Semiconductor package
A semiconductor package includes a first semiconductor package including a core member having a through-hole, a first semiconductor chip disposed in the through-hole and having an active surface with a connection pad disposed thereon, a first encapsulant for encapsulating at least a portion of the first semiconductor chip, and a connection member disposed on the active surface of the first semiconductor chip and including a redistribution layer electrically connected to the connection pad of the first semiconductor chip, a second semiconductor package disposed on the first semiconductor package and including a wiring substrate electrically connected to the connection member, at least one second semiconductor chip disposed on the wiring substrate, and a second encapsulant for encapsulating at least a portion of the second semiconductor chip, and a heat dissipation member covering a lateral surface of the second semiconductor package and exposing an upper surface of the second encapsulant.
1. A semiconductor package comprising:
a first semiconductor package including a core member having a through-hole, a first semiconductor chip disposed in the through-hole of the core member and having an active surface with a connection pad disposed thereon and a non-active surface opposing the active surface, a first encapsulant for encapsulating at least a portion of the first semiconductor chip, and a connection member disposed on the active surface of the first semiconductor chip and including a redistribution layer electrically connected to the connection pad of the first semiconductor chip;
a second semiconductor package disposed on the first semiconductor package and including a wiring substrate electrically connected to the connection member through a connection terminal, at least one second semiconductor chip disposed on the wiring substrate, and a second encapsulant for encapsulating at least a portion of the second semiconductor chip; and
a heat dissipation member covering a lateral surface of the second semiconductor package and exposing an upper surface of the second encapsulant,
wherein a lower surface of the heat dissipation member is provided on an upper surface of the first semiconductor package.
2. The semiconductor package of claim 1 , wherein an upper surface of the heat dissipation member is positioned on the same level as or on a level lower than an upper surface of the second semiconductor package, with reference to the first semiconductor package.
3. The semiconductor package of claim 1 , wherein the heat dissipation member includes an upper portion having an opening with the second semiconductor package disposed thereon and a lateral surface portion extending from the upper portion along the lateral surface of the second semiconductor package.
4. The semiconductor package of claim 3 , wherein the lateral surface portion extends along two facing lateral surfaces of the second semiconductor package.
5. The semiconductor package of claim 3 , wherein the lateral surface portion extends along all of lateral surfaces of the second semiconductor package.
6. The semiconductor package of claim 5 , wherein portions of the lateral surface portion respectively extending along two adjacent lateral surfaces of the second semiconductor package are spaced apart from each other.
7. The semiconductor package of claim 3 , wherein the heat dissipation member is bent in opposite directions from upper and lower ends of the lateral surface portion.
8. The semiconductor package of claim 3 , wherein the upper portion and the lateral surface portion are connected by an adhesive member.
9. The semiconductor package of claim 1 , wherein the heat dissipation member is spaced apart from the lateral surface of the second semiconductor package.
10. The semiconductor package of claim 1 , further comprising an interposer substrate disposed between the first semiconductor package and the second semiconductor package.
11. The semiconductor package of claim 10 , wherein a lower surface of the heat dissipation member is adhered to the interposer substrate.
12. The semiconductor package of claim 10 , wherein the second semiconductor package has a smaller cross sectional area than the interposer substrate on a plane.
13. The semiconductor package of claim 1 , wherein a lower surface of the heat dissipation member is adhered to the upper surface of the first semiconductor package.
14. The semiconductor package of claim 1 , wherein the first semiconductor package further includes a passive component adhered to a lower surface of the connection member.
15. The semiconductor package of claim 1 , wherein the core member includes a first core insulating layer, a first wiring layer contacting the connection member and embedded in the first core insulating layer, and a second wiring layer disposed at an opposite side of the first insulating layer to a side at which the first wiring layer is embedded; and
wherein the first and second wiring layers are electrically connected to the connection pad.
16. The semiconductor package of claim 1 , wherein the core member includes a first core insulating layer and first and second wiring layers arranged on opposite surfaces of the first core insulating layer; and
wherein the first and second wiring layers are electrically connected to the connection pad.
17. The semiconductor package of claim 1 , wherein an upper surface of the heat dissipation member and an upper surface of the second encapsulant of the second semiconductor package are disposed on a same level, with reference to the first semiconductor package.
18. A semiconductor package comprising:
a first semiconductor package including a first semiconductor chip having an active surface with a connection pad disposed thereon and a non-active surface opposing the active surface, an encapsulant for encapsulating at least a portion of the first semiconductor chip, and a connection member disposed on the active surface of the first semiconductor chip and including a redistribution layer electrically connected to the connection pad of the first semiconductor chip;
a second semiconductor package disposed on the first semiconductor package and including a wiring substrate electrically connected to the connection member through a connection terminal and at least one second semiconductor chip disposed on the wiring substrate;
an interposer substrate disposed between the first semiconductor package and the second semiconductor package; and
a heat dissipation member disposed on the interposer substrate, covering a lateral surface of the second semiconductor package, and exposing an upper surface of the second semiconductor package,
wherein a lower surface of the heat dissipation member is provided on an upper surface of the first semiconductor package.
19. The semiconductor package of claim 18 , wherein the heat dissipation member extends on at least two lateral surfaces of the second semiconductor package.
20. The semiconductor package of claim 18 , wherein the heat dissipation member surrounds all of lateral surfaces of the second semiconductor package.