Wire bond wires for interference shielding
Apparatuses relating generally to a microelectronic package having protection from interference are disclosed. In an apparatus thereof, a substrate has an upper surface and a lower surface opposite the upper surface and has a ground plane. A first microelectronic device is coupled to the upper surface of the substrate. Wire bond wires are coupled to the ground plane for conducting the interference thereto and extending away from the upper surface of the substrate. A first portion of the wire bond wires is positioned to provide a shielding region for the first microelectronic device with respect to the interference. A second portion of the wire bond wires is not positioned to provide the shielding region. A second microelectronic device is coupled to the substrate and located outside of the shielding region. A conductive surface is over the first portion of the wire bond wires for covering the shielding region.
1. An apparatus comprising:
a substrate having an upper surface and a lower surface opposite the upper surface and having bond pads on the upper surface;
a microelectronic device coupled to the upper surface of the substrate;
wire bond wires having ends bonded to the bond pads;
wherein the wire bond wires extend away from the upper surface of the substrate and are arranged in a preselected manner to shield from one or more frequencies of an interference generated by the microelectronic device;
wherein the wire bond wires are positioned alongside of at least one side of the microelectronic device to provide a shielding region with respect to the interference; and
a conductive surface positioned above the wire bond wires for covering at least a portion of the shielding region.
2. The apparatus according to claim 1 , wherein the ends of the wire bond wires are first ends, and wherein the wire bond wires have second ends coupled to the conductive surface.
3. The apparatus according to claim 1 , wherein the substrate is a package substrate of a system-in-package.
4. The apparatus according to claim 3 , wherein the wire bond wires are located on at least one side of a perimeter of the system-in-package.
5. The apparatus according to claim 3 , wherein the wire bond wires are coupled to carry signals within the system-in-package.
6. The apparatus according to claim 1 , wherein the wire bond wires are in an array having interleaved spacing between rows and columns of the array to increase density of the wire bond wires for reducing EMI of the interference.
7. The apparatus according to claim 1 , wherein the wire bond wires are electrically coupled to an electrical ground.
8. The apparatus according to claim 1 , wherein the wire bond wires are electrically coupled to a supply voltage.
9. The apparatus according to claim 1 , wherein a pitch of the bond pads is selected to provide a low pass filter to reduce EMI of the interference with respect to operation of the microelectronic device.
10. An apparatus comprising:
a substrate having an upper surface and a lower surface opposite the upper surface and having bond pads on the upper surface;
a microelectronic device coupled to the upper surface of the substrate;
wire bond wires having ends bonded to the bond pads;
wherein the wire bond wires extend away from the upper surface of the substrate and are arranged in a preselected manner to shield the microelectronic device from one or more frequencies of an interference with respect to operation of the microelectronic device;
wherein the wire bond wires are positioned alongside of at least one side of the microelectronic device to provide a shielding region with respect to the interference; and
a conductive surface positioned above the wire bond wires for covering at least a portion of the shielding region.
11. The apparatus according to claim 10 , wherein the ends of the wire bond wires are first ends, and wherein the wire bond wires have second ends coupled to the conductive surface.
12. The apparatus according to claim 10 , wherein the substrate is a package substrate of a system-in-package.
13. The apparatus according to claim 12 , wherein the wire bond wires are located on at least one side of a perimeter of the system-in-package.
14. The apparatus according to claim 12 , wherein the wire bond wires are coupled to carry signals within the system-in-package.
15. The apparatus according to claim 10 , wherein the wire bond wires are in an array having interleaved spacing between rows and columns of the array to increase density of the wire bond wires for reducing EMI of the interference.
16. The apparatus according to claim 10 , wherein the wire bond wires are electrically coupled to an electrical ground.
17. The apparatus according to claim 10 , wherein the wire bond wires are electrically coupled to a supply voltage.
18. The apparatus according to claim 10 , wherein a pitch of the bond pads is selected to provide a low pass filter to reduce EMI of the interference with respect to operation of the microelectronic device.