Charge pump supply optimization and noise reduction method for logic systems
Memory devices may have internal circuitry that employs voltages higher and/or lower than voltages provided by an external power source. Charge pumps are DC/DC converters that may be used to generate the higher voltages internally. The number of available charge pumps in a memory device may be conservatively dimensioned to be high, in some systems to protect yields. Some of the available charge pumps may be disabled during manufacturing or testing to reduce the number of active charge pumps. The testing process may employ dedicated logic in the memory device and the disabling may employ fuse circuitry.
1. A memory device comprising:
a plurality of memory cells;
first circuitry configured to perform a first memory operation of a plurality of memory operations;
a charge pump configured to receive a first voltage and to generate a second voltage higher than the first voltage, wherein the second voltage is configured to power the first circuitry during performance of the first memory operation;
fuse circuitry comprising a first switch configured to enable the charge pump or disable the charge pump; and
logic circuitry configured to receive a testmode signal, wherein the testmode signal is associated with:
generating an enable signal associated with the charge pump based on the testmode signal; and
disabling the charge pump of the memory device to test the first memory operation to obtain a memory device metric, wherein the memory device metric includes a timing specification.
2. The memory device of claim 1 , wherein the first switch comprises a fuse configured to disable the charge pump when the fuse is broken.
3. The memory device of claim 1 , wherein the first switch comprises an anti-fuse configured to enable the charge pump when an anti-fuse circuit path is closed.
4. The memory device of claim 1 , wherein the plurality of memory operations comprises a read operation, a write operation, or a refresh operation.
5. The memory device of claim 1 , wherein the first voltage comprises an activating power supply voltage (V PP ) or a power supply voltage (V DD ).
6. The memory device of claim 1 , comprising a second charge pump configured to receive the first voltage and to generate the second voltage, and wherein the fuse circuitry comprises a second switch configured to enable the second charge pump or disable the second charge pump.
7. The memory device of claim 1 , comprising logic circuitry configured to receive a fuse signal from the fuse circuitry and a testmode circuitry from testing hardware coupled to the memory device, and configured to receive a testmode signal associated with the charge pump to enable the charge pump or disable the charge pump based on the testmode signal.
8. A method for manufacturing a memory device, comprising:
disabling a first analog power supply of the memory device using a first testmode signal;
testing a first memory operation in the memory device with the disabled first analog power supply to obtain a memory device metric, wherein the memory device metric includes a timing specification;
disabling the first analog power supply using a first fuse associated with the first analog power supply based on the memory device metric.
9. The method of claim 8 , comprising:
disabling a second analog power supply using a second testmode signal;
testing a first memory operation in the memory device with the disabled second analog power supply to obtain the memory device metric; and
disabling the second analog power supply using a second fuse associated with the second analog power supply based on the memory device metric.
10. The method of claim 8 , wherein the first analog power supply comprises a charge pump or a charge pump core.
11. The method of claim 8 , wherein the first memory operation comprises a refresh operation.