IP Library Granted Patent US 10,622,052
Granted Patent B2
US 10,622,052 · App. 16/121,448 · Granted Apr 14, 2020

Reduced peak self-refresh current in a memory device

Inventor: Vijayakrishna J. Vankayala (Allen, TX)
Assignee: Micron Technology, Inc.
G11C11/40615G06F1/10G06F3/0619G06F3/0659G06F3/0673G11C11/409
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Quick Facts
Patent No.
US 10,622,052
App. No.
16/121,448
Granted
Apr 14, 2020
Kind
B2
Abstract

Devices and methods include organizing memory units of a memory device into a number of groups. The devices and methods also include self-refreshing each group of memory units on different corresponding sequential clock pulses of a self-refresh clock. Specifically, at least one of each group of memory units counts pulses of a self-refresh clock and invokes a self-refresh after every nth pulse of a cycle of pulses while not invoking a self-refresh on all other pulses of the cycle of pulses.

Claims (38)

1. A memory device, comprising:

a memory controller comprising a self-refresh clock; and

a plurality of memory units, wherein each memory unit in a first subset of the plurality of memory units is configured to self-refresh during a first self-refresh cycle indicated by a first pulse of the self-refresh clock, and each memory unit in a second subset of the plurality of memory units is configured to self-refresh during a second self-refresh cycle indicated by a second pulse of the self-refresh clock, wherein a first memory unit in the first subset is configured to count pulses of the self-refresh clock and to self-refresh itself in response to a first number of counted pulses of the self-refresh clock, and a second memory unit in the second subset is configured to count pulses of the self-refresh clock and to self-refresh itself in response to a second number of counted pulses of the self-refresh clock.

2. The memory device of claim 1 , wherein each memory unit in a third subset of the plurality of memory units is configured to self-refresh during a third self-refresh cycle indicated by a third pulse of the self-refresh clock, and each memory unit in a fourth subset of the plurality of memory units is configured to self-refresh during a fourth self-refresh cycle indicated by a fourth pulse of the self-refresh clock.

3. The memory device of claim 2 , wherein:

each memory unit in a fifth subset of the plurality of memory units is configured to self-refresh during a fifth self-refresh cycle indicated by a fifth pulse of the self-refresh clock;

each memory unit in a sixth subset of the plurality of memory units is configured to self-refresh during a sixth self-refresh cycle indicated by a sixth pulse of the self-refresh clock;

each memory unit in a seventh subset of the plurality of memory units is configured to self-refresh during a seventh self-refresh cycle indicated by a seventh pulse of the self-refresh clock; and

each memory unit in an eighth subset of the plurality of memory units is configured to self-refresh during an eighth self-refresh cycle indicated by an eighth pulse of the self-refresh clock.

4. The memory device of claim 1 , wherein a frequency of the self-refresh clock is N times a frequency that has a wavelength shorter than a maximum refresh duration for any individual memory unit of the plurality of memory units where N is a number of different subsets with different self-refresh cycles in the plurality of memory units.

5. The memory device of claim 1 , wherein each memory unit comprises one or more memory banks each comprising a plurality of capacitors, wherein the self-refresh clock is configured to cause the capacitors of the plurality of capacitors to self-refresh before stored charges in the capacitors is lost due to charge leakage of the capacitors.

6. The memory device of claim 5 , wherein the self-refresh comprises:

reading data from the plurality of capacitors; and

writing back the data to the plurality of capacitors.

7. The memory device of claim 6 , wherein the self-refresh is completed without direction from a host device coupled to the memory device.

8. The memory device of claim 5 , wherein each memory unit comprises a die each comprising a plurality of memory banks.

9. The memory device of claim 1 , wherein self-refreshes of each memory unit in the first subset of the plurality of memory units occur simultaneously.

10. The memory device of claim 1 , wherein self-refreshes of each memory unit in the first subset of the plurality of memory units occur within 4-8 ns of each other.

11. The memory device of claim 1 , comprising a memory die comprising the plurality of memory units, wherein the plurality of memory units comprises a plurality of memory banks in a memory die.

12. The memory device of claim 1 , wherein the plurality of memory units comprises a plurality of memory dies in a stack each including a plurality of memory banks.

13. A method comprising:

organizing memory units of a memory device into a number of groups; and

self-refreshing each group of memory units on different corresponding sequential clock pulses of a self-refresh clock, wherein separately refreshing each group comprises at least one memory unit in each memory group configured to count pulses of the self-refresh clock and to self-refresh itself in response to a counted number of pulses of the self-refresh clock.

14. The method of claim 13 , wherein a frequency of the self-refresh clock is equal to a refresh rate of any memory unit of the memory units times the number.

15. The method of claim 13 , wherein self-refreshing a group of memory units comprises self-refreshing each memory unit of a respective memory unit simultaneously.

16. The method of claim 13 , wherein self-refreshing a group of memory units comprises self-refreshing each memory unit of a respective memory unit with a 4-8 ns stagger between each self-refresh.

17. The method of claim 13 , wherein the at least one memory unit is a master for a respective memory unit group and is configured to send an indication to other memory units in the respective memory unit group to cause the other memory units to self-refresh.

18. A memory device, comprising:

a memory controller configured to output a self-refresh clock; and

a plurality of memory units configured to:

receive the self-refresh clock; and

sequentially refresh groups of the plurality of memory units using sequential pulses of the self-refresh clock, wherein each pulse of the self-refresh clock induces a self-refresh cycle that causes refresh in a single group of the refresh groups, wherein a first memory unit corresponding to a first refresh group is configured to:

count pulses of the self-refresh clock; and

after a number corresponding to the first refresh group has been counted, refresh the first memory unit.

19. The memory device of claim 18 , wherein sequentially and separately refreshing groups of the plurality of memory units comprises refreshing memory units of a respective group by staggering refreshing of the memory units of the respective group within a single refresh cycle.

20. The memory device of claim 18 , wherein the first memory unit is configured to send an indication of the count to a second memory unit corresponding to the first refresh group, and the second memory unit is configured to:

receive the indication of the count from the first memory unit; and

in response to receiving the indication, refresh the second memory unit.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded Nov 15, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 051041/0317 →
RELEASE OF SECURITY INTEREST Recorded Oct 14, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050724/0392 →
SUPPLEMENT NO. 12 TO PATENT SECURITY AGREEMENT Recorded Apr 19, 2019
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 048948/0677 →
SUPPLEMENT NO. 3 TO PATENT SECURITY AGREEMENT Recorded Apr 19, 2019
From: MICRON TECHNOLOGY, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 048951/0902 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 10, 2018
From: VANKAYALA, VIJAYAKRISHNA J.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047044/0045 →
Cited By (1)
US 12,431,180