IP Library Granted Patent US 10,410,850
Granted Patent B2
US 10,410,850 · App. 16/167,144 · Granted Sep 10, 2019

Systems, methods, and structures for compound-specific coding mass spectrometry

Inventors: Michael E. Gehm (Durham, NC); Jeffrey T. Glass (Durham, NC); Jason J. Amsden (Durham, NC); Charles B. Parker (Durham, NC)
Assignee: Duke University
H01J49/067H01J49/025H01J49/20
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Quick Facts
Patent No.
US 10,410,850
App. No.
16/167,144
Granted
Sep 10, 2019
Kind
B2
Abstract

Aspects of the present disclosure describe systems, methods, and structures for compound-specific coding mass spectrometry wherein compound-specific masks/codes are positioned between an ion source and detector of a mass spectrometer.

Claims (29)

1. A chemical-compound-specific coded mass spectrometer comprising:

an ion source that produces ion fragments from the chemical compound;

a mass analyzer that separates the produced ion fragments according to their mass; and

a detector structure that produces signals in response to detecting the separated ion fragments;

CHARACTERIZED BY:

a compound-specific mask interposed between the ion source and the detector.

2. The chemical-compound-specific mass spectrometer of claim 1 FURTHER CHARACTERIZED BY:

the produced ion fragments are substantially all directed to a single detector element of the detector structure through the effect of the compound-specific mask.

3. The chemical-compound-specific mass spectrometer of claim 2 FURTHER CHARACTERIZED BY:

the single detector element produces a signal proportional to the number of fragments exhibiting all mass-to-charge ratios characteristic of the chemical compound.

4. The chemical-compound-specific mass spectrometer of claim 3 FURTHER CHARACTERIZED BY:

the compound-specific mask includes a plurality of slit/apertures, each individual slit/aperture configured to direct a particular generated ion fragment to the single detector.

5. The chemical-compound-specific mass spectrometer of claim 3 wherein the detector element is positioned at a detector plane and the compound-specific mask is positioned at an aperture plane, said mass spectrometer FURTHER CHARACTERIZED BY:

the compound-specific mask includes a plurality of slit/apertures, each individual slit/aperture configured to generate a shifted copy of the compounds spectrum onto the detector plane, wherein the shifting results in a particular, generated ion fragment for each shifted copy being directed to the single detector.

6. The chemical-compound-specific mass spectrometer of claim 1 FURTHER CHARACTERIZED BY:

the compound-specific mask is a two-dimensional coded mask having n rows of apertures; and

the detector structure is a 1×n array of individual detectors, each of the individual detectors corresponding to a respective one of the mask rows.

7. The chemical-compound-specific mass spectrometer of claim 6 FURTHER CHARACTERIZED BY:

the two-dimensional compound specific mask includes plurality of slit/apertures arranged in a first row, each individual slit/aperture in the first row configured to direct a particular generated ion fragment to the individual detector corresponding to that first row; and

the two-dimensional compound specific mask includes a plurality of slit/apertures arranged in a second row, wherein the arrangement of slit/apertures in the second row is the complement to the arrangement of slit/apertures in the first row.

8. The chemical-compound-specific mass spectrometer of claim 7 FURTHER CHARACTERIZED BY:

the two-dimensional compound specific mask includes plurality of slit/apertures arranged in a third row, each individual slit/aperture in the third row configured to direct a particular generated ion fragment to the individual detector corresponding to that third row wherein the particular generated ion fragment directed by the third row slit/aperture is an ion fragment generated from a cofounder of the chemical compound; and

the two-dimensional compound specific mask includes a plurality of slit/apertures arranged in a fourth row, wherein the arrangement of slit/apertures in the fourth row is the complement to the arrangement of slit/apertures in the third row.

9. The chemical-compound-specific mass spectrometer of claim 8 FURTHER CHARACTERIZED BY:

the individual detector element corresponding to the first row produces a first signal (IB) and the individual detector element corresponding to the second row produces a second signal (OOB) and the chemical compound is discriminated by comparing IB+OOB and OOB/IB.

10. A chemical-compound-specific mass spectroscopic method comprising:

generating compound-identifying ion fragments from the chemical compound;

separating the compound-identifying ion fragments according to their mass; and

directing the compound-identifying ion fragments to a single detector element of a multi-element detector through the effect of a compound-specific mask positioned between an ion source that generates the compound-identifying ion fragments and the detector.

Assignments (2)
CONFIRMATORY LICENSE Recorded Sep 27, 2021
From: DUKE UNIVERSITY
To: U.S. DEPARTMENT OF ENERGY
Reel/Frame 057605/0842 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 22, 2018
From: GEHM, MICHAEL; GLASS, JEFFREY; AMSDEN, JASON, DR.; PARKER, CHARLES, DR.
To: DUKE UNIVERSITY
Reel/Frame 047265/0292 →
Continuity (2)
Provisional Application 62574851 · Oct 20, 2017
Related Publication 20190122877A1 · Apr 25, 2019