Reduction of ZQ calibration time

1. An apparatus, comprising:

a package having a pin configured to be connected to an external calibration device;

a first memory device disposed in the package, including:

a first pad for selective connection to the external calibration device via the pin,

an internal calibration device having a first impedance that is programmable, and

a second pad connected to the internal calibration device;

a second memory device disposed in the package, the second memory device including a third pad for selective connection to the second pad of the first memory device; and

a processing device operatively coupled to the first memory device and the second memory device, to:

program the first impedance based on the external calibration device, and

program a second impedance of a termination component in the second memory device based on the first impedance.

2. The apparatus of claim 1 , further comprising:

a third memory device disposed in the package, the third memory device including a fourth pad for selective connection to the external calibration device via the pin,

wherein the processing device is further configured to:

determine a first calibration code signal for programming a third impedance of a second termination component of the third memory device, and

determine a second calibration code signal for programming the second impedance, and

wherein the determination of the first calibration code signal and the determination of the second calibration code signal are done in parallel.

3. The apparatus of claim 1 , wherein the programming of the first impedance includes:

determining a first calibration code signal for a second termination component in the first memory device using the external calibration device,

determining a second calibration code signal for the second termination component using the first calibration code signal, and

using the second calibration code signal to program the first impedance.

4. The apparatus of claim 1 , wherein the second memory device is one of a plurality of second memory devices disposed in the package, and

wherein each respective third pad of the plurality of second memory devices is configured for selective connection to the second pad of the first memory device.

5. The apparatus of claim 1 , wherein the first memory device is one of a plurality of first memory devices disposed in the package and the second memory device is one of a plurality of second memory devices disposed in the package,

wherein, for each first memory device of the plurality of first memory devices, a portion of the plurality of second memory devices is configured to selectively connect to the second pad of the respective first memory device via the third pad of respective second memory device.

6. The apparatus of claim 5 , wherein each of the first memory devices includes a first arbiter circuit to ensure no more than one first memory device is connected to the external calibration device and each of the second memory devices includes a second arbiter circuit to ensure no more than one second memory device is connected to the internal calibration device of the respective first memory device.

7. The apparatus of claim 5 , wherein a number of first memory devices is in a range of 1 to 6 and, for each portion of second memory devices, a number of second memory devices is up to 4.

8. The apparatus of claim 5 , wherein a number of first memory devices is 4 and, a number of second memory devices in each portion of second memory devices is 3.

9. A method, comprising:

connecting a first memory device to an external calibration device that is connected to a pin of a package;

programming a first impedance of an internal calibration device of a first memory device based on the external calibration device, and

programming a second impedance of a termination component in a second memory device based on the first impedance.

10. The method of claim 9 , further comprising:

connecting a third memory device to the external calibration device via the pin;

determining a first calibration code signal for programming a third impedance of a termination component of the third memory device; and

determining a second calibration code signal for programming the second impedance,

wherein the determining of the first calibration code signal and the determining of the second calibration code signal are done in parallel.

11. The method of claim 9 , wherein the programming of the first impedance includes:

determining a first calibration code signal for a second termination component in the first memory device using the external calibration device,

determining a second calibration code signal for the second termination component using the first calibration code signal, and

using the second calibration code signal to program the first impedance.

12. The method of claim 9 , wherein the second memory device is one of a plurality of second memory devices that is selectively connected to the first memory device.

13. The method of claim 9 , wherein the first memory device is one of a plurality of first memory devices disposed in the package and the second memory device is one of a plurality of second memory devices disposed in the package,

wherein, for each first memory device of the plurality of first memory devices, a portion of the plurality of second memory devices is configured to selectively connect to the respective first memory device.

14. The method of claim 13 , further comprising:

controlling access of each of the first memory devices to the external calibration device to ensure no more than one first memory device is connected to the external calibration device; and

controlling access of each of the second memory devices to the respective first memory device to ensure no more than one second memory device is connected to the internal calibration device of the respective first memory device.

15. The method of claim 13 , wherein a number of first memory devices is in a range of 1 to 6 and, for each portion of second memory devices, a number of second memory devices is up to 4.

16. The method of claim 13 , wherein a number of first memory devices is 4 and, a number of second memory devices in each portion of second memory devices is 3.

17. A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to:

operatively connect a first memory device to an external calibration device that is connected to a pin of a package;

program a first impedance of an internal calibration device of a first memory device based on the external calibration device, and

program a second impedance of a termination component in a second memory device based on the first impedance.

18. The non-transitory computer-readable storage medium of claim 17 , further comprising instructions that, when executed by a processing device, cause the processing device to:

operatively connect a third memory device to the external calibration device via the pin;

determine a first calibration code signal for programming a third impedance of a termination component of the third memory device; and

determine a second calibration code signal for programming the second impedance,

wherein the determining of the first calibration code signal and the determining of the second calibration code signal are done in parallel.

19. The non-transitory computer-readable storage medium of claim 17 , wherein the programming of the first impedance includes:

determining a first calibration code signal for a second termination component in the first memory device using the external calibration device,

determining a second calibration code signal for the second termination component using the first calibration code signal, and

using the second calibration code signal to program the first impedance.

20. The non-transitory computer-readable storage medium of claim 17 , wherein the second memory device is one of a plurality of second memory devices that is selectively connected to the first memory device.

21. The non-transitory computer-readable storage medium of claim 17 , wherein the first memory device is one of a plurality of first memory devices disposed in the package and the second memory device is one of a plurality of second memory devices disposed in the package, and

wherein, for each first memory device of the plurality of first memory devices, a portion of the plurality of second memory devices is configured to selectively connect to the respective first memory device.

22. The non-transitory computer-readable storage medium of claim 17 , further comprising instructions that, when executed by a processing device, cause the processing device to:

control access of each of the first memory devices to the external calibration device to ensure no more than one first memory device is connected to the external calibration device; and

control access of each of the second memory devices to the respective first memory device to ensure no more than one second memory device is connected to the internal calibration device of the respective first memory device.

23. The non-transitory computer-readable storage medium of claim 22 , wherein a number of first memory devices is in a range of 1 to 6 and, for each portion of second memory devices, a number of second memory devices is up to 4.

24. The non-transitory computer-readable storage medium of claim 22 , wherein a number of first memory devices is 4 and, a number of second memory devices in each portion of second memory devices is 3.