IP Library Granted Patent US 10,515,918
Granted Patent B2
US 10,515,918 · App. 16/138,074 · Granted Dec 24, 2019

Methods of fluxless micro-piercing of solder balls, and resulting devices

Inventor: Teck Kheng Lee (Singapore, SG)
Assignee: Micron Technology, Inc.
H01L24/14H01L21/4846H01L23/481H01L23/49811H01L24/06H01L24/17H01L24/81H05K3/325H05K3/4007H01L24/13H01L24/16H01L2224/0401H01L2224/0603H01L2224/1012H01L2224/13012H01L2224/13016H01L2224/13019H01L2224/13023H01L2224/1403H01L2224/16145H01L2224/73103H01L2224/73204H01L2224/812H01L2224/8114H01L2224/81136H01L2224/81138H01L2224/81193H01L2224/81208H01L2224/81801H01L2224/83192H01L2224/83194H01L2924/014H01L2924/01005H01L2924/0105H01L2924/01006H01L2924/01028H01L2924/01033H01L2924/01051H01L2924/01078H01L2924/01079H01L2924/01082H01L2924/14H01L2924/15311H01L2924/20105H01L2924/20106H05K3/06H05K2201/0367H05K2201/10674H05K2201/10734H05K2201/10977H05K2203/0315H05K2203/0369H05K2203/1476
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,515,918
App. No.
16/138,074
Granted
Dec 24, 2019
Kind
B2
Abstract

A method of establishing conductive connections is disclosed. The method includes providing an integrated circuit die having a plurality of solder balls each of which has an oxide layer on an outer surface of the solder ball. The method also includes performing a heating process to heat at least the solder balls and applying a force causing each of a plurality of piercing bond structures on a substrate to pierce one of the solder balls and its associated oxide layer to thereby establish a conductive connection between the solder ball and the piercing bond structure.

Claims (33)

1. A device comprising:

a substrate having a first side and a second side facing away from the first side;

a plurality of piercing bond structures at the first side of the substrate, each of the piercing bond structures having an outer surface that surrounds a solid core of conductive material, wherein the outer surface includes an anti-oxidation material;

a plurality of contact pads at the second side of the substrate; and

a plurality of wiring traces electrically coupling the piercing bond structures with the contact pads,

wherein the anti-oxidation material is a first anti-oxidation material, the device further including a second anti-oxidation material over the first anti-oxidation material,

wherein the first anti-oxidation material is gold and the second anti-oxidation material is nickel, and

wherein individual piercing bond structures have a first end facing the first side of the substrate and a second end facing away from the first end, and wherein the second ends are non-flat.

2. The device of claim 1 , further comprising a standoff structure at the first side of the substrate, wherein the standoff structure extends away from the first side of the substrate for a distance.

3. The device of claim 1 , further comprising a non-conductive paste at the first side of the substrate.

4. The device of claim 1 , wherein the substrate includes a via extending from the first side of the substrate to the second side of the substrate, wherein at least one wiring trace lines the via.

5. A device comprising:

a substrate having a first side and a second side facing away from the first side;

a plurality of piercing bond structures at the first side of the substrate, each of the piercing bond structures having an outer surface that surrounds a solid core of conductive material, wherein the outer surface includes an anti-oxidation material;

a plurality of contact pads at the second side of the substrate; and

a plurality of wiring traces electrically coupling the piercing bond structures with the contact pads,

wherein the anti-oxidation material is a first anti-oxidation material, the device further including a second anti-oxidation material over the first anti-oxidation material,

wherein the first anti-oxidation material is gold and the second anti-oxidation material is nickel, and

wherein the piercing bond structures have substantially triangular cross-sections.

6. The device of claim 5 , further comprising a standoff structure at the first side of the substrate, wherein the standoff structure extends away from the first side of the substrate for a distance.

7. The device of claim 5 , further comprising a non-conductive paste at the first side of the substrate.

8. The device of claim 5 , wherein the substrate includes a via extending from the first side of the substrate to the second side of the substrate, wherein at least one wiring trace lines the via.

9. A device comprising:

a substrate having a first side and a second side facing away from the first side;

a plurality of piercing bond structures at the first side of the substrate, each of the piercing bond structures having an outer surface that surrounds a solid core of conductive material, wherein the outer surface includes an anti-oxidation material;

a plurality of contact pads at the second side of the substrate; and

a plurality of wiring traces electrically coupling the piercing bond structures with the contact pads,

wherein the anti-oxidation material is a first anti-oxidation material, the device further including a second anti-oxidation material over the first anti-oxidation material,

wherein the first anti-oxidation material is gold and the second anti-oxidation material is nickel, and

wherein individual piercing bond structures have a first end facing the first side of the substrate and a second end facing away from the first end, and wherein the individual second ends have cross-sections selected from a group consisting of a pointed cross-section, a rounded cross-section, and a multiple-peak cross section.

10. The device of claim 9 , further comprising a standoff structure at the first side of the substrate, wherein the standoff structure extends away from the first side of the substrate for a distance.

11. The device of claim 9 , further comprising a non-conductive paste at the first side of the substrate.

12. The device of claim 9 wherein the substrate includes a via extending from the first side of the substrate to the second side of the substrate, wherein at least one wiring trace lines the via.

Assignments (4)
RELEASE OF SECURITY INTEREST Recorded Nov 15, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 051041/0317 →
RELEASE OF SECURITY INTEREST Recorded Oct 14, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050724/0392 →
SUPPLEMENT NO. 12 TO PATENT SECURITY AGREEMENT Recorded Apr 19, 2019
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 048948/0677 →
SUPPLEMENT NO. 3 TO PATENT SECURITY AGREEMENT Recorded Apr 19, 2019
From: MICRON TECHNOLOGY, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 048951/0902 →