Systems and methods for sample analysis using swabs
The invention generally relates to systems and methods for sample analysis using swabs. In certain aspects, the invention provides systems that include a probe having a conductive proximal portion coupled to a porous material at a distal portion of the probe that is configured to retain a portion of a sample that has contacted the porous material, and a mass spectrometer having an inlet. The system is configured such that the porous material at a distal portion of the probe is aligned over the inlet of the mass spectrometer.
1. A system comprising:
a probe comprising a conductive proximal portion coupled to a porous material at a distal portion of the probe that is configured to retain a portion of a sample that has contacted the porous material; and
a mass spectrometer comprising an inlet comprising a distal end bent perpendicularly upward, wherein the system is configured such that the porous material at a distal portion of the probe is aligned directly vertically above the bent distal end of the inlet of the mass spectrometer.
2. The system according to claim 1 , wherein the porous material is arranged in a fused shape.
3. The system according to claim 1 , further comprising a voltage source operably coupled to the conductive proximal portion of the probe.
4. The system according to claim 3 , further comprising a solvent source configured to apply solvent to the porous material.
5. The system according to claim 4 , wherein the solvent includes an internal standard.
6. The system according to claim 1 , wherein the probe is attached to an electrospray ionization probe or forms a distal tip of an electrospray ionization probe.
7. The system according to claim 1 , wherein the mass spectrometer is a miniature mass spectrometer.