Apparatus and methods for optical emission detection

1. An apparatus for optical emission detection, the apparatus comprising:

a block comprising scintillation crystals, wherein:

the block comprises a first end and a second end parallel to the first end;

the block comprises a plurality of sides extending between the first end and the second end; and

the first end of the block comprises a first corner, a second corner, a third corner, and a fourth corner;

reflective film coupled to the plurality of sides of the block and to the first end of the block;

a first light sensor coupled to the block proximal to the first corner;

a second light sensor coupled to the block proximal to the second corner;

a third light sensor coupled to the block proximal to the third corner; and

a fourth light sensor coupled to the block proximal to the fourth corner, wherein the reflective film coupled to the first end of the block comprises a first opening proximal to the first corner, a second opening proximal to the second corner, a third opening proximal to the third corner, and a fourth opening proximal to the fourth corner.

2. The apparatus of claim 1 wherein the block further comprises reflective film disposed between scintillation crystals.

3. The apparatus of claim 2 wherein the reflective film disposed between the scintillation crystals extends from the second end of the block toward the first end of the block.

4. The apparatus of claim 2 wherein the reflective film disposed between the scintillation crystals comprises a plurality of sections with different lengths.

5. The apparatus of claim 2 wherein the first, second, third, and fourth sensors are configured:

to detect light reflected by the reflective film coupled to the plurality of sides of the block and to the first end of the block; and

to detect light reflected by the reflecting disposed between scintillation crystals.

6. The apparatus of claim 1 wherein the reflective film coupled to the plurality of sides of the block substantially covers the plurality of sides of the block.

7. The apparatus of claim 1 wherein the first sensor is coupled to the block at the first opening, the second sensor is coupled to the block at the second opening, the third sensor is coupled to the block at the third opening and the fourth sensor is coupled to the block at the fourth opening.

8. The apparatus of claim 1 wherein the scintillation crystals have a surface finish of approximately 4-20 micron R a .

9. The apparatus of claim 1 wherein:

the first end of the block comprises a surface area; and

the first, second, third, and fourth sensors cover less than twenty percent of the surface area of the first end.

10. The apparatus of claim 9 wherein the first, second, third, and fourth sensors cover less than ten percent of the surface area of the first end.

11. The apparatus of claim 1 wherein:

the second end of the block comprises a fifth corner, a sixth corner, a seventh corner, and an eighth corner; and

the apparatus further comprises a fifth light sensor coupled to the block proximal to the fifth corner, a sixth light sensor coupled to the block proximal to the sixth corner, seventh light sensor coupled to the block proximal to the seventh corner, and an eighth light sensor coupled to the block proximal to the eighth corner.

12. The apparatus of claim 11 wherein:

the block further comprises reflective film disposed between scintillation crystals; and

the reflective film disposed between the scintillation crystals does not extend to the first or second end of the block.

13. The apparatus of claim 12 wherein the reflective film disposed between the scintillation crystals comprises a plurality of sections with different lengths.

14. The apparatus of claim 12 wherein the reflective film disposed between the scintillation crystals comprises a plurality of sections with equal lengths.

15. The apparatus of claim 11 wherein the reflective film coupled to the plurality of sides of the block substantially covers the plurality of sides of the block.

16. The apparatus of claim 1 wherein the first, second, third and fourth sensors are silicon photomultipliers.

17. The apparatus of claim 1 wherein the apparatus is a component in a positron emission tomography detector.

18. A method of detecting a location of a scintillating crystal in a block of scintillation crystals comprising a first end and a second end, the method comprising:

receiving light in the second end of the block of scintillation crystals;

reflecting the light on reflective film disposed between a plurality of scintillation crystals in the block;

reflecting the light on reflective film coupled to a plurality of sides and the first end of the block; and

detecting the light by one of a plurality of sensors coupled to the first end of the block, wherein each of the plurality of sensors is coupled proximal to a corner of the first end of the block, and wherein the reflective film coupled to the first end of the block comprises a first opening proximal to a first corner, a second opening proximal to a second corner, a third opening proximal to a third corner, and a fourth opening proximal to a fourth corner.

19. The method of claim 18 wherein the reflective film disposed between the plurality of scintillation crystals extends from the second end of the block toward the first end of the block.

20. The method of claim 19 wherein the reflective film disposed between the plurality of scintillation crystals comprises a plurality of sections with different lengths.

21. The method of claim 19 wherein the reflective film disposed between the plurality of scintillation crystals comprises a plurality of sections with equal lengths.

22. The method of claim 18 wherein the reflective film coupled to the plurality of sides of the block substantially covers the plurality of sides of the block.

23. The method of claim 18 wherein a first sensor is coupled to the block at the first opening, a second sensor is coupled to the block at the second opening, a third sensor is coupled to the block at the third opening and a fourth sensor is coupled to the block at the fourth opening.

24. The method of claim 18 wherein the scintillation crystals have a surface finish of approximately 4-20 micron R a .

25. The method of claim 18 wherein each of the scintillation crystals comprise a plurality of segments coupled together.

26. The method of claim 18 wherein:

the first end of the block comprises a surface area; and

the plurality of sensors cover less than twenty percent of the surface area of the first end.

27. The method of claim 18 wherein the plurality of sensors cover less than ten percent of the surface area of the first end.

28. An apparatus for optical emission detection, the apparatus comprising:

a block comprising scintillation crystals, wherein:

the block comprises a first end and a second end parallel to the first end;

the block comprises a plurality of sides extending between the first end and the second end; and

the first end of the block comprises a first corner, a second corner, a third corner, and a fourth corner;

reflective film coupled to the plurality of sides of the block and to the first end of the block;

a first light sensor coupled to the block proximal to the first corner;

a second light sensor coupled to the block proximal to the second corner;

a third light sensor coupled to the block proximal to the third corner; and

a fourth light sensor coupled to the block proximal to the fourth corner, wherein the first sensor is coupled to the block at the first opening, the second sensor is coupled to the block at the second opening, the third sensor is coupled to the block at the third opening and the fourth sensor is coupled to the block at the fourth opening.