3-dimensional x-ray imager
The invention utilizes one exposure without moving parts to provide multiple x-ray views of an object. It relies on a 3D detector, which can be a stack of film plates, and a specified focusing x-ray optic. The x-ray optic, discussed below, allows collection of x-rays from a localized volume, just like an ordinary optical lens, and the stacked film plate, or other 3D detector design, allows collection of the multiple focal plane information from one line of sight.
1. A method, comprising:
directing a single exposure of penetrating radiation onto a first object and then onto a second object to produce a first shadow of said first object and a second shadow of said second object;
collecting said first shadow and said second shadow with an optic, wherein said optic is configured to redirect said first shadow and said second shadow;
detecting said first shadow with a first detector, wherein said first detector produces a first signal corresponding to said first shadow;
detecting said second shadow with a second detector, wherein said second detector produces a second signal corresponding to said second shadow; and
using said first signal and said second signal to determine the relative locations of said first object and said second object.
2. The method of claim 1 , wherein said penetrating radiation comprises x-rays.
3. The method of claim 1 , wherein said penetrating radiation comprises low-energy neutrons.
4. The method of claim 1 , wherein said optic is configured to focus said first shadow at a first image plane and to focus said second shadow at a second image plane.
5. The method of claim 4 , wherein said first shadow will not be in focus at said second image plane and wherein said second shadow will not be in focus at said first image plane.
6. The method of claim 1 , wherein said optic comprises an x-ray optic.
7. The method of claim 1 , wherein said optic comprises a depth-of-field that is small compared to the size of said first object and said second object.
8. The method of claim 1 , wherein said optic comprises a depth-of-field that is less than 1/10 th of the size of said first object and said second object.
9. The method of claim 1 , wherein said optic is a Wolter optic.
10. The method of claim 1 , wherein said optic is selected from the group consisting of a bent crystal optic and a Fresnel zone plate.
11. The method of claim 1 , wherein at least one of said first detector and said second detector comprises x-ray film.
12. The method of claim 1 , wherein at least one of said first detector and said second detector comprises an image plate.
13. An apparatus, comprising:
a source of penetrating radiation configured for directing a single exposure of said penetrating radiation onto a first object and then onto a second object to produce a first shadow of said first object and a second shadow of said second object;
an optic positioned for collecting said first shadow and said second shadow, wherein said optic is configured to redirect said first shadow and said second shadow, wherein said optic comprises a depth-of-field that is small compared to the size of said first object and said second object;
a first detector configured for detecting said first shadow; and
a second detector configured for detecting said second shadow.
14. The apparatus of claim 13 , wherein said penetrating radiation comprises x-rays.
15. The apparatus of claim 13 , wherein said penetrating radiation comprises low-energy neutrons.
16. The apparatus of claim 13 , wherein said optic is configured to focus said first shadow at a first image plane and to focus said second shadow at a second image plane.
17. The apparatus of claim 16 , wherein said first shadow will not be in focus at said second image plane and wherein said second shadow will not be in focus at said first image plane.
18. The apparatus of claim 13 , wherein said first detector is configured to produce a first signal corresponding to said first shadow and said second detector is configured to produce a second signal corresponding to said second shadow.
19. The apparatus of claim 13 , wherein said optic comprises an x-ray optic.
20. The apparatus of claim 13 , wherein said optic comprises a depth-of-field that is less than 1/10 th of the size of said first object and said second object.
21. The apparatus of claim 13 , wherein said optic is a Wolter optic.
22. The apparatus of claim 13 , wherein said optic is selected from the group consisting of a bent crystal optic and a Fresnel zone plate.
23. The apparatus of claim 13 , wherein at least one of said first detector and said second detector comprises x-ray film.
24. The apparatus of claim 13 , wherein at least one of said first detector and said second detector comprises an image plate.
25. A method, comprising:
simultaneously collecting, with an optic, first penetrating radiation from a first source and second penetrating radiation from a second source, wherein said optic is configured to redirect said first penetrating radiation and said second penetrating radiation to produce first redirected rays and second redirected ray, respectively;
detecting said first redirected rays with a first detector, wherein said first detector produces a first signal corresponding to said first shadow;
detecting said second redirected rays with a second detector, wherein said second detector produces a second signal corresponding to said second shadow; and
using said first signal and said second signal to determine the relative locations of a first object and a second object.
26. A method, comprising:
simultaneously collecting, with an optic, first penetrating radiation from a first location and second penetrating radiation from a second location, wherein said first location and said second location are different distances from said optic, wherein said optic is configured to redirect said first penetrating radiation and said second penetrating radiation to produce first redirected rays and second redirected ray, respectively;
detecting said first redirected rays with a first detector, wherein said first detector produces a first signal corresponding to said first shadow;
detecting said second redirected rays with a second detector, wherein said second detector produces a second signal corresponding to said second shadow; and
using said first signal and said second signal to determine the relative locations of a first object and a second object.