IP Library › Granted Patent US 10,790,344
Granted Patent B2
US 10,790,344 · App. 16/204,423 · Granted Sep 29, 2020

Display device and method for manufacturing the same

Inventor: Hongsuk Kim (Paju-si, KR)
Assignee: LG Display Co., Ltd.
H01L27/3262H01L27/1225H01L27/1288H01L27/3246H01L27/3258H01L27/3276H01L29/42384H01L29/66969H01L29/7869H01L29/78618H01L29/78633H01L29/78648H01L27/3213H01L51/5253H01L2227/323
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Quick Facts
Patent No.
US 10,790,344
App. No.
16/204,423
Granted
Sep 29, 2020
Kind
B2
Abstract

A display device and a method of manufacturing the same are provided. A display device includes: a substrate, a semiconductor layer on the substrate, a gate insulating pattern on the semiconductor layer, a plurality of gate electrodes on the gate insulating pattern, and a thin-film transistor spaced apart from the gate insulating pattern, the thin-film transistor including: a source electrode contacting the top surface of the semiconductor layer, a source-drain electrode adjacent to the source electrode, a first of the plurality of gate electrodes being between the source-drain electrode and the source electrode, and a drain electrode adjacent to the source-drain electrode, a second of the plurality of gate electrodes being between the drain electrode and the source-drain electrode.

Claims (37)

1. A display device, comprising:

a substrate;

a semiconductor layer on the substrate;

a gate insulating pattern on the semiconductor layer;

a plurality of gate electrodes on the gate insulating pattern; and

a thin-film transistor spaced apart from the gate insulating pattern, the thin-film transistor comprising:

a source electrode contacting the top surface of the semiconductor layer;

a source-drain electrode adjacent to the source electrode, a first of the plurality of gate electrodes being between the source-drain electrode and the source electrode; and

a drain electrode adjacent to the source-drain electrode, a second of the plurality of gate electrodes being between the drain electrode and the source-drain electrode.

2. The display device of claim 1 , wherein the gate insulating pattern is only under the plurality of gate electrodes.

3. The display device of claim 1 , wherein the semiconductor layer comprises:

a first region; and

a second region having a thickness less than that of the first region.

4. The display device of claim 3 , wherein the first region of the semiconductor layer overlaps the gate electrodes, the source electrode, the source-drain electrode, and the drain electrode.

5. The display device of claim 3 , wherein the second region of the semiconductor layer is between the source electrode and the gate electrodes, between the gate electrodes and the source-drain electrode, and between the gate electrodes and the drain electrode.

6. The display device of claim 3 , wherein the thickness of the second region is 30% to 70% of the thickness of the first region.

7. The display device of claim 3 , wherein the first region of the semiconductor layer overlapping the gate insulating pattern is larger in size than the gate insulating pattern.

8. The display device of claim 1 , wherein the thin-film transistor is in a gate-in-panel (GIP) driver of the display device.

9. The display device of claim 1 , wherein the gate electrodes, the source electrode, the source-drain electrode, and the drain electrode comprise a gate electrode material.

10. A method for manufacturing a display device, the method comprising:

providing a semiconductor layer on a substrate;

providing a gate insulating film on the semiconductor layer;

depositing a gate electrode material on the substrate where the gate insulating film is provided;

forming a plurality of gate electrodes using a single mask;

providing a source electrode in contact with a first side of the semiconductor layer;

providing a drain electrode in contact with a second side of the semiconductor layer; and

providing a source-drain electrode between each of the plurality of gate electrodes.

11. The method of claim 10 , further comprising:

forming contact holes exposing part of the semiconductor layer in the gate insulating film,

wherein the source electrode, the drain electrode, and the source-drain electrode contact the semiconductor layer via the contact holes.

12. The method of claim 10 , further comprising:

forming a gate insulating pattern overlapping the gate electrodes by etching the gate insulating film using the gate electrodes as a mask; and

removing the gate insulating film, except for the gate insulating pattern.

13. The method of claim 12 , wherein, in the forming of the gate insulating pattern:

the regions where the gate insulating film is etched are first regions; and

the regions where the contact holes are located are second regions.

14. The method of claim 13 , wherein the second regions have a thickness less than that of the first regions.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 29, 2018
From: KIM, HONGSUK
To: LG DISPLAY CO., LTD.
Reel/Frame 047626/0087 →
Priority Claims (1)
KR 10-2017-0168330 · Dec 8, 2017 · national
Continuity (1)
Related Publication 20190181207A1 · Jun 13, 2019
Cited By (1)
US 12,727,346