IP Library › Granted Patent US 10,566,270
Granted Patent B2
US 10,566,270 · App. 16/121,721 · Granted Feb 18, 2020

Enhanced thermal transfer in a semiconductor structure

Inventors: Shuming Xu (Sunnyvale, CA); Yi Zheng (Sunnyvale, CA)
Assignee: COOLSTAR TECHNOLOGY, INC.
H01L23/49568H01L21/4825H01L21/4828H01L21/4871H01L21/4882H01L23/3677H01L23/4275H01L23/49513H01L23/49541H01L23/49575H01L23/3128H01L29/0657H01L2224/16245H01L2224/73253H01L2924/181H01L2924/18161
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Quick Facts
Patent No.
US 10,566,270
App. No.
16/121,721
Granted
Feb 18, 2020
Kind
B2
Abstract

A semiconductor device having enhanced thermal transfer includes at least one die, including a device layer in which one or more functional circuit elements are formed and a substrate supporting the device layer, and a support structure. The die is disposed on the support structure using at least one connection structure coupled between the device layer and the support structure. A back surface of the substrate is textured so as to increase a surface area of the back surface to thereby enhance thermal transfer between the substrate and an external environment.

Claims (20)

1. A method for fabricating a semiconductor device having enhanced thermal transfer, the method comprising:

providing at least one die including a device layer formed on a front side of a semiconductor substrate, the device layer including one or more functional circuit elements formed therein;

attaching the die to a support structure such that the front side of the die is disposed on at least a portion of the support structure; and

texturing a back side of the substrate so as to increase a surface area of the back side of the substrate thereby enhancing thermal transfer between the substrate and an external environment;

wherein texturing the back side of the substrate comprises forming a plurality of trenches in the back side of the substrate, a portion of the substrate remaining between adjacent trenches forming periodic fingered structures, a surface area of the back side of the substrate being controlled as a function of an aspect ratio of the fingered structures.

2. The method of claim 1 , wherein the die is attached to the support structure using at least one connection structure coupled between the device layer and the support structure.

3. The method of claim 1 , wherein texturing the back side of the substrate comprises at least one of forming periodic structures in or on the back side of the substrate and forming non-periodic structures in or on the back side of the substrate.

4. The method of claim 1 further comprising micro-texturing at least one of sidewalls and a bottom of each of at least a subset of the trenches for increasing a surface emissivity of the semiconductor device.

5. The method of claim 1 , further comprising forming a plurality of pyramid structures on at least one of sidewalls and a bottom of each of at least a subset of the trenches, the pyramid structures increasing a surface emissivity of the semiconductor device.

6. The method of claim 5 , further comprising forming at least a subset of the pyramid structures of a material different than the substrate.

7. The method of claim 1 , further comprising forming a plurality of periodic pyramid structures on the back side of the substrate and protruding vertically therefrom, a surface area of the back side of the substrate being controlled as a function of an aspect ratio of the pyramid structures.

8. The method of claim 1 , further comprising forming at least opening in the support structure, the opening providing an air path through the support structure for increasing natural convection cooling in the semiconductor device.

9. A method for fabricating a semiconductor device having enhanced thermal transfer, the method comprising:

providing at least one die including a device layer formed on a front side of a semiconductor substrate, the device layer including one or more functional circuit elements formed therein;

attaching the die to a support structure such that the front side of the die is disposed on at least a portion of the support structure;

texturing a back side of the substrate so as to increase a surface area of the back side of the substrate thereby enhancing thermal transfer between the substrate and an external environment;

depositing a thermal interface material on at least a portion of the back side of the substrate; and

attaching a thermal distribution structure to at least a portion of an upper surface of the thermal interface material.

10. The method of claim 9 , wherein the thermal interface material comprises a phase change material.

11. The method of claim 10 , wherein texturing comprises forming a plurality of microstructures on the back side of the substrate, the microstructures being configured as reservoirs for confining the phase change material therein when the phase change material is in a liquid phase.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 5, 2018
From: XU, SHUMING; ZHENG, YI
To: COOLSTAR TECHNOLOGY, INC.
Reel/Frame 046786/0805 →
Continuity (2)
Division 15362504 · Nov 28, 2016
Related Publication 20190006269A1 · Jan 3, 2019
Cited By (1)
US 12,543,585