Phosphor
Provided is a new phosphor which can be excited by visible light in a wide band to emit a broad fluorescence spectrum, and also to emit near-infrared light with high intensity. Proposed is a phosphor, which is an oxide comprising Ca, Cu, and Si, wherein the containing molar ratios of the elements are 0.15≤Ca/Si<0.25 and 0.13≤Cu/Si<0.25.
1. A phosphor, which is an oxide comprising Ca, Cu, and Si, wherein containing molar ratios of the elements are 0.15≤Ca/Si<0.25 and 0.13≤Cu/Si<0.25 and the ratio of Ca/Si is larger than the ratio of Cu/Si,
wherein the oxide has a crystal phase composed of CaCuSi 4 O 10 and comprising a planar four-coordination structure in which four O 2− ions are bonded around a Cu 2+ ion as a main crystal phase and a further crystal phase composed of SiO 2 , and
wherein an amount of the main crystal phase present in the oxide is greater than an amount of any other crystal phase present in the oxide.
2. The phosphor according to claim 1 , which is excited by visible light in a range of at least 450 to 750 nm, and emits near-infrared light in a range of at least 800 to 1,200 nm.
3. The phosphor according to claim 1 , wherein a rare earth element is not contained.
4. The phosphor according to claim 1 , wherein in an X-ray diffraction (XRD) pattern obtained by powder XRD measurement using CuKα rays, a ratio (A/B) of a diffraction intensity A of he a maximum peak appearing at a diffraction angle 2θ=23 to 24° with respect to a diffraction intensity B of a maximum peak appearing at a diffraction angle 2θ=26 to 27° is 1.70 or more.
5. The phosphor according to claim 1 , wherein in an X-ray diffraction (XRD) pattern obtained by powder XRD measurement using CuKα rays, a ratio (A/C) of a diffraction intensity A of a maximum peak appearing at a diffraction angle 2θ=23 to 24° with respect to a diffraction intensity C of a maximum peak appearing at a diffraction angle 2θ=27 to 27.5° is 3.50 or more.
6. The phosphor according to claim 1 , wherein in an X-ray diffraction (XRD) pattern obtained by powder XRD measurement using CuKα rays, a ratio (A/D) of a diffraction intensity A of a maximum peak appearing at a diffraction angle 2θ=23 to 24° with respect to a diffraction intensity D of a maximum peak appearing at a diffraction angle 2θ=27.5 to 28.5° is 9.00 or more.
7. The phosphor according to claim 1 , wherein in an X-ray diffraction (XRD) pattern obtained by powder XRD measurement using CuKα rays, a ratio (A/E) of a diffraction intensity A of a maximum peak appearing at a diffraction angle 2θ=23 to 24° with respect to a diffraction intensity E of a maximum peak appearing at a diffraction angle 2θ=39.5 to 40.0° is 5.00 or more.
8. A phosphor, which is an oxide having a crystal phase composed of CaCuSi 4 O 10 as a main crystal phase, wherein an amount of the main crystal phase present in the oxide is greater than an amount of any other crystal phase present in the oxide and in an X-ray diffraction (XRD) pattern obtained by powder XRD measurement using CuKα rays, a ratio (A/B) of a diffraction intensity A of a maximum peak appearing at a diffraction angle 2θ=23 to 24° with respect to a diffraction intensity B of a maximum peak appearing at a diffraction angle 2 θ=26 to 27° is 1.70 or more.
9. A phosphor, which is an oxide having a crystal phase composed of CaCuSi 4 O 10 as a main crystal phase, wherein an amount of the main crystal phase present in the oxide is greater than an amount of any other crystal phase present in the oxide and in an X-ray diffraction (XRD) pattern obtained by powder XRD measurement using CuKα rays, a ratio (A/C) of a diffraction intensity A of a maximum peak appearing at a diffraction angle 2θ=23 to 24° with respect to a diffraction intensity C of a maximum peak appearing at a diffraction angle 2θ=27 to 27.5° is 3.50 or more.
10. A phosphor, which is an oxide having a crystal phase composed of CaCuSi 4 O 10 as a main crystal phase, wherein an amount of the main crystal phase present in the oxide is greater than an amount of any other crystal phase present in the oxide and in an X-ray diffraction (XRD) pattern obtained by powder XRD measurement using CuKα rays, a ratio (A/D) of a diffraction intensity A of a maximum peak appearing at a diffraction angle 2θ=23 to 24° with respect to a diffraction intensity D of a maximum peak appearing at a diffraction angle 2θ=27.5 to 28.5° is 9.00 or more.
11. A phosphor, which is an oxide having a crystal phase composed of CaCuSi 4 O 10 as a main crystal phase, wherein an amount of the main crystal phase present in the oxide is greater than an amount of any other crystal phase present in the oxide and in an X-ray diffraction (XRD) pattern obtained by powder XRD measurement using CuKα rays, a ratio (A/E) of a diffraction intensity A of a maximum peak appearing at a diffraction angle 2θ=23 to 24° with respect to a diffraction intensity E of a maximum peak appearing at a diffraction angle 2θ=39.5 to 40.0° is 5.00 or more.
12. A near-infrared luminescent device, comprising the phosphor according to claim 1 .
13. A unit comprising the near-infrared luminescent device according to claim 12 .
14. A fluorescent paint comprising the phosphor according to claim 1 .
15. A phosphor printed product using the fluorescent paint according to claim 14 .