Electronics tester with current amplification
The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.
1. A tester apparatus, comprising:
an electrical tester for connection through contacts to a plurality of terminals of at least one substrate carrying at least one integrated circuit and having the terminals connected to the integrated circuit so that current conducts between the electrical tester and the integrated circuit to test the integrated circuit, the electric tester including:
a power supply circuit connected to the contacts, wherein power is provided through the power supply circuit connected to the contacts, the power supply circuit having:
a current amplifier that amplifies current to separate channels, the current amplifier having a current amplification module and a voltage reference line connected to the current amplification module, wherein a voltage to one of the channels connected to the current amplification module is locked to a voltage on the voltage reference line;
a voltage master circuit adjustable to establish a plurality of master voltage levels; and
a voltage selector connected between the voltage master circuit and the current amplifier to select a voltage that is provided to the current amplifier.
2. The tester apparatus of claim 1 , further comprising:
a current configuration circuit that is configurable to switch current switching between a first configuration wherein separate current at different magnitudes is provided to separate channels, and a second configuration wherein currents to separate channels follow a common reference.
3. The tester apparatus of claim 2 , wherein the current configuration circuit includes a plurality of current amplifiers, each current amplifier having output current that follows a separate reference when the current configuration circuit is in the first configuration.
4. The tester apparatus of claim 1 , further comprising:
signal electronics that provide signals to the integrated circuit.
5. The tester apparatus of claim 1 , further comprising:
a supporting structure for holding the at least one substrate; and
a plurality of contacts matching the terminals for making contact to the terminals, the electrical tester being connected through the contacts to the terminals so that current conducts between the electrical tester and the integrated circuit to test the integrated circuit.
6. A method of testing at least one circuit held by at least one substrate, comprising:
locating contacts against terminals of the substrate connected to the integrated circuit;
locking a voltage to one of the channels connected to a current amplification module to a voltage on a voltage reference line;
establish a plurality of master voltage levels;
selecting a master voltage that is provided to the current amplifier;
amplifying current to separate channels; and
conducting the current between the electrical tester and the integrated circuit through the terminals and contacts to test the integrated circuit.
7. The method of claim 6 , further comprising:
switching with a current configuration circuit between a first configuration wherein separate current at different magnitudes is provided to separate channels, and a second configuration wherein currents to separate channels follow a common reference.
8. The method of claim 7 , wherein the current configuration circuit includes a plurality of current amplifiers, each current amplifier having output current that follows a separate reference when the current configuration circuit is in the first configuration.
9. The method of claim 6 , further comprising:
providing signals to the integrated circuit.