Method for controlling a particle beam device and particle beam device for carrying out the method

1. A method for controlling a particle beam device for imaging, analyzing and/or processing an object, comprising:

identifying at least one control parameter of a unit of the particle beam device using an eye tracker by tracking at least one eye of a user of the particle beam device;

changing the at least one control parameter of the unit of the particle beam device;

providing a representation using signals of the unit of the particle beam device, the unit of the particle beam device being a detector of the particle beam device; and

identifying the representation using the eye tracker, thereby identifying the at least one control parameter.

2. A method for controlling a particle beam device for imaging, analyzing and/or processing an object, comprising:

identifying at least one control parameter of a unit of the particle beam device using an eye tracker by tracking at least one eye of a user of the particle beam device;

changing the at least one control parameter of the unit of the particle beam device;

providing a representation as an image generated by the unit of the particle beam device, the unit of the particle beam device being a detector of the particle beam device; and

identifying the representation using the eye tracker, thereby identifying the at least one control parameter.

3. A method for controlling a particle beam device for imaging, analyzing and/or processing an object, comprising:

identifying at least one control parameter of a unit of the particle beam device using an eye tracker by tracking at least one eye of a user of the particle beam device;

changing the at least one control parameter of the unit of the particle beam device;

providing a representation as an image of the unit of the particle beam device; and

identifying the representation using the eye tracker, thereby identifying the at least one control parameter.

4. A method for controlling a particle beam device for imaging, analyzing and/or processing an object, comprising:

identifying at least one control parameter of a unit of the particle beam device using an eye tracker by tracking at least one eye of a user of the particle beam device;

changing the at least one control parameter of the unit of the particle beam device;

providing a representation as an image of the object arranged at the unit of the particle beam device; and

identifying the representation using the eye tracker, thereby identifying the at least one control parameter.

5. The method according to any of claims 1 - 4 , wherein the method comprises one of the following steps:

using an ion beam device as the particle beam device; and

using an electron beam device as the particle beam device.

6. A method for controlling a particle beam device for imaging, analyzing and/or processing an object, comprising:

tracking at least one eye of a user of the particle beam device using an eye tracker;

identifying at least one of: (i) a first unit of the particle beam device to which the at least one eye of the user is directed and (ii) a representation to which the at least one eye of the user is directed, wherein the representation is associated with a second unit of the particle beam device;

selecting the first unit of the particle beam device if the first unit of the particle beam device has been identified or selecting the second unit of the particle beam device if the representation has been identified; and

activating the first unit of the particle beam device to a first change mode if the first unit of the particle beam device has been selected and changing at least one first control parameter of the first unit of the particle beam device, or

activating the second unit of the particle beam device to a second change mode if the second unit of the particle beam device has been selected and changing at least one second control parameter of the second unit of the particle beam device.

7. The method according to claim 6 , further comprising:

providing the representation as data using signals of the second unit of the particle beam device, wherein the second unit of the particle beam device is a detector of the particle beam device.

8. The method according to claim 6 , further comprising:

providing the representation as an image generated by the second unit of the particle beam device, wherein the second unit of the particle beam device is a detector of the particle beam device.

9. The method according to claim 6 , further comprising:

providing the representation as an image of the second unit of the particle beam device.

10. The method according to claim 6 , further comprising:

providing the representation as an image of the object arranged at the second unit of the particle beam device.

11. The method according to claim 6 , wherein the method comprises one of the following steps:

(i) using an ion beam device as the particle beam device; and

(ii) using an electron beam device as the particle beam device.

12. A computer program product comprising a program code which is loaded into a processor and which, when being executed, controls a particle beam device in such a way that a method is carried out, wherein the method comprises:

tracking at least one eye of a user of the particle beam device using an eye tracker;

identifying at least one of: (i) a first unit of the particle beam device to which the at least one eye of the user is directed and (ii) a representation to which the at least one eye of the user is directed, wherein the representation is associated with a second unit of the particle beam device;

selecting the first unit of the particle beam device if the first unit of the particle beam device has been identified or selecting the second unit of the particle beam device if the representation has been identified; and

activating the first unit of the particle beam device to a first change mode if the first unit of the particle beam device has been selected and changing at least one first control parameter of the first unit of the particle beam device, or activating the second unit of the particle beam device to a second change mode if the second unit of the particle beam device has been selected and changing at least one second control parameter of the second unit of the particle beam device.

13. A particle beam device for imaging, analyzing and/or processing an object, comprising:

(i) at least one particle beam generator for generating a primary particle beam having charged particles;

(ii) at least one objective lens for focusing the primary particle beam onto the object;

(iii) at least one detector for detecting interaction particles and/or interaction radiation, the interaction particles and the interaction radiation being generated when the primary particle beam impinges on the object; and

(iv) a processor into which a computer program product is loaded, which program, when being executed, controls a particle beam device in such a way that a method is carried out, wherein the method comprises:

tracking at least one eye of a user of the particle beam device using an eye tracker,

identifying at least one of: (i) a first unit of the particle beam device to which the at least one eye of the user is directed and (ii) a representation to which the at least one eye of the user is directed, wherein the representation is associated with a second unit of the particle beam device,

selecting the first unit of the particle beam device if the first unit of the particle beam device has been identified or selecting the second unit of the particle beam device if the representation has been identified, and

activating the first unit of the particle beam device to a first change mode if the first unit of the particle beam device has been selected and changing at least one first control parameter of the first unit of the particle beam device, or activating the second unit of the particle beam device to a second change mode if the second unit of the particle beam device has been selected and changing at least one second control parameter of the second unit of the particle beam device.

14. The particle beam device according to claim 13 , wherein the particle beam generator is a first particle beam generator for generating a first primary particle beam having first charged particles,

wherein the objective lens is a first objective lens for focusing the first primary particle beam onto the object, and

wherein the particle beam device further comprises: a second particle beam generator for generating a second primary particle beam having second charged particles and a second objective lens for focusing the second primary particle beam onto the object.

15. The particle beam device according to claim 13 , wherein the particle beam device is at least one of the following: an electron beam device and an ion beam device.