IP Library › Granted Patent US 11,372,136
Granted Patent B2
US 11,372,136 · App. 16/038,824 · Granted Jun 28, 2022

Method for producing thin film, thin film forming material, optical thin film, and optical member

Inventors: Gentaro Tanaka (Tokushima, JP); Hirofumi Tanaka (Tokushima, JP)
Assignee: NICHIA CORPORATION
G02B1/11C01B33/113C03C17/007C03C17/245C03C17/3417C23C14/08C23C14/243C23C14/5873G02B1/113C03C2217/23C03C2217/475C03C2218/113C03C2218/154C03C2218/33G02B2207/109
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Quick Facts
Patent No.
US 11,372,136
App. No.
16/038,824
Granted
Jun 28, 2022
Kind
B2
Abstract

Disclosed are a method for producing an optical thin film having a low refractive index, a thin film forming material, an optical thin film, and an optical member. The method for producing an optical thin film includes forming a vapor deposition film by depositing a thin film forming material on an object in a non-oxidizing atmosphere by a physical vapor deposition method; and bringing the vapor deposition film into contact with a first acidic solution comprising an acidic substance in a range of pH 2.5 or more and pH 3.5 or less to obtain a first thin film having voids, wherein the thin film forming material is a mixture comprising indium oxide and silicon oxide, in which the indium oxide is in a range of 0.230 mol or more and 0.270 mol or less with respect to 1 mol of the silicon oxide.

Claims (13)

1. A method for producing an optical thin film, comprising:

forming a vapor deposition film by depositing a thin film forming material on an object in a non-oxidizing atmosphere by a physical vapor deposition, wherein the thin film forming material is a mixture consisting of an indium oxide and a silicon oxide, in which the indium oxide is contained in a range of 0.230 mol or more and 0.270 mol or less relative to 1 mol of the silicon oxide; and

bringing the vapor deposition film into contact with a first acidic solution comprising an acidic substance in a range of pH 2.5 or more and pH 3.5 or less to elute the indium oxide (I) (In 2 O) and/or indium (In) to obtain a first thin film having voids so that a refractive index of the first thin film is 1.300 or less,

wherein the first thin film having voids has a framework composed of silicon dioxide, and

wherein the framework composed of the silicon dioxide is serially formed from the object to a surface of the first thin film.

2. The method for producing the optical thin film according to claim 1 , wherein the silicon oxide in the thin film forming material comprises a silicon monoxide as a major component.

3. The method for producing the optical thin film according to claim 1 , wherein a voidage in the first thin film is in a range of 30% or more and 90% or less.

4. The method for producing the optical thin film according to claim 1 , wherein the vapor deposition film is brought into contact with the first acidic solution at room temperature.

5. The method for producing the optical thin film according to claim 1 , further comprising:

coating a surface of the first thin film with a silica-coat forming material to obtain a coated thin film; and

heat-treating the coated thin film to obtain a second thin film.

6. The method for producing the optical thin film according to claim 5 , wherein the silica-coat forming material comprises a silicon alkoxide.

7. The method for producing the optical thin film according to claim 5 , wherein coating the surface of the first thin film with a silica-coat forming material comprises adding a second acidic solution to the silica-coat forming material, wherein a pH value of the second acidic solution is in a range of pH 0.8 or more and pH 1.8 or less.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 18, 2018
From: TANAKA, GENTARO; TANAKA, HIROFUMI
To: NICHIA CORPORATION
Reel/Frame 046387/0042 →
Priority Claims (1)
JP JP2017-140214 · Jul 19, 2017 · national
Continuity (1)
Related Publication 20190025466A1 · Jan 24, 2019