IP Library › Granted Patent US 10,559,350
Granted Patent B2
US 10,559,350 · App. 16/127,894 · Granted Feb 11, 2020

Memory circuit and electronic device

Inventors: Masato Oda (Yokohama, JP); Shinichi Yasuda (Setagaya, JP)
Assignee: KABUSHIKI KAISHA TOSHIBA
G11C11/412G11C11/419G11C8/16H01L27/11
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Quick Facts
Patent No.
US 10,559,350
App. No.
16/127,894
Granted
Feb 11, 2020
Kind
B2
Abstract

A memory circuit according to an embodiment includes: a first inverter circuit including a first p-channel MOS transistor and a first n-channel MOS transistor; a second inverter circuit cross-coupled with the first inverter and including a second p-channel MOS transistor and a second n-channel MOS transistor; a third n-channel MOS transistor in which one of a source and drain terminals is connected to a first output terminal of the first inverter circuit, and a gate terminal is connected to a first wiring line; a fourth n-channel MOS transistor connected to the third n-channel MOS transistor; a fifth n-channel MOS transistor in which one of a source and drain terminals is connected to a second output terminal of the second inverter circuit; and a sixth n-channel MOS transistor connected to the fifth n-channel MOS transistor.

Claims (16)

1. A memory circuit comprising:

a first inverter circuit including a first input terminal, a first output terminal, a first p-channel MOS transistor in which a source terminal is connected to a first power supply line and a gate terminal is connected to the first input terminal, and a first n-channel MOS transistor in which a source terminal is connected to a second power supply line, a drain terminal is connected to a drain terminal of the first p-channel MOS transistor, and a gate terminal is connected to the first input terminal;

a second inverter circuit including a second input terminal connected to the first output terminal, a second output terminal connected to the first input terminal, a second p-channel MOS transistor in which a source terminal is connected to the first power supply line and a gate terminal is connected to the second input terminal, and a second n-channel MOS transistor in which a source terminal is connected to the second power supply line, a drain terminal is connected to a drain terminal of the second p-channel MOS transistor, and a gate terminal is connected to the second input terminal;

a third n-channel MOS transistor in which one of a source terminal and a drain terminal is connected to the first output terminal and the second input terminal, the source terminal is connected to the drain terminal, and a gate terminal is connected to a first wiring line;

a fourth n-channel MOS transistor in which one of a source terminal and a drain terminal is connected to the other of the source terminal and the drain terminal of the third re-channel MOS transistor, and the other of the source terminal and the drain terminal is connected to a second wiring line, and a gate terminal is connected to a third wiring line;

a fifth n-channel MOS transistor in which one of a source terminal and a drain terminal is connected to the second output terminal and the first input terminal, the source terminal is connected to the drain terminal, and a gate terminal is connected to the first wiring line; and

a sixth n-channel MOS transistor in which one of a source terminal and a drain terminal is connected to the other of the source terminal and the drain terminal of the fifth n-channel MOS transistor, the other of the source terminal and the drain terminal is connected to a fourth wiring line, and a gate terminal is connected to the third wiring line.

2. The memory circuit according to claim 1 , further comprising:

a third p-channel MOS transistor, in which a source terminal is connected to a first power supply and a drain terminal is connected to the first wiring line, the third p-channel MOS transistor including a gate insulating film that is thicker than gate insulating films of the first p-channel MOS transistor and the second p-channel MOS transistor; and

a seventh n-channel MOS transistor, in which a source terminal is connected to a second power supply and a drain terminal is connected to the first wiring line, the seventh re-channel MOS transistor including a gate insulating film that is thicker than gate insulating films of the first to fourth n-channel MOS transistors.

3. The memory circuit according to claim 2 , further comprising a fourth p-channel MOS transistor in which a gate insulating film is thicker than the gate insulating films of the first p-channel MOS transistor and the second p-channel MOS transistor, the fourth p-channel MOS transistor being disposed between the drain terminal of the third p-channel MOS transistor and the first power supply.

4. The memory circuit according to claim 1 , further comprising a control circuit configured to supply a voltage to the third wiring line for turning on the fourth n-channel MOS transistor and the sixth n-channel MOS transistor, supply a first voltage to one of the second wiring line and the fourth wiring line and a second voltage that is lower than the first voltage to the other of the second wiring line and the fourth wiring line, and supply a write voltage to the first wiring line.

5. An electronic device comprising:

the memory circuit according to claim 1 ;

a memory that stores a program; and

a processor that executes processing on the memory circuit in accordance with the program stored in the memory.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 11, 2018
From: ODA, MASATO; YASUDA, SHINICHI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 046841/0525 →
Priority Claims (1)
JP 2018-046687 · Mar 14, 2018 · national
Continuity (1)
Related Publication 20190287610A1 · Sep 19, 2019