Memory system having semiconductor memory device that performs verify operations using various verify voltages
View Patent ↗A memory system includes a semiconductor memory device having memory cells arranged in rows and columns, and a controller configured to issue a write command with or without a partial page program command to the semiconductor memory device. The semiconductor memory device, in response to the write command issued without the partial page command, executes a first program operation on a page of memory cells and then a first verify operation on the memory cells of the page using a first verify voltage for all of the memory cells of the page, and in response to the write command issued with the partial page command, executes a second program operation on a subset of the memory cells of the page and then a second verify operation on the memory cells of the subset using one of several different second verify voltages corresponding to the subset.
1. A semiconductor memory device comprising:
a semiconductor memory array including a plurality of memory cells and a word line, the plurality of memory cells including a page of memory cells, the plurality of memory cells comprising first, second, third, and fourth memory cells, the word line being electrically connected to gates of the first, second, third, and fourth memory cells; and
a control unit configured to:
execute, in response to a first write command, a first program operation on the page of memory cells and a first verify operation on the memory cells of the page using a first verify voltage, and
execute, in response to a second write command, a second program operation on a first subset of the memory cells of the page, the first subset of the memory cells including the first and second memory cells, and a second verify operation on the first subset of the memory cells using a second verify voltage when the second write command corresponds to the first subset of the memory cells, and execute the second program operation on a second subset of the memory cells of the page, the second subset of the memory cells including the third and fourth memory cells, and a third verify operation on the second subset of the memory cells using a third verify voltage when the second write command corresponds to the second subset of the memory cells.
2. The semiconductor memory device according to claim 1 , wherein the third verify voltage is different from the second verify voltage.
3. The semiconductor memory device according to claim 2 , wherein after the second program operation on the first subset of the memory cells has been performed and the memory cells of the first subset has passed verification, the second program operation on the second subset of the memory cells is executed.
4. The semiconductor memory device according to claim 3 , wherein the third verify voltage is greater than the second verify voltage.
5. The semiconductor memory device according to claim 3 , wherein
the control unit is configured to execute the second program operation on the first subset of the memory cells by applying a program voltage of an increased level to the word line in multiple loops,
the control unit is configured to execute the second program operation on the second subset of the memory cells by applying a program voltage of an increased level to the word line in multiple loops, and
an amount of increase in the program voltage for each subsequent loop when the second program operation is performed on the memory cells of the first subset is more than an amount of increase in the program voltage for each subsequent loop when the second program operation is performed on the memory cells of the second subset.
6. The semiconductor memory device according to claim 5 , wherein an increased level in the program voltage for each subsequent loop when the second program operation is performed on the memory cells of the first subset is less than an increased level in the program voltage for each subsequent loop when the second program operation is performed on the memory cells of the second subset.
7. The semiconductor memory device according to claim 3 , wherein the control unit is configured to execute, in response to the issued second write command, a pre-verify operation on the memory cells in the first subset using the second verify voltage.
8. The semiconductor memory device according to claim 7 , wherein during the pre-verify operation, a first read voltage is applied to the word line followed by a second read voltage that is greater than the first read voltage.
9. The semiconductor memory device according to claim 1 , wherein
the first memory cell is adjacent to the second memory cell,
the third memory cell is adjacent to the fourth memory cell, and
the first memory cell is not adjacent to the third memory cell and the fourth memory cell.
10. The semiconductor memory device according to claim 1 , wherein
the first memory cell is corresponding to a first column,
the second memory cell is corresponding to a second column,
the third memory cell is corresponding to a third column,
the fourth memory cell is corresponding to a fourth column,
the first and second columns have address numbers that are contiguous, and
the third and fourth columns have address numbers that are contiguous and do not overlap with address numbers of the first and second columns.
11. The semiconductor memory device according to claim 10 , wherein
the second write command corresponding to the first subset of the memory cells specifies the address numbers of the memory cells in the first subset, and
the second write command corresponding to the second subset of the memory cells specifies the address numbers of the memory cells in the second subset.
12. The semiconductor memory device according to claim 1 , wherein the first write command or the second write command is sent from a controller controlling the semiconductor memory.
13. The semiconductor memory device according to claim 12 , wherein the control unit is configured to read data from the page of the memory cells in response to a read command from the controller.
14. A method of controlling a semiconductor memory device that includes a plurality of memory cells and a word line, the plurality of memory cells including a page of memory cells, the plurality of memory cells comprising first, second, third, and fourth memory cells, the word line being electrically connected to gates of the first, second, third, and fourth memory cells, the method comprising:
receiving a first write command or a second write command;
in response to the received first write command, executing a first program operation on the page of memory cells and a first verify operation on the memory cells of the page using a first verify voltage; and
in response to the received second write command, executing a pre-verify operation on a first subset of the memory cells using a second verify voltage, the first subset of the memory cells including the first and second memory cells, a second program operation on the first subset of the memory cells of the page, and a second verify operation on the first subset of the memory cells using the second verify voltage when the received second write command corresponds to the first subset of the memory cells, and executing a pre-verify operation on a second subset of the memory cells using a third verify voltage, the second subset of the memory cells including the third and fourth memory cells, the second program operation on a second subset of the memory cells of the page, and a third verify operation on the second subset of the memory cells using the third verify voltage when the received second write command corresponds to the second subset of the memory cells.
15. The method according to claim 14 , wherein the first write command or the second write command is sent from a controller.
16. The method according to claim 14 , wherein the third verify voltage is different from the second verify voltage.
17. The method according to claim 16 , wherein after the second program operation on the first subset of the memory cells has been performed and the memory cells of the first subset has passed verification, the second program operation on the second subset of the memory cells is executed.
18. The method according to claim 17 , wherein the third verify voltage is greater than the second verify voltage.
19. The method according to claim 17 , wherein
the executing the second program operation on the first subset of the memory cells includes applying a program voltage of an increased level to the word line in multiple loops,
the executing the second program operation on the second subset of the memory cells includes applying a program voltage of an increased level to the word line in multiple loops, and
an amount of increase in the program voltage for each subsequent loop when the second program operation is performed on the memory cells of the first subset is more than an amount of increase in the program voltage for each subsequent loop when the second program operation is performed on the memory cells of the second subset.
20. The method according to claim 19 , wherein an increased level in the program voltage for each subsequent loop when the second program operation is performed on the memory cells of the first subset is less than an increased level in the program voltage for each subsequent loop when the second program operation is performed on the memory cells of the second subset.