Memory device with improved writing features
The present invention relates to a method of performing a write access phase for a memory device and comprising: transferring a write data from a local input and output line to a bit line to write the data into a memory cell via the bit line by activating a column switch provided between the bit line and the local input and output line during a first period; and transferring a read data read out from the memory cell to the local input and output line via the bit line by activating the column switch during a second period; wherein the first period is longer than the second period.
1. A method comprising:
transferring a write data from a local input and output line to a bit line to write the write data into a memory cell via the bit line by activating a column switch provided between the bit line and the local input and output line during a first period; and
transferring a read data read out from the memory cell to the local input and output line via the bit line by activating the column switch during a second period;
wherein the first period is longer than the second period, wherein the activation of the column switch includes activating a column select pulse signal and subsequent column-select pulse signals partially overlap during a write access phase.
2. The method of claim 1 , wherein activating the column select pulse signal includes enabling a sense amplifier coupled to the local input and output line.
3. The method of claim 1 , wherein said first period is longer for a write access phase only.
4. The method of claim 2 , wherein timing control for the write and read access phases thought said sense amplifier is kept different regulating the duration of said column-select pulse signal in the write and read access phases independently.
5. The method of claim 1 , wherein a duration of said first period is set to double of said second period.
6. The method of claim 1 , wherein a duration of said second period corresponds to a duration of a clock pulse signal.
7. The method of claim 1 , wherein a duration of said first period is regulated to correspond to double a clock pulse signal during an access phase.
8. The method of claim 2 , wherein column-select pulse signals pertinent to different columns of a memory matrix partially overlap during a write access phase.
9. A method comprising:
transferring a write data from a local input and output line to a bit line to write the write data into a memory cell via the bit line by activating a column switch provided between the bit line and the local input and output line during a first period; and
transferring a read data read out from the memory cell to the local input and output line via the bit line by activating the column switch during a second period;
wherein the first period is longer than the second period,
wherein the activation of the column switch includes activating a column select pulse signal enabling a sense amplifier coupled to the local input and output line,
wherein the write data to be written of a previous write access phase is enabled to be driven to the sense amplifier when a subsequent column select pulse signal is already rising.
10. The method of claim 1 , wherein a time duration of said second period corresponds to a column-to-column delay tCCD while a duration of said first period corresponds to double of a clock pulse signal for a write access phase only.
11. The method of claim 1 , wherein the memory device is a Double Data Rate x Synchronous Dynamic Random Access Memory (DDRx SDRAM) or a Graphic Double Data Rate x Synchronous Dynamic Random Access Memory (GDDRx SDRAM) or a High Bandwidth Memory (HBM), x is an integer greater than or equal to 1.
12. An apparatus comprising at least a memory cell array including a plurality of memory cells structured in a matrix of bit lines and word lines;
a local I/O line coupled to said bit lines;
a plurality of sense amplifiers provided for the bit lines, respectively;
a plurality of column-select lines provided for the sense amplifiers, respectively, a selected one of the column-select lines receiving a column-select pulse signal enabling a transfer of write data from the local I/O line to the respective sense amplifier;
a timing regulator configured to receive or generate at least a clock pulse signal for regulating a timing access to the apparatus; and
a column-select pulse signal regulator configured to regulate a duration of the column-select pulse signal during a write access phase to a selected one of the memory cells setting a duration longer than said clock pulse signal, wherein the column-select pulse signals generated during the write access phase partially overlap.
13. An apparatus according to claim 12 , wherein said column-select pulse signal regulator receives as inputs a write control signal and a read control signal to select the duration of the column-select pulse signal in case of a write or read access phase.
14. An apparatus according to claim 12 , wherein outputs of said column-select pulse signal regulator are coupled to corresponding sense amplifiers to enable them to receive a corresponding write data to be written.
15. An apparatus according to claim 12 , wherein said column-select pulse signal regulator generates the column-select pulse signal having a duration extended with respect to a duration of said clock pulse signal for the write access phase only.
16. An apparatus according to claim 13 , wherein said column-select pulse signal regulator generates the column-select pulse signal having a duration set to double said clock pulse signal when enabled by said write control signal.
17. An apparatus according to claim 16 , wherein said column-select pulse signal regulator generates the column-select pulse signal having a duration corresponding to a duration of said clock pulse signal when enabled by said read control signal.
18. An apparatus comprising at least a memory cell array including a plurality of memory cells structured in a matrix of bit lines and word lines:
a local I/O line coupled to said bit lines;
a plurality of sense amplifiers provided for the bit lines, respectively;
a plurality of column-select lines provided for the sense amplifiers, respectively, a selected one of the column-select lines receiving a column-select pulse signal enabling a transfer of write data from the local I/O line to the respective sense amplifier;
a timing regulator configured to receive or generate at least a clock pulse signal for regulating a timing access to the apparatus; and
a column-select pulse signal regulator configured to regulate a duration of the column-select pulse signal during a write access phase to a selected one of the memory cells setting a duration longer than said clock pulse signal, wherein the write data to be written of a previous write access phase is enabled to be driven to the sense amplifiers when the subsequent column-select pulse signal is already rising.
19. An apparatus according to claim 12 , wherein the time duration of said column-select pulse signal corresponds to a column-to-column delay tCCD for the write access phase only.
20. An apparatus according to claim 12 , wherein a column-select block is provided coupled to the sense amplifiers for generating said column-select pulse signal enslaved to the receipt of a read or write control signal.
21. An apparatus according to claim 12 , wherein said memory cells are a matrix of Double Data Rate x Synchronous Dynamic Random Access Memory (DDRx SDRAM) or a Graphic Double Data Rate x Synchronous Dynamic Random Access Memory (GDDRx SDRAM) or a High Bandwidth Memory (HBM), x is an integer greater than or equal to 1.
22. An apparatus comprising:
a plurality of memory cells;
a plurality of bit lines coupled to the plurality of memory cells, respectively;
a local input and output line;
a plurality of column switches each coupled between a corresponding one of the plurality of bit lines and the local input and output line, selected one or ones of the column switches being activated during a first period responsive to a write command access and during a second period responsive to a read command access, the first period being longer than the second period; and
a column-select pulse signal regulator configured to generate column-select pulse signals during a write access phase that partially overlap.
23. An apparatus according to claim 22 , further comprising a column-select pulse signal regulator configured to generate a column-select pulse signal having a duration extended with respect to a duration of a clock pulse signal.
24. An apparatus according to claim 23 , wherein said column-select pulse signal regulator generates a column-select pulse signal having a duration set to double said clock pulse signal when enabled by a write control input signal.
25. An apparatus according to claim 23 , wherein the duration of said column-select pulse signal corresponds to a column-to-column delay tCCD for a write access phase only.
26. An apparatus according to claim 22 , wherein said plurality of memory cells are a matrix of Double Data Rate x Synchronous Dynamic Random Access Memories (DDRx SDRAMs) or a Graphic Double Data Rate x Synchronous Dynamic Random Access Memories (GDDRx SDRAMs) or a High Bandwidth Memory (HBM), x is an integer greater than or equal to 1.