Embedded image sensor semiconductor packages and related methods
An embedded image sensor package including a transparent cover having a first side and an opposing second side. A first layer couples over the second side of the transparent cover and has an opening. An electrically conductive layer couples in or over the first layer and electrically couples with one or more electrical contacts exposed on an outer surface of the package. An image sensor chip having a first side with an image sensor and an opposing second side electrically couples with the electrically conductive layer at the first side of the image sensor chip. The image sensor chip couples over the first layer so the first side of the image sensor chip faces the second side of the transparent cover through the opening. The image sensor chip, first layer, and transparent cover at least partially define a cavity hermetically sealed using an underfill material. The package includes no wirebonds.
1. A method of forming an embedded image sensor package, comprising:
coupling a first layer over a transparent cover;
forming an opening in the first layer;
coupling an electrically conductive layer one of in or over the first layer;
coupling an image sensor chip over the electrically conductive layer so that the image sensor chip faces the transparent cover through the opening;
forming a hermetically sealed cavity between the image sensor and the transparent cover using an underfill material; and
electrically coupling one or more electrical contacts with the electrically conductive layer, forming an embedded image sensor package;
wherein the entirety of the first layer and the entirety of the electrically conductive layer are each substantially parallel with the image sensor chip.
2. The method of claim 1 , wherein the first layer comprises a laminate film.
3. The method of claim 1 , wherein coupling the image sensor chip over the electrically conductive layer comprises mechanically and electrically coupling the image sensor chip with the electrically conductive layer using one or more bumps.
4. The method of claim 1 , wherein no liquid encapsulant except the underfill material is used in the formation of the package.
5. The method of claim 1 , wherein the package does not include a polymer dam used to stop a liquid flow.
6. The method of claim 1 , wherein no die bond glue is used to couple the image sensor chip within the package.
7. The method of claim 1 , further comprising coupling a thermal dissipation metal with the image sensor chip and exposing the thermal dissipation metal on an outer surface of the package through one or more layers of the package.
8. The method of claim 1 , further comprising coupling an embedded device within one or more layers of the package and electrically coupling the embedded device with the image sensor chip, the embedded device comprising one of a passive component or a processor.
9. The method of claim 1 , further comprising forming a ball grid array (BGA) with the one or more electrical contacts.
10. A method of forming an embedded image sensor package, comprising:
coupling a first layer over a transparent cover, the first layer comprising a laminate film;
forming an opening in the first layer and the laminate film;
coupling an electrically conductive layer one of in or over the first layer;
using one or more bumps, mechanically and electrically coupling an image sensor chip over the electrically conductive layer so that the image sensor chip faces the transparent cover through the opening;
forming a hermetically sealed cavity between the image sensor and the transparent cover using an underfill material; and
electrically coupling one or more electrical contacts with the electrically conductive layer, forming an embedded image sensor package;
wherein the first layer extends from an outer edge of the package to an edge of the cavity; and
wherein the underfill material partially encapsulates the one or more bumps.
11. The method of claim 10 , wherein no liquid encapsulant except the underfill material is used in the formation of the package, wherein the package does not include a polymer dam used to stop a liquid flow, and wherein no die bond glue is used to couple the image sensor chip within the package.
12. The method of claim 10 , further comprising coupling a thermal dissipation metal with the image sensor chip and exposing the thermal dissipation metal on an outer surface of the package through one or more layers of the package.
13. The method of claim 10 , further comprising coupling an embedded device within one or more layers of the package and electrically coupling the embedded device with the image sensor chip, the embedded device comprising one of a passive component or a processor.