Circuits and methods for providing a trimmable reference impedance
Briefly, embodiments of claimed subject matter relate to determination of a high-impedance state or a low-impedance state of a resistive memory element over a wide range of temperature, such as temperatures approaching −40.0° C. to temperatures approaching +125.0° C. Such determination may be brought about by implementing a circuit which, according to various embodiments described herein, emulates a reference impedance having a negative temperature coefficient.
1. A circuit, comprising:
first and second current sources to provide current to corresponding input signal nodes of first and second impedances;
an amplifier having input signal nodes coupled to the corresponding input signal nodes of the first and second impedances; and
a transistor circuit having a gate coupled to an output signal node of the amplifier, wherein the drain-to-source impedance of the transistor circuit emulates a negative temperature coefficient that is based on a difference between the first and the second impedances.
2. The circuit of claim 1 , wherein at least one of the first and second impedances comprises a positive temperature coefficient.
3. The circuit of claim 1 , wherein the first and second impedances are formed from first and second resistive memory elements.
4. The circuit of claim 3 , wherein a first resistive memory element of the first and second resistive memory elements is placed into a high-impedance state, and wherein a second resistive memory element of the first and second resistive memory elements is placed into a low-impedance state.
5. The circuit of claim 4 , wherein the first and second resistive memory elements include correlated electron random-access memory (CERAM), resistive random-access memory (ReRAM), phase change memory, magnetic random-access memory (MRAM), or any combination thereof.
6. The circuit of claim 4 , wherein the first and second resistive memory elements include magnetic random-access memory (MRAM).
7. The circuit of claim 4 , wherein the first and second resistive memory elements include phase change memory.
8. The circuit of claim 1 , wherein the amplifier comprises a cascoded configuration.
9. A method, comprising:
activating first and second current sources to provide first and second electric currents for coupling to corresponding input signal nodes of first and second impedances, wherein the input signal nodes of the first and the second impedances are coupled to corresponding first and second input signal nodes of an amplifier;
coupling a signal from the amplifier to a transistor circuit, wherein drain-to-source impedance of the transistor circuit emulates a negative temperature coefficient that is based on a difference between the first and the second impedances; and
determining the state of a resistive memory element based on the voltage of the signal coupled from the amplifier to the transistor circuit.
10. The method of claim 9 , wherein the first and the second impedances comprise positive temperature coefficients.
11. The method of claim 9 , wherein the first and second impedances comprise first and second resistive memory elements.
12. The method of claim 11 , further comprising placing a first resistive memory element of the first and second resistive memory elements into a high-impedance state, and placing a second resistive memory element of the first and second resistive memory elements into a low-impedance state.
13. The method of claim 9 , wherein determining the state of the resistive memory element comprises comparing a reference impedance with an impedance of the resistive memory element, wherein the reference impedance is dependent on the first and the second impedances.
14. The method of claim 9 , wherein the current generated by the first current source is substantially identical to the current generated by the second current source.
15. The method of claim 9 , wherein the current generated by the first current source is different than the current generated by the second current source.
16. A circuit to generate, comprising:
first and second current sources to provide substantially identical currents to corresponding input signal nodes of first and second impedances;
an amplifier having input signal nodes coupled to the corresponding input signal nodes of the first and second impedances; and
a transistor circuit having a first node coupled to an output signal node of the amplifier and having a second node coupled to an output signal node of an impedance of the first and second impedances, wherein the drain-to-source impedance of the transistor circuit exhibits a reference impedance that is based on a difference between the first and the second impedances.
17. The circuit of claim 16 , wherein the first and second impedances comprise positive temperature coefficients.
18. The circuit of claim 16 , wherein the difference between temperature coefficients of the first and second impedances comprises a negative value.
19. The circuit of claim 16 , further comprising a first sense amplifier configured to determine the state of a first resistive memory element coupled to the sense amplifier based on a signal at the output signal node of the amplifier.
20. The circuit of claim 19 , wherein the sense amplifier is configured to differentiate between a high-impedance state of the first resistive memory and a low-impedance state of the first resistive memory, wherein the ratio of the high-impedance state to the low-impedance state is between about 2.0:1.0 to about 400.0:1.0.
21. The circuit of claim 19 , further comprising a second resistive memory coupled to the sense amplifier, wherein the second resistive memory is placed into a low-impedance state.