Apparatus and methods for discharging control gates after performing an access operation on a memory cell

1. An apparatus, comprising:

an array of memory cells; and

a controller configured to access the array of memory cells;

wherein the controller is further configured to:

perform an access operation on a memory cell of a string of series-connected memory cells of the array of memory cells;

after performing the access operation, discharge a control gate of a first field-effect transistor, wherein the first field-effect transistor is selectively connected to the string of series-connected memory cells;

after discharging the control gate of the first field-effect transistor, discharge a control gate of a second field-effect transistor connected in series between the first field-effect transistor and the string of series-connected memory cells; and

after discharging the control gate of the second field-effect transistor, discharge a control gate of the memory cell.

2. The apparatus of claim 1 , wherein the first field-effect transistor has a negative threshold voltage.

3. The apparatus of claim 2 , wherein the second field-effect transistor has a positive threshold voltage.

4. The apparatus of claim 3 , wherein the first field-effect transistor, the second field-effect transistor, and the memory cell each have a same structure.

5. The apparatus of claim 1 , wherein the apparatus comprises a third field-effect transistor between the first field-effect transistor and the second field-effect transistor.

6. The apparatus of claim 5 , wherein the controller is further configured to:

discharge a control gate of the third field-effect transistor concurrently with discharging the control gate of the first field-effect transistor.

7. The apparatus of claim 5 , wherein the controller is further configured to:

discharge a control gate of the third field-effect transistor after discharging the control gate of the first field-effect transistor and prior to discharging the control gate of the second field-effect transistor.

8. A method, comprising:

performing an access operation on a memory cell of a string of series-connected memory cells of an array of memory cells;

after performing the access operation, discharging a control gate of a first field-effect transistor;

after discharging the control gate of the first field-effect transistor, discharging a control gate of a second field-effect transistor connected in series between the first field-effect transistor and an end of the string series-connected memory cells; and

after discharging the control gate of the second field-effect transistor, discharging a control gate of the memory cell.

9. The method of claim 8 , wherein the memory cell is selectively connected between a data line and a source, and wherein discharging the control gate of the first field-effect transistor comprises discharging the control gate of the first field-effect transistor connected in series between the memory cell and the data line or between the memory cell and the source.

10. The method of claim 9 , further comprising discharging a control gate of a third field-effect transistor while discharging the control gate of the first field-effect transistor, wherein the third field-effect transistor is connected in series between the memory cell and the source when the first field-effect transistor is connected in series between the memory cell and the data line, and wherein the third field-effect transistor is connected in series between the memory cell and the data line when the first field-effect transistor is connected in series between the memory cell and the source.

11. The method of claim 8 , wherein discharging the control gate of the first field-effect transistor comprises discharging a control gate of a field-effect transistor having a negative threshold voltage.

12. The method of claim 8 , wherein discharging the control gate of the second field-effect transistor comprises discharging a control gate of a field-effect transistor having a positive threshold voltage.

13. The method of claim 8 , further comprising:

after discharging the control gate of the first field-effect transistor, and prior to discharging the control gate of the second field-effect transistor, discharging a control gate of a third field-effect transistor connected in series between the first field-effect transistor and the second field-effect transistor.

14. The method of claim 8 , wherein the memory cell is a particular memory cell of the string of series-connected memory cells, and further comprising concurrently discharging control gates of each remaining memory cell of the plurality string of series-connected memory cells.

15. The method of claim 8 , further comprising:

discharging the control gate of the second field-effect transistor a first period of time after discharging the control gate of the first field-effect transistor; and

discharging the control gate of the memory cell a second period of time after discharging the control gate of the second field-effect transistor;

wherein the first period of time is longer than the second period of time.

16. The method of claim 15 , wherein the first period of time is an order of magnitude longer than the second period of time.

17. The method of claim 8 , further comprising:

bringing the control gate of the first field-effect transistor, the control gate of the second field-effect transistor, and the control gate of the memory cell to a particular voltage level prior to discharging the control gate of the first field-effect transistor.

18. A method, comprising:

performing an access operation on a memory cell of an array of memory cells;

after performing the access operation, discharging a control gate of a first field-effect transistor;

while discharging the control gate of the first field-effect transistor, discharging a control gate of a third field-effect transistor, wherein the first field-effect transistor is connected in series between the memory cell and a data line selectively connected to the memory cell, and wherein the third field-effect transistor is connected is series between the memory cell and a source selectively connected to the memory cell;

after discharging the control gates of the first field-effect transistor and the third field-effect transistor, discharging a control gate of a second field-effect transistor, connected in series between the first field-effect transistor and the memory cell;

while discharging the control gate of the second field-effect transistor, discharging a control gate of a fourth field-effect transistor connected in series between the third field-effect transistor and the memory cell; and

after discharging the control gates of the second field-effect transistor and the third field-effect transistor, discharging a control gate of the memory cell.

19. A method, comprising:

performing an access operation on a plurality of series-connected memory cells of an array of memory cells, wherein the plurality of series-connected memory cells is selectively connected between a source and a data line;

after performing the access operation, discharging a control gate of a first field-effect transistor connected in series between the plurality of series-connected memory cells and the source and discharging a control gate of a second field-effect transistor connected in series between the plurality of series-connected memory cells and the data line;

after discharging the control gates of the first field-effect transistor and the second field-effect transistor, discharging a control gate of a third field-effect transistor connected in series between the first field-effect transistor and the plurality of series-connected memory cells and discharging a control gate of a fourth field-effect transistor connected in series between the second field-effect transistor and the plurality of series-connected memory cells; and

after discharging the control gates of the third field-effect transistor and the fourth field-effect transistor, discharging control gates of the plurality of series-connected memory cells.

20. The method of claim 19 , further comprising:

discharging a control gate of a fifth field-effect transistor connected in series between the third field-effect transistor and the plurality of series-connected memory cells while discharging the control gate of the third field-effect transistor; and

discharging a control gate of a sixth field-effect transistor connected in series between the fourth field-effect transistor and the plurality of series-connected memory cells while discharging the control gate of the fourth field-effect transistor.

21. The method of claim 19 , wherein discharging the control gate of the first field-effect transistor and discharging the control gate of the second field-effect transistor comprises discharging control gates of field-effect transistors having negative threshold voltages.

22. The method of claim 21 , wherein discharging the control gate of the first field-effect transistor and discharging the control gate of the second field-effect transistor further comprises discharging the control gate of the first field-effect transistor having a first negative threshold voltage and discharging the control gate of the second field-effect transistor having a second negative threshold voltage lower than the first negative threshold voltage.

23. The method of claim 19 , wherein discharging the control gate of the third field-effect transistor and discharging the control gate of the fourth field-effect transistor comprises discharging control gates of field-effect transistors having positive threshold voltages.

24. The method of claim 19 , further comprising:

after discharging the control gate of the first field-effect transistor, and prior to discharging the control gate of the third field-effect transistor, discharging a control gate of a fifth field-effect transistor connected in series between the first field-effect transistor and the fourth field-effect transistor.

25. The method of claim 19 , further comprising:

discharging the control gates of the third field-effect transistor and the fourth field-effect transistor a first period of time after discharging the control gates of the first field-effect transistor and the second field-effect transistor; and

discharging the control gates of the plurality of series-connected memory cells a second period of time after discharging the control gates of the third field-effect transistor and the fourth field-effect transistor;

wherein the second period of time is shorter than the first period of time.

26. The method of claim 25 , wherein the second period of time is an order of magnitude shorter than the first period of time.

27. The method of claim 19 , further comprising:

bringing the control gate of the first field-effect transistor, the control gate of the second field-effect transistor, the control gate of the third field-effect transistor, the control gate of the fourth field-effect transistor, and the control gates of the plurality of series-connected memory cells to a particular voltage level prior to discharging the control gates of the first field-effect transistor and the second field-effect transistor.

28. An apparatus, comprising:

an array of memory cells; and

a controller configured to access the array of memory cells;

wherein the controller is further configured to:

performing an access operation on a plurality of series-connected memory cells of the array of memory cells, wherein the plurality of series-connected memory cells is selectively connected between a source and a data line;

after performing the access operation, discharge a control gate of a first field-effect transistor connected in series between the plurality of series-connected memory cells and the source and discharge a control gate of a second field-effect transistor connected in series between the plurality of series-connected memory cells and the data line;

after discharging the control gates of the first field-effect transistor and the second field-effect transistor, discharge a control gate of a third field-effect transistor connected in series between the first field-effect transistor and the plurality of series-connected memory cells and discharge a control gate of a fourth field-effect transistor connected in series between the second field-effect transistor and the plurality of series-connected memory cells; and

after discharging the control gates of the third field-effect transistor and the fourth field-effect transistor, discharge control gates of the plurality of series-connected memory cells.

29. The apparatus of claim 28 , wherein the first field-effect transistor and the second field-effect transistor each have a negative threshold voltage.

30. The apparatus of claim 29 , wherein the first field-effect transistor has a higher threshold voltage than the second field-effect transistor.

31. The apparatus of claim 29 , wherein the third field-effect transistor and the fourth field-effect transistor each have a positive threshold voltage.

32. The apparatus of claim 31 , wherein the first field-effect transistor, the second field-effect transistor, and the memory cell each have a same structure.

33. The apparatus of claim 28 , further comprising:

a fifth field-effect transistor connected in series between the third field-effect transistor and the plurality of series-connected memory cells; and

a sixth field-effect transistor connected in series between the fourth field-effect transistor and the plurality of series-connected memory cells.

34. The apparatus of claim 33 , wherein the controller is further configured to:

discharge a control gate of the fifth field-effect transistor concurrently with discharging the control gate of the third field-effect transistor; and

discharge a control gate of the sixth field-effect transistor concurrently with discharging the control gate of the fourth field-effect transistor.

35. The apparatus of claim 33 , wherein the controller is further configured to:

discharge a control gate of the fifth field-effect transistor after discharging the control gate of the third field-effect transistor and prior to discharging the control gates of the plurality of memory cells; and

discharge a control gate of the sixth field-effect transistor after discharging the control gate of the fourth field-effect transistor and prior to discharging the control gates of the plurality of memory cells.