assignment of Assignor's Interest
May 3, 2017
From: MAEDA, TAKEORI; MATSUSHIMA, RYOJI; KAWAGUCHI, MAKOTO; WAKUI, MASAAKI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 042227/0680 →
Assignment of Assignor's Interest
May 15, 2017
From: MURAYAMA, AKIYUKI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 042375/0560 →
Assignment of Assignor's Interest
Jun 28, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043027/0072 →
Assignment of Assignor's Interest
Jun 29, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043052/0218 →
Assignment of Assignor's Interest
Jul 5, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043088/0620 →
Assignment of Assignor's Interest
Jul 14, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043194/0647 →
Assignment of Assignor's Interest
Jul 14, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043194/0563 →
Assignment of Assignor's Interest
Jul 27, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043355/0058 →
Assignment of Assignor's Interest
Aug 1, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043397/0380 →
Assignment of Assignor's Interest
Aug 1, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043156/0983 →
Assignment of Assignor's Interest
Aug 14, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043541/0381 →
Assignment of Assignor's Interest
Aug 24, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043709/0035 →
Corrective Assignment to Correct the Assignee Postal Code Previously Recorded on Reel 043027 Frame 0072. Assignor(S) Hereby Confirms the Assignment.
Sep 1, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043747/0273 →
Assignment of Assignor's Interest
Apr 25, 2018
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 045629/0403 →
Assignment of Assignor's Interest
Feb 5, 2020
From: HASHIMOTO, DAISUKE
To: TOSHIBA AMERICA ELECTRONIC COMPONENTS, INC.
Reel/Frame 051724/0299 →
Assignment of Assignor's Interest
Feb 7, 2020
From: TOSHIBA AMERICA ELECTRONIC COMPONENTS, INC.
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 051756/0160 →
Assignment of Assignor's Interest
Apr 21, 2020
From: ASANO, SHIGEHIRO; UEKI, KATSUHIKO; HAYASHIDA, MARK
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 052455/0042 →