Layout routing structure and layout routing method for improving SI performance of signal
View Patent ↗A layout routing structure and a layout routing method for improving an SI performance of a signal are provided. Each of two positive and negative differential traces on a PCB includes multiple segments D1, multiple segments D2 and multiple segments D3. In each of the two differential traces, the segment D1 and the segment D2 are staggered and parallel to each other, the segment D2 is routed between any two segments D1, and any two adjacent segments D1 and D2 are connected by the segment D3. In one of the two differential traces, all of the segments D1 are routed on the glass cloth, and all of the segments D2 are routed on the epoxy resin. In the other of the two differential traces, all of the segments D1 are routed on the epoxy resin, and all of the segments D2 are routed on the glass cloth.
1. A layout routing structure for improving an SI performance of a signal, comprising:
a PCB made of glass cloth and epoxy resin; and
two positive and negative differential traces on the PCB, wherein each of the two positive and negative differential traces comprises a plurality of segments D1, a plurality of segments D2 and a plurality of segments D3,
wherein in each of the two differential traces, the segment D1 and the segment D2 are staggered, and the segment D2 is routed between any two segments D1, and any two adjacent segments D1 and D2 are connected by the segment D3,
in one of the two differential traces, all of the segments D1 are routed on the glass cloth, and all of the segments D2 are routed on the epoxy resin, and in the other of the two differential traces, all of the segments D1 are routed on the epoxy resin, and all of the segments D2 are routed on the glass cloth, and
the two differential traces are parallel to each other.
2. The layout routing structure for improving the SI performance of the signal according to claim 1 , wherein in each of the two differential traces, an angle between the segment D1 and the segment D3 is equal to 135° or 45°, and an angle between the segment D2 and the segment D3 is equal to 45° or 135°.
3. The layout routing structure for improving the SI performance of the signal according to claim 2 , wherein in each of the differential traces, for the same the segments D3, an angle between the segment D2 which is connected to the segment D3 and the segment D3 is equal to 45° if an angle between the segment D1 which is connected to the segment D3 and the segment D3 is equal to 135°, and an angle between the segment D2 which is connected to the segment D3 and the segment D3 is equal to 135° if an angle between the segment D1 which is connected to the segment D3 and the segment D3 is equal to 45°.
4. The layout routing structure for improving the SI performance of the signal according to claim 3 , wherein a length of each of the plurality of segments D1 is equal to a length of each of the plurality of segments D2.
5. The layout routing structure for improving the SI performance of the signal according to claim 1 , wherein a combination mode of the glass cloth and the epoxy resin on the PCB comprises a 106 combination mode, a 1080 combination mode and a 2113 combination mode.
6. A layout routing method for improving an SI performance of a signal used for the structure according to claim 1 , comprising:
horizontally routing with a fixed offset in each of the two positive and negative differential traces which are parallel to each other on the PCB.
7. The layout routing method for improving the SI performance of the signal according to claim 6 , wherein the horizontally routing with the fixed offset comprises:
routing the plurality of segments D1, the plurality of segments D2 and the plurality of segments D3 for each of the two positive and negative differential traces on the PCB,
wherein in each of the two differential traces, the segment D1 and the segment D2 are staggered, the segment D2 is routed between any two segments D1, and any two adjacent segments D1 and D2 are connected by the segment D3,
in one of the two differential traces, all of the segments D1 are routed on the glass cloth, and all of the segments D2 are routed on the epoxy resin, and in the other of the two differential traces, all of the segments D1 are routed on the epoxy resin, and all of the segments D2 are routed on the glass cloth, and
the two differential traces are parallel to each other.
8. The layout routing method for improving the SI performance of the signal according to claim 7 , wherein in each of the two differential traces, an angle between the segment D1 and the segment D3 is equal to 135° or 45°, and an angle between the segment D2 and the segment D3 is equal to 45° or 135°,
for the same segments D3, an angle between the segment D2 which is connected to the segment D3 and the segment D3 is equal to 45° if an angle between the segment D1 which is connected to the segment D3 and the segment D3 is equal to 135°, and an angle between the segment D2 which is connected to the segment D3 and the segment D3 is equal to 135° if an angle between the segment D1 which is connected to the segment D3 and the segment D3 is equal to 45°, and
a length of each of the plurality of segments D1 is equal to a length of each of the plurality of segments D2.
9. The layout routing method for improving the SI performance of the signal according to claim 8 , wherein a combination mode of the glass cloth and the epoxy resin on the PCB comprises a 106 combination mode, a 1080 combination mode and a 2113 combination mode.