IP Library Granted Patent US 10,763,816
Granted Patent B2
US 10,763,816 · App. 16/087,749 · Granted Sep 1, 2020

Piezoelectric layer and piezoelectric device comprising the piezoelectric layer

Inventors: Takahiko Yanagitani (Tokyo, JP); Masashi Suzuki (Tokyo, JP)
Assignee: Avago Technologies International Sales PTE. Limited
H03H9/02015C01B21/072C23C14/0617C23C14/34H01L41/187H01L41/316H03H9/02031H03H9/02543H03H9/13H03H9/145H03H9/175H03H9/176H03H9/25H03H9/562H03H9/566H03H9/64C01P2002/54C01P2002/77C01P2006/40
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Quick Facts
Patent No.
US 10,763,816
App. No.
16/087,749
Granted
Sep 1, 2020
Kind
B2
Abstract

A piezoelectric material is described. The piezoelectric material comprises aluminum nitride (AlN) doped with ytterbium (Yb), an atomic percentage of Yb in the AlN being greater than or equal to approximately 10.0% and less than or equal to approximately 27.0%. Piezoelectric layers comprising the piezoelectric material may be used in bulk acoustic wave (BAW) acoustic resonators, and surface acoustic wave (SAW) acoustic resonators. The BAW acoustic resonators and SAW acoustic resonators can be used in a variety of applications.

Claims (27)

1. A piezoelectric layer comprising:

aluminum nitride (AlN) doped with ytterbium (Yb), an atomic percentage of Yb in the AlN being greater than or equal to approximately 10.0% and less than or equal to approximately 27.0%.

2. The piezoelectric layer according to claim 1 , wherein the piezoelectric layer has an upper surface in a first plane, and a lower surface in a second plane opposing the upper surface, the first plane being parallel to the second plane, and the piezoelectric layer comprises a polarization axis (c-axis) oriented orthogonally to the first and second planes.

3. The piezoelectric layer according to claim 1 , wherein the piezoelectric layer has a first surface, and a second surface opposing the first surface, the first and second surfaces being disposed in first and second parallel planes, respectively, and the piezoelectric layer comprises a polarization axis (c-axis) that is oriented parallel to the first and second planes.

4. The piezoelectric layer according to claim 1 , wherein the piezoelectric layer has an upper surface, and a lower surface opposing the upper surface, the upper and lower surfaces being disposed in first and second parallel planes, respectively, and the piezoelectric layer comprises a polarization axis (c-axis) that is oriented at an angle greater than approximately 0° to the first and second planes, and less than orthogonal to the first and second planes.

5. A bulk acoustic wave (BAW) resonator, comprising:

a substrate;

a first electrode disposed over the substrate;

a piezoelectric layer disposed over the first electrode, the piezoelectric layer comprising aluminum nitride (AlN) doped with ytterbium (Yb), an atomic percentage of Yb in the AlN is greater than or equal to approximately 10.0% and less than or equal to approximately 27.0%; and

a second electrode disposed over the piezoelectric layer.

6. The BAW resonator as claimed in claim 5 , further comprising an acoustic reflector disposed in the substrate, and beneath the first electrode.

7. The BAW resonator as claimed in claim 6 , wherein the acoustic reflector is a cavity in the substrate, or a distributed Bragg reflector disposed in the substrate.

8. A BAW resonator filter comprising a plurality of the BAW resonators of claim 7 .

9. The BAW resonator filter of claim 8 , wherein at least two of the plurality of BAW resonators are electrically connected in series, and at least two of the BAW resonators are connected electrically in parallel.

10. The BAW resonator of claim 5 , wherein the piezoelectric layer comprises an upper surface disposed in a first plane and a polarization axis (c-axis) that is substantially perpendicular to the first plane.

11. The BAW resonator of claim 5 , wherein the piezoelectric layer comprises an upper surface disposed in a first plane and a polarization axis (c-axis) that is inclined relative to the first plane.

12. The BAW resonator of claim 5 , wherein the piezoelectric layer is sandwiched between the first electrode and the second electrode and wherein a portion of an upper surface of the piezoelectric layer is not covered by the second electrode.

13. A surface acoustic wave (SAW) resonator, comprising:

a piezoelectric layer comprising aluminum nitride (AlN) doped with ytterbium (Yb), an atomic percentage of Yb in the AlN being greater than or equal to approximately 10.0% and less than or equal to approximately 27.0%; and

a pair of interdigitated comb electrodes disposed over the piezoelectric layer.

14. The SAW resonator of claim 13 , wherein the piezoelectric layer comprises a polarization axis (c-axis) oriented orthogonally to an upper surface of the piezoelectric layer.

15. The SAW resonator of claim 14 , wherein the pair of interdigitated comb electrodes are disposed in a plane of the upper surface of the piezoelectric layer.

16. The SAW resonator of claim 13 , wherein the piezoelectric layer comprises a polarization axis (c-axis) oriented parallel to an upper surface of the piezoelectric layer.

17. The SAW resonator of claim 16 , wherein the c-axis is also oriented parallel to the pair of interdigitated comb electrodes.

18. The SAW resonator of claim 13 , wherein the pair of interdigitated comb electrodes comprise a first electrode and a second electrode and wherein the pair of interdigitated comb electrodes are configured to vibrate in a direction that is parallel to a polarization axis (c-axis) of the piezoelectric layer in response to having an AC voltage applied between the first electrode and the second electrode.

19. The SAW resonator of claim 13 , wherein the pair of interdigitated comb electrodes comprise a first electrode and a second electrode and wherein the pair of interdigitated comb electrodes are configured to produce an AC voltage in response to having vibrations applied to the piezoelectric layer in a direction that is parallel to a polarization axis (c-axis) of the piezoelectric layer.

20. The SAW resonator of claim 13 , wherein the piezoelectric layer comprises a polarization axis (c-axis) oriented in a direction inclined relative to the piezoelectric layer.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 7, 2019
From: YANAGITANI, TAKAHIKO; SUZUKI, MASASHI
To: WASEDA UNIVERSITY
Reel/Frame 049403/0230 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 7, 2019
From: WASEDA UNIVERSITY
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 049404/0073 →
MERGER Recorded Jun 7, 2019
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED.
Reel/Frame 049412/0921 →
Priority Claims (1)
JP 2016-092976 · May 6, 2016 · national
Continuity (1)
Related Publication 20190089325A1 · Mar 21, 2019
Cited By (2)
US 12,471,290 US 12,640,182