System and method for testing a data storage device
A system for testing a data storage device includes the data storage device, an electronic device and a computer device. The electronic device includes a host device coupled to the data storage device and communicating with the data storage device via an interface logic. The computer device is coupled to the electronic device and is configured to issue a plurality of commands to test the data storage device in a test procedure. When the electronic device has been successfully started up, the computer device issues a first command to the electronic device to trigger the electronic device to enter a hibernate mode. After waiting for a first predetermined period of time, the computer device issues a second command to the electronic device, so as to wake up the electronic device.
1. A system for testing a data storage device, comprising:
the data storage device;
an electronic device, comprising a host device coupled to the data storage device and configured to communicate with the data storage device via an interface logic; and
a computer device, coupled to the electronic device and configured to issue a plurality of commands to test operation stability of the data storage device when being coupled to the electronic device in a test procedure,
wherein when the electronic device has been successfully started up, the computer device issues a first command to the electronic device to trigger the electronic device to enter a hibernate mode, and after waiting for a first predetermined period of time, the computer device issues a second command to the electronic device, so as to wake up the electronic device.
2. The system as claimed in claim 1 , wherein when the electronic device is woken up in response to the second command, the computer device is further configured to issue a third command to the electronic device to request the host device to read a kernel log file from the data storage device and transmit the kernel log file to the computer device.
3. The system as claimed in claim 1 , wherein when the electronic device is woken up in response to the second command, the computer device is further configured to issue a fourth command to the electronic device to trigger the electronic device to reboot.
4. The system as claimed in claim 3 , wherein the computer device is further configured to count a number of times the electronic device was rebooted during the test procedure.
5. The system as claimed in claim 4 , wherein when the number of times the electronic device was rebooted during the test procedure exceeds a predetermined value, the computer device determines that the data storage device has passed the test.
6. A method for testing a data storage device, wherein the data storage device is coupled to an electronic device, the electronic device is coupled to a computer device, the computer device is configured to issue a plurality of commands to test operation stability of the data storage device when being coupled to the electronic device in a test procedure, the method comprising:
when the electronic device has been successfully started up, issuing a first command to the electronic device, by the computer device, to trigger the electronic device to enter a hibernate mode; and
after waiting for a first predetermined period of time, issuing a second command to the electronic device, by the computer device, to wake up the electronic device.
7. The method as claimed in claim 6 , further comprising:
when the electronic device is woken up in response to the second command, issuing a third command to the electronic device, by the computer device, to request that the electronic device read a kernel log file from the data storage device and transmit the kernel log file to the computer device.
8. The method as claimed in claim 6 , further comprising:
when the electronic device is woken up in response to the second command, issuing a fourth command to the electronic device, by the computer device, to trigger the electronic device to reboot.
9. The method as claimed in claim 6 , further comprising:
counting a number of times the electronic device was rebooted during the test procedure.
10. The method as claimed in claim 9 , further comprising:
determining that the data storage device has passed the test when the number of times the electronic device was rebooted during the test procedure exceeds a predetermined value.