IP Library Granted Patent US 10,297,321
Granted Patent B2
US 10,297,321 · App. 16/032,567 · Granted May 21, 2019

Memory cell structure

Inventors: Kohji Hosokawa (Kawasaki, JP); Masatoshi Ishii (Kawasaki, JP); Takeo Yasuda (Kawasaki, JP)
Assignee: International Business Machines Corporation
G11C13/0069G06N3/063G11C7/1006G11C11/4096G11C11/54G11C13/004G11C2213/77
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Quick Facts
Patent No.
US 10,297,321
App. No.
16/032,567
Granted
May 21, 2019
Kind
B2
Abstract

A memory cell structure includes a plurality of write lines arranged for writing a synapse state to a synapse memory cell including a plurality of cell components each including at least one unit cell, each of the plurality of write lines being used for writing the synapse state by writing a first set of states to a corresponding cell component of the plurality of cell components by writing one of a second set of states to each unit cell included in the corresponding cell component, the first and second sets each having a predetermined number of states, and the first set depending on the second set, and a read line arranged for reading the synapse state from the synapse memory cell.

Claims (42)

1. A memory cell structure comprising:

a plurality of write lines configured to write a synapse state to a synapse memory cell including a plurality of cell components each including at least one unit cell, each of the plurality of write lines being configured to write the synapse state by writing a first set of states to a corresponding cell component of the plurality of cell components by writing a second set of states to each unit cell included in the corresponding cell component, the first and second sets each having a predetermined number of states, and the first set being dependent on the second set; and

a read line configured to read the synapse state from the synapse memory cell.

2. The memory cell structure of claim 1 , wherein each unit cell is a resistance and the first and second sets of states include states regarding conductance of the resistance.

3. The memory cell structure of claim 1 , wherein each unit cell is a capacitor and the first and second sets of states include states regarding capacitance of the capacitor.

4. The memory cell structure of claim 1 , wherein the predetermined number of states is two.

5. The memory cell structure of claim 4 , wherein:

an i-th cell component of the plurality of cell components includes 2 i-1 unit cells, where i is a natural number; and

each of the states in the first set is 2 i-1 times of a corresponding one of the states in the second set.

6. The memory cell structure of claim 1 , wherein the predetermined number of states is three.

7. The memory cell structure of claim 6 , wherein:

an i-th cell component of the plurality of cell components includes 3 i-1 unit cells, where i is a natural number; and

each of the states in the first set is 3 i-1 times of a corresponding one of the states in the second set.

8. The memory cell structure of claim 1 , wherein the read line is configured to read the synapse state from the synapse memory cell by reading the first set of states from the plurality of cell components simultaneously.

9. A memory cell system comprising:

a plurality of write drivers configured to write a synapse state to the synapse memory cell including a plurality of cell components each including at least one unit cell, each of the plurality of write drivers being configured to write the synapse state by writing a first set of states to a corresponding cell component of the plurality of cell components by writing a second set of states to each unit cell included in the corresponding cell component, the first and second sets each having a predetermined number of states, and the first set being dependent on the second set; and

a read driver configured to read the synapse state from the synapse memory cell.

10. The memory cell system of claim 9 , wherein each unit cell is a resistance and the first and second sets of states include states regarding conductance of the resistance.

11. The memory cell system of claim 9 , wherein each unit cell is a capacitor and the first and second sets of states include states regarding capacitance of the capacitor.

12. The memory cell system of claim 9 , wherein:

a predetermined number of the predetermined number of states is two;

i-th cell component of the plurality of cell components includes 2 i-1 unit cells, where i is a natural number; and

each of the predetermined number of states in the first set is 2 i-1 times of a corresponding one of the predetermined number of states in the second set.

13. The memory cell system of claim 9 , wherein:

a predetermined number of the predetermined number of states is three;

i-th cell component of the plurality of cell components includes 3 i-1 unit cells, where i is a natural number; and

each of the predetermined number of states in the first set is 3 i-1 times of a corresponding one of the predetermined number of states in the second set.

14. The memory cell system of claim 9 , wherein the read driver is configured to read the synapse state from the synapse memory cell by reading the first set of states from the plurality of cell components simultaneously.

15. A method for fabricating a memory cell structure, the method comprising:

arranging a plurality of write lines configured to write a synapse state to a synapse memory cell including a plurality of cell components each including at least one unit cell, each of the plurality of write lines being configured to write the synapse state by writing a first set of states to a corresponding cell component of the plurality of cell components by writing a second set of states to each unit cell included in the corresponding cell component, and the first set being dependent on the second set; and

arranging a read line configured to read the synapse state from the synapse memory cell.

16. The method of claim 15 , wherein each unit cell is a resistance and the first and second sets of states include states regarding conductance of the resistance.

17. The method of claim 15 , wherein each unit cell is a capacitor and the first and second sets of states include states regarding capacitance of the capacitor.

18. The method of claim 15 , wherein:

the predetermined number of states is two,

an i-th cell component of the plurality of cell components includes 2 i-1 unit cells, where i is a natural number; and

each of the states in the first set is 2 i-1 times of a corresponding one of the states in the second set.

19. The method of claim 15 , wherein:

the predetermined number of states is three;

an i-th cell component of the plurality of cell components includes 3 i-1 cells, where i is a natural number; and

each of the states in the first set is 3 i-1 times of a corresponding one of the states in the second set.

20. The method of claim 15 , wherein the read line is configured to read the synapse state from the synapse memory cell by reading the first set of states from the plurality of cell components simultaneously.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 21, 2020
From: INTERNATIONAL BUSINESS MACHINES CORPORATION
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 054126/0693 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 11, 2018
From: HOSOKAWA, KOHJI; ISHII, MASATOSHI; YASUDA, TAKEO
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 046320/0817 →
Continuity (2)
Continuation 15346841 · Nov 9, 2016
Related Publication 20180322920A1 · Nov 8, 2018