Temperature informed memory refresh

1. A memory system comprising:

a memory component; and

a processing device, communicatively coupled to the memory component when in operation, the processing device performing operations comprising:

updating a write temperature counter stored in temperature data in response to a memory component write performed under an extreme temperature, the memory component write performed on a memory component element in the memory component, the extreme temperature being outside of a defined temperature window;

sorting the memory component element above other memory component elements in the memory component based on the temperature data, the sorting comprising generating, based on at least the write temperature counter, a sort-value that is compared against one or more sort-values calculated for the other memory component elements; and

performing a refresh on the memory component element in response to the sorting.

2. The memory system of claim 1 , wherein the generating the sort-value based on the at least the write temperature counter comprises combining a Low Temperature Write Counter (LWTC) and a High Temperature Write Counter (HWTC) to generate the sort-value.

3. The memory system of claim 2 , wherein the sort-value is beyond a minimum temperature-based refresh threshold.

4. The memory system of claim 3 , wherein the minimum temperature-based refresh threshold is based on a raw bit error rate (RBER) of the memory component.

5. The memory system of claim 3 , wherein the minimum temperature-based refresh threshold is a percentage of bytes in the memory component element written at the extreme temperature.

6. The memory system of claim 1 , wherein the sorting is performed in response to closure of the memory component element.

7. The memory system of claim 1 , wherein the performing the refresh comprises copying contents of the memory component element to a new memory component element.

8. The memory system of claim 7 , wherein the copying is performed in response to a non-extreme temperature of the new memory component element.

9. A method comprising:

updating a write temperature counter stored in temperature data in response to a memory component write performed, on a memory component element in a memory component, under an extreme temperature, the extreme temperature being a temperature outside a defined temperature window;

sorting the memory component element above other memory component elements in the memory component based on the temperature data, the sorting comprising generating, based on at least the write temperature counter, a sort-value that is compared against one or more sort-values calculated for the other memory component elements; and

performing a refresh on the memory component element in response to the sorting.

10. The method of claim 9 , wherein the generating the sort-value based on the at least the write temperature counter comprises combining a Low Temperature Write Counter (LWTC) and a High Temperature Write Counter (HWTC) to generate the sort-value.

11. The method of claim 10 , wherein the sort-value is beyond a minimum temperature-based refresh threshold.

12. The method of claim 11 , wherein the minimum temperature-based refresh threshold is based on a raw bit error rate (RBER) of the memory component.

13. The method of claim 11 , wherein the minimum temperature-based refresh threshold is a percentage of bytes in the memory component element written at the extreme temperature.

14. The method of claim 9 , wherein the sorting is performed in response to closure of the memory component element.

15. The method of claim 9 , wherein the performing the refresh comprises copying contents of the memory component element to a new memory component element.

16. The method of claim 15 , wherein the copying is performed in response to a non-extreme temperature of the new memory component element.

17. A non-transitory machine readable medium including instructions that, when executed by a processing device, cause the processing device to perform operations comprising:

updating a write temperature counter stored in temperature data in response to a memory component write performed under an extreme temperature, a memory component included in a memory system, the memory component write performed on a memory component element in the memory component;

sorting the memory component element above other memory component elements in the memory component based on the temperature data, the sorting comprising generating, based on at least the write temperature counter, a sort-value that is compared against one or more sort-values calculated for the other memory component elements; and

performing a refresh on the memory component element in response to the sorting.

18. The machine readable medium of claim 17 , wherein the generating the sort-value based on the at least the write temperature counter comprises combining a Low Temperature Write Counter (LWTC) and a High Temperature Write Counter (HWTC) to generate the sort-value.

19. The machine readable medium of claim 18 , wherein the sort-value is beyond a minimum temperature-based refresh threshold.

20. The machine readable medium of claim 19 , wherein the minimum temperature-based refresh threshold is based on a raw bit error rate (RBER) of the memory component.

21. The machine readable medium of claim 19 , wherein the minimum temperature-based refresh threshold is a percentage of bytes in the memory component element written at the extreme temperature.

22. The machine readable medium of claim 17 , wherein the sorting is performed in response to closure of the memory component element.

23. The machine readable medium of claim 17 , wherein the performing the refresh comprises copying contents of the memory component element to a new memory component element.

24. The machine readable medium of claim 23 , wherein the copying is performed in response to a non-extreme temperature of the new memory component element.