IP Library Granted Patent US 10,559,679
Granted Patent B2
US 10,559,679 · App. 16/104,148 · Granted Feb 11, 2020

Nitride semiconductor epitaxial substrate

Inventors: Hiroshi Oishi (Hadano, JP); Noriko Omori (Hadano, JP); Yoshihisa Abe (Hadano, JP)
Assignee: COORSTEK KK
H01L29/7787H01L21/0254H01L21/0262H01L29/0684H01L29/205H01L29/2003
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Quick Facts
Patent No.
US 10,559,679
App. No.
16/104,148
Granted
Feb 11, 2020
Kind
B2
Abstract

There is provided a nitride semiconductor epitaxial substrate having a channel layer, a spacer layer, and an electron supply layer that are stacked in this order. The channel layer is GaN. The spacer layer is Al a Ga 1-a N (0<a<0.5). The electron supply layer is Al x ln y Ga 1-x-y N (0<x+y≤1). The spacer layer has a thickness of two molecular layers or less.

Claims (6)

1. A nitride semiconductor epitaxial substrate, comprising a channel layer, a spacer layer, and an electron supply layer in this order, wherein

the channel layer is GaN,

the spacer layer is Al a Ga 1-a N(0<a<0.5),

the electron supply layer is Al x In y Ga 1-x-y N 0.1≤x≤0.3 and y=0), and

the spacer layer has a thickness of one or two molecular layers wherein the thickness of one molecular layer is 0.25 nm.

2. The nitride semiconductor HEMT using the nitride semiconductor epitaxial substrate according to claim 1 .

Assignments (2)
CHANGE OF NAME Recorded May 2, 2024
From: COORSTEK KK
To: COORSTEK GK
Reel/Frame 067565/0354 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 21, 2018
From: OISHI, HIROSHI; OMORI, NORIKO; ABE, YOSHIHISA
To: COORSTEK KK
Reel/Frame 046642/0405 →