IP Library Granted Patent US 11,182,100
Granted Patent B2
US 11,182,100 · App. 16/183,654 · Granted Nov 23, 2021

SSD temperature control technique

Inventor: Paul J. Gwin (Orangevale, CA)
Assignee: Intel Corporation
G06F3/0653G06F3/061G06F3/0604G06F3/0658G06F3/0659G06F3/0679
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Quick Facts
Patent No.
US 11,182,100
App. No.
16/183,654
Granted
Nov 23, 2021
Kind
B2
Abstract

An apparatus is described. The apparatus includes a solid state drive (SSD) controller that includes logic circuitry to perform an event based hottest non volatile memory die identification process in which one or more different hottest non volatile memory die within the SSD are able to be identified over an operational time period of the SSD in response to different respective events that arise during the operational time period.

Claims (51)

1. An apparatus, comprising:

a solid state drive (SSD) controller comprising logic circuitry to perform an event based hottest non-volatile memory die identification process in which one or more different hottest non-volatile memory die within an SSD that is controlled by the SSD controller are able to be identified over an operational time period of the SSD in response to different respective events that arise during the operational time period and not based on periodic measurements of the SSD's non-volatile memory die during the operational time period, and wherein, at least one event of the event based hottest non-volatile memory die identification process includes a configuration event that occurs externally from the SSD, wherein, detection of the configuration event that occurs externally from the SSD is not based on the SSD controller's monitoring of traffic flows of the SSD's non-volatile memory die.

2. The apparatus of claim 1 wherein the configuration event that occurs externally from the SSD includes any of:

a host configuration event;

a host storage configuration event;

a host I/O configuration event;

a host thermal configuration event;

a host power configuration event.

3. The apparatus of claim 1 wherein at least one other event of the event based hottest non-volatile memory die identification process includes an event that occurs internally within the SSD.

4. The apparatus of claim 3 wherein the other event that occurs internally within the SSD includes any of:

a power state change of the SSD;

a performance state change of the SSD;

a workload change of the SSD;

movement of data items of more frequently accessed PBAs from wear-leveling.

5. The apparatus of claim 1 further comprising a machine readable storage medium in which program code is stored, the program code, when executed, to cause the controller to perform at least a portion of the event based hottest non-volatile memory die identification process.

6. The apparatus of claim 1 wherein the SSD controller is to also perform at least one of the following:

generate artificial traffic to establish a thermal state within the SSD;

learn over time which events result in which non-volatile memory die being a hottest non-volatile memory die.

7. A computing system, comprising:

one or more processing cores;

a system memory;

a memory controller coupled between the one or more processing cores and the system memory;

an SSD, the SSD comprising an SSD controller, the SSD controller comprising logic circuitry to perform an event based hottest non-volatile memory die identification process in which one or more different hottest non-volatile memory die within the SSD are able to be identified over an operational time period of the SSD in response to different respective events that arise during the operational time period and not based on periodic measurements of the SSD's non-volatile memory die during the operational time period, and wherein, at least one event of the event based hottest non-volatile memory die identification process includes a configuration event that occurs externally from the SSD, wherein, detection of the event that occurs externally from the SSD is not based on the SSD controller's monitoring of traffic flows of the SSD's non-volatile memory die.

8. The apparatus of claim 7 wherein the configuration event that occurs externally from the SSD includes any of:

a host configuration event;

a host storage configuration event;

a host I/O configuration event;

a host thermal configuration event;

a host power configuration event.

9. The apparatus of claim 7 wherein at least one other event of the event based hottest non-volatile memory die identification process includes an event that occurs internally within the SSD.

10. The apparatus of claim 9 wherein the other event that occurs internally within the SSD includes any of:

a power state change of the SSD;

a performance state change of the SSD;

a workload change of the SSD;

movement of data items of more frequently accessed PBAs from wear-leveling.

11. The apparatus of claim 7 further comprising a machine readable storage medium in which program code is stored, the program code, when executed, to cause the controller to perform at least a portion of the event based hottest non-volatile memory die identification process.

12. A machine readable storage medium containing program code, and not propagating signal energy, that when processed by a controller of a solid state drive (SSD), causes the controller to perform a method, comprising:

in response to a first event associated with the SSD's environment, identifying one or more hottest non-volatile memory die within the SSD, wherein recognition of the first event is not based on periodic measurements of the SSD's non-volatile memory die, and wherein, the first event is a configuration event that occurs externally from the SSD, and wherein, detection of the first event is not based on the SSD controller's monitoring of traffic flows of the SSD's non-volatile memory die;

throttling SSD workload in response to temperature readings of the one or more hottest non-volatile memory die;

in response to a second event associated with the SSD's environment, identifying one or more different hottest non-volatile memory die within the SSD, wherein recognition of the second event is not based on periodic measurements of the SSD's non-volatile memory die, and wherein, the second event is an event that occurs internally within the SSD; and,

throttling SSD workload in response to temperature readings of the one or more different hottest non-volatile memory die.

13. The machine readable storage medium of claim 12 wherein the first event is any of:

a host configuration event;

a host storage configuration event;

a host I/O configuration event;

a host thermal configuration event.

14. The machine readable storage medium of claim 13 wherein the second event is any of:

a power state change of the SSD;

a performance state change of the SSD;

a workload change of the SSD;

movement of data items of more frequently accessed PBAs from wear-leveling.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 10, 2023
From: INTEL CORPORATION
To: SK HYNIX NAND PRODUCT SOLUTIONS CORP.
Reel/Frame 062702/0048 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 3, 2018
From: GWIN, PAUL J.
To: INTEL CORPORATION
Reel/Frame 047659/0153 →
Continuity (1)
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