Geometric calibration of X-ray imaging systems
An apparatus for calibrating an X-ray imaging system including: an X-ray source including a plurality of focal spots; a detector panel; and at least one planar structure including markers placed at pre-determined positions on the at least one planar structure, the at least one planar structure configured to estimate a position of the plurality of focal spots with respect to the detector panel.
1. A method for calibrating an X-ray imaging system using a calibration phantom, the method comprising:
placing at least three markers at pre-determined positions on the calibration phantom including at least one planar structure with a plurality of printed circuit boards,
wherein each of the plurality of printed circuit boards includes a printed 2-D array of copper dots that is imaged on the detector;
placing the at least one planar structure between an X-ray source including a plurality of focal spots and a detector panel;
estimating a position of each focal spot of the plurality of focal spots with respect to the detector panel by determining a minimum distance from the detector panel to each focal spot.
2. The method of claim 1 , further comprising
moving the at least one planar structure as it is imaged by the X-ray imaging system.
3. The method of claim 2 , wherein moving the at least one planar structure includes
at least one of rotating and translating the at least one planar structure as it is imaged by the X-ray imaging system.
4. The method of claim 1 , further comprising
outputting X-ray images of the at least one planar structure having the markers.
5. The method of claim 4 , further comprising
estimating the position of the plurality of focal spots with respect to the detector panel using the X-ray images of the at least one planar structure.
6. The method of claim 4 , further comprising
estimating the positions of the markers imaged on the detector panel using the X-ray images.