IP Library Granted Patent US 11,087,816
Granted Patent B2
US 11,087,816 · App. 16/201,351 · Granted Aug 10, 2021

Charge extraction from ferroelectric memory cell

Inventor: Daniele Vimercati (El Dorado Hills, CA)
Assignee: Micron Technology, Inc.
G11C11/2273G11C11/221
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Quick Facts
Patent No.
US 11,087,816
App. No.
16/201,351
Granted
Aug 10, 2021
Kind
B2
Abstract

A ferroelectric capacitor of a memory cell may be in electronic communication with a sense capacitor through a digit line. The digit line may be virtually grounded during memory cell sensing, limiting or avoiding voltage drop across the digit line, and allowing all or substantially all of the stored charge of the ferroelectric capacitor to be extracted and transferred to the sense capacitor. Virtually grounding the digit line may be achieved by activating a switching component (e.g., a p-type field-effect transistor) that is electronic communication with the digit line. The charge of the ferroelectric capacitor may be transferred through the switching component. A sense amplifier may compare the voltage of the sense capacitor to a reference voltage in order to determine the stored logic state of the memory cell.

Claims (43)

1. A method of operating a memory cell, comprising:

activating a switching component that is in electronic communication with a digit line, the switching component being separate from the memory cell, wherein the memory cell comprises a ferroelectric capacitor and a selection component, and wherein the switching component is activated by a capacitor that is electrically positioned between the switching component and the digit line;

virtually grounding the digit line based at least in part on activating the switching component; and

activating a sense amplifier based at least in part on virtually grounding the digit line.

2. The method of claim 1 , further comprising:

selecting the memory cell that is in electronic communication with the digit line; and

charging a sense capacitor that is in electronic communication with the memory cell while the digit line is virtually grounded based at least in part on selecting the memory cell.

3. The method of claim 2 , further comprising:

comparing a voltage of the sense capacitor to a reference voltage based at least in part on activating the sense amplifier; and

determining a logic state of the memory cell based at least in part on comparing the voltage of the sense capacitor to the reference voltage.

4. The method of claim 2 , wherein charging the sense capacitor is based at least in part on a voltage applied to the ferroelectric capacitor of the memory cell.

5. The method of claim 2 , further comprising:

transferring a stored charge of the memory cell to the sense capacitor via the switching component based at least in part on virtually grounding the digit line; and

reading the memory cell based at least in part on transferring the stored charge.

6. The method of claim 2 , wherein activating the switching component comprises:

applying a voltage to the sense capacitor when the switching component is electrically positioned between the sense capacitor and the digit line.

7. The method of claim 1 , wherein activating the switching component comprises:

applying a voltage to the capacitor when the switching component and the capacitor are connected in parallel.

8. The method of claim 1 , wherein the sense amplifier is in electronic communication with the digit line.

9. An electronic memory apparatus, comprising:

a memory cell in electronic communication with a digit line, the memory cell comprising a ferroelectric capacitor and a selection component;

a sense capacitor in electronic communication with the digit line via a switching component, the switching component being separate from the memory cell and configured to virtually ground the digit line when activated by a capacitor that is electrically positioned between the switching component and the digit line; and

a sense amplifier connected with the sense capacitor, the sense capacitor being electrically positioned between the switching component and the sense amplifier.

10. The electronic memory apparatus of claim 9 , wherein the memory cell comprises the selection component in electronic communication with the digit line.

11. The electronic memory apparatus of claim 9 , wherein the switching component is configured to isolate the digit line from virtual ground when the switching component is deactivated.

12. The electronic memory apparatus of claim 9 , further comprising:

the capacitor connected in parallel with the switching component.

13. The electronic memory apparatus of claim 9 , wherein the switching component is electrically positioned between the sense capacitor and the selection component of the memory cell via the digit line.

14. An electronic memory apparatus, comprising:

a memory cell that comprises a selection component;

a sense amplifier in electronic communication with the selection component; and

a controller in electronic communication with the sense amplifier, wherein the controller is operable to:

apply a positive charging voltage or a negative charging voltage to a capacitor to virtually ground a digit line, the capacitor being electrically positioned between a switching component and the digit line, wherein the positive charging voltage or the negative charging voltage applied to the capacitor activates the switching component to virtually ground the digit line; and

activate the sense amplifier based at least in part on virtually grounding the digit line.

15. The electronic memory apparatus of claim 14 , wherein the controller is operable to:

operate the switching component based at least in part on applying the positive charging voltage or the negative charging voltage to the capacitor.

16. The electronic memory apparatus of claim 15 , wherein applying the positive charging voltage or the negative charging voltage to the capacitor occurs when the switching component and the capacitor are connected in parallel.

17. The electronic memory apparatus of claim 15 , wherein the switching component is connected with a sense capacitor and the selection component via the digit line.

18. The electronic memory apparatus of claim 14 , wherein the controller is operable to:

compare a voltage of a sense capacitor to a reference voltage based at least in part on activating the sense amplifier.

19. The electronic memory apparatus of claim 18 , wherein the controller is operable to:

determine a logic state of the memory cell based at least in part on comparing the voltage of the sense capacitor to the reference voltage.

20. The electronic memory apparatus of claim 14 , wherein the sense amplifier is in electronic communication with the selection component via the digit line.

Assignments (4)
RELEASE OF SECURITY INTEREST Recorded Nov 15, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 051026/0568 →
RELEASE OF SECURITY INTEREST Recorded Oct 14, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050718/0764 →
SUPPLEMENT NO. 11 TO PATENT SECURITY AGREEMENT Recorded Jan 16, 2019
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 048082/0860 →
SUPPLEMENT NO. 2 TO PATENT SECURITY AGREEMENT Recorded Jan 16, 2019
From: MICRON TECHNOLOGY, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 048082/0889 →