IP Library Granted Patent US 10,309,829
Granted Patent B2
US 10,309,829 · App. 16/035,061 · Granted Jun 4, 2019

Micromirror spectrophotometer assembly

Inventors: Jerome J. Workman, Jr. (Marlborough, MA); John Coates (Newtown, CT); David Naranjo (Dracut, MA)
Assignee: PROCESS SENSORS CORPORATION
G01J3/021G01J3/0202G01J3/0229G01J3/0262G01J3/0291G01J3/0297G01J3/18G01J3/28G01J2003/2866
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Quick Facts
Patent No.
US 10,309,829
App. No.
16/035,061
Granted
Jun 4, 2019
Kind
B2
Abstract

Aspects of a micromirror spectrophotometer assembly are described. In one example case, an instrument includes a diffraction grating to disperse broadband light over a range of wavelengths, a detector, a digital micromirror device (DMD) configured to scan through and reflect at least a portion of the range of wavelengths toward the detector, and a base platform having a number of integrally formed assembly mounts. The assembly mounts are formed to align and secure the diffraction grating, the detector, the DMD, and other optical components of the instrument in a predetermined arrangement. The instrument can also include a reference paddle having a reference material for calibration of the instrument, and a rotatable sample tray to rotate a sample placed on the sample tray for measurement.

Claims (52)

1. A platform for an instrument, comprising:

a plurality of assembly mounts integrally formed as a base platform to align and secure a diffraction grating, a detector, a digital micromirror device (DMD), and at least one optical component in a predetermined arrangement, wherein:

the plurality of assembly mounts comprise a plurality of integral seats to align and secure the at least one optical component in a predetermined arrangement relative to the diffraction grating, the detector, and the DMD.

2. The platform of claim 1 , wherein the plurality of assembly mounts comprise:

a first integral seat formed for a first optical component of a focusing optics assembly; and

a second integral seat for a second optical component of the focusing optics assembly, the first integral seat and the second integral seat being separated by a predetermined spacing along an optical pathway that extends along the at least one of the plurality of assembly mounts.

3. The platform of claim 1 , wherein:

a first of the plurality of assembly mounts is aligned along a first optical pathway in the instrument;

a second of the plurality of assembly mounts is aligned along a second optical pathway parallel to the first optical pathway in the instrument; and

a third of the plurality of assembly mounts is aligned along a third optical pathway at an angle with respect to at least one of the first optical pathway and the second optical pathway.

4. The platform of claim 3 , wherein:

the at least one optical component comprises a plurality of optical components;

the plurality of optical components are aligned and secured in the first, second, and third of the plurality of assembly mounts; and

an assembly mount cover is secured over the first, second, and third of the plurality of assembly mounts.

5. The platform of claim 1 , wherein at least one of the plurality of assembly mounts is aligned at one end of an optical pathway to secure a light source and an entrance optics assembly.

6. The platform of claim 1 , wherein at least one of the plurality of assembly mounts is positioned to secure a diffraction grating at an intersection of first and second optical pathways.

7. The platform of claim 1 , wherein at least one of the plurality of assembly mounts includes a number of baffles integral to the base platform.

8. The platform of claim 1 , wherein the base platform is continuously formed from a single material using an additive manufacturing process.

9. An instrument, comprising:

a diffraction grating to disperse broadband light over a range of wavelengths;

a detector;

a digital micromirror device (DMD) configured to scan through and reflect at least a portion of the range of wavelengths toward the detector;

a base platform to align and secure the diffraction grating, the detector, the digital micromirror device (DMD), and at least one optical component in a predetermined arrangement; and

a reference paddle, wherein:

the reference paddle includes a reference material for calibration of the instrument; and

a motor is configured to rotate the reference paddle to cover a sample window of the instrument for calibration of the instrument.

10. The instrument of claim 9 , further comprising:

a sample motor comprising a shaft that extends through a sample platform of the instrument; and

a sample tray mechanically coupled to the shaft of the sample motor, wherein the sample motor is configured to rotate a sample placed on the sample tray for measurement.

11. The instrument of claim 9 , wherein:

the base platform comprises a plurality of assembly mounts to align and secure the diffraction grating, the detector, the DMD, and the at least one optical component in the predetermined arrangement; and

the plurality of assembly mounts comprise a plurality of integral seats to align and secure the at least one optical component in a predetermined arrangement relative to the diffraction grating, the detector, and the DMD.

12. The instrument of claim 11 , wherein at least one of the plurality of assembly mounts comprises:

a first integral seat formed for a first optical component of a focusing optics assembly; and

a second integral seat for a second optical component of the focusing optics assembly, the first integral seat and the second integral seat being separated by a predetermined spacing along an optical pathway in the instrument.

13. The instrument of claim 11 , wherein:

a first of the plurality of assembly mounts is aligned along a first optical pathway in the instrument;

a second of the plurality of assembly mounts is aligned along a second optical pathway parallel to the first optical pathway in the instrument; and

a third of the plurality of assembly mounts is aligned along a third optical pathway at an angle with respect to at least one of the first optical pathway and the second optical pathway.

14. The instrument of claim 11 , wherein at least one of the plurality of assembly mounts is aligned at one end of an optical pathway to secure a light source and an entrance optics assembly.

15. A platform for an instrument, comprising:

a plurality of assembly mounts integrally formed as a base platform to align and secure a diffraction grating, a detector, a digital micromirror device (DMD), and at least one optical component in a predetermined arrangement, wherein the plurality of assembly mounts comprise:

a first integral seat formed for a first optical component of a focusing optics assembly; and

a second integral seat for a second optical component of the focusing optics assembly, the first integral seat and the second integral seat being separated by a predetermined spacing along an optical pathway.

16. The platform of claim 15 , wherein:

a first of the plurality of assembly mounts is aligned along a first optical pathway in the instrument;

a second of the plurality of assembly mounts is aligned along a second optical pathway parallel to the first optical pathway in the instrument; and

a third of the plurality of assembly mounts is aligned along a third optical pathway at an angle with respect to at least one of the first optical pathway and the second optical pathway.

17. The platform of claim 15 , wherein at least one of the plurality of assembly mounts is aligned at one end of an optical pathway to secure a light source and an entrance optics assembly.

18. The platform of claim 15 , wherein at least one of the plurality of assembly mounts is positioned to secure a diffraction grating.

19. The platform of claim 15 , wherein at least one of the plurality of assembly mounts includes a number of baffles integral to the base platform.

20. The platform of claim 15 , wherein the base platform is continuously formed from a single material using an additive manufacturing process.

Assignments (7)
PATENT SECURITY AGREEMENT Recorded Feb 13, 2026
From: KPM ANALYTICS NORTH AMERICA CORPORATION
To: CCP AGENCY, LLC, AS ADMINISTRATIVE AGENT
Reel/Frame 074852/0543 →
RELEASE OF SECURITY INTEREST RECORDED AT REEL/FRAME 047989/0327 Recorded Jul 7, 2021
From: CRYSTAL FINANCIAL LLC
To: KPM ANALYTICS NORTH AMERICA CORPORATION (FORMERLY KNOWN AS PROCESS SENSORS CORPORATION)
Reel/Frame 057106/0699 →
SECURITY INTEREST Recorded Jul 2, 2021
From: KPM ANALYTICS NORTH AMERICA CORPORATION (FORMERLY KNOWN AS PROCESS SENSORS CORPORATION)
To: SOUND POINT AGENCY LLC
Reel/Frame 056741/0373 →
CHANGE OF NAME Recorded Jan 22, 2019
From: PROCESS SENSORS CORPORATION
To: KPM ANALYTICS NORTH AMERICA CORPORATION
Reel/Frame 049514/0312 →
MERGER AND CHANGE OF NAME Recorded Jan 22, 2019
From: WESTCO SCIENTIFIC INSTRUMENTS, INC.; PROCESS SENSORS CORPORATION
To: PROCESS SENSORS CORPORATION
Reel/Frame 048093/0794 →
PATENT SECURITY AGREEMENT Recorded Dec 28, 2018
From: KPM ANALYTICS NORTH AMERICA CORPORATION (FORMERLY KNOWN AS PROCESS SENSORS CORPORATION)
To: CRYSTAL FINANCIAL LLC, AS AGENT
Reel/Frame 047989/0327 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 7, 2018
From: WORKMAN, JEROME J., JR.; COATES, JOHN; NARANJO, DAVID
To: WESTCO SCIENTIFIC INSTRUMENTS, INC.
Reel/Frame 047433/0021 →
Continuity (2)
Continuation 15610998 · Jun 1, 2017
Related Publication 20180348052A1 · Dec 6, 2018