Memory devices with controlled wordline ramp rates, and associated systems and methods
Memory devices with controlled wordline ramp rates and associated systems and methods are disclosed herein. In one embodiment, a memory device includes at least one voltage regulator and a plurality of wordlines. The memory device is configured, during a programming operation of the memory region, to ramp a selected wordline to a desired programming voltage while ramping one or more adjacent, unselected wordlines electrically coupled to the selected wordline to desired inhibit voltage(s) using the at least one voltage regulator. In some embodiments, the memory device ramps the selected wordline and the one or more adjacent, unselected wordlines such that the one or more adjacent, unselected wordlines reach the desired inhibit voltage(s) when the selected wordline reaches the desired programming voltage. In these and other embodiments, the memory device ramps the selected wordline to the desired programming voltage without floating the selected wordline.
1. A memory device comprising at least one voltage regulator, a plurality of bitlines, a plurality of wordlines, and memory cells at intersections of the bitlines and the wordlines,
wherein the memory device is configured, during a programming operation of the memory device, to:
ramp a selected wordline in the plurality of wordlines to a desired programming voltage; and
ramp one or more adjacent, unselected wordlines to one or more desired inhibit voltages using the at least one voltage regulator,
wherein the one or more adjacent, unselected wordlines are electrically coupled to the selected wordline and to the at least one voltage regulator, and
wherein the memory device ramps the selected wordline and the one or more adjacent, unselected wordlines such that the one or more adjacent, unselected wordlines reach the one or more desired inhibit voltages when the selected wordline reaches the desired programming voltage.
2. The memory device of claim 1 , wherein the memory device is configured to ramp the selected wordline to the desired programming voltage without floating the selected wordline.
3. The memory device of claim 2 , wherein the memory device is configured to continuously ramp the selected wordline to the desired programming voltage and to continuously ramp the one or more adjacent, unselected wordlines to the one or more desired inhibit voltages.
4. The memory device of claim 1 , wherein the at least one voltage regulator is electrically coupled to a voltage divider connected to a driver of the selected wordline.
5. The memory device of claim 4 , wherein memory device is configured to ramp the selected wordline and the one or more adjacent, unselected wordlines to the desired programming voltage and the one or more desired inhibit voltages, respectively, in steps by varying reference voltages provided to respective voltage regulators of the at least one voltage regulator.
6. The memory device of claim 1 , wherein:
the one or more adjacent, unselected wordlines include a first adjacent, unselected wordline and a second adjacent, unselected wordline;
the one or more desired inhibit voltages include a first desired inhibit voltage and a second desired inhibit voltage; and
the memory device is further configured, during the programming operation, to—
ramp the first adjacent, unselected wordline to the first desired inhibit voltage such that the first adjacent, unselected wordline reaches the first desired inhibit voltage when the selected wordline reaches the desired programming voltage, and
ramp the second adjacent, unselected wordline to the second desired inhibit voltage such that the second adjacent, unselected wordline reaches the second desired inhibit voltage when the selected wordline reaches the desired programming voltage.
7. The memory device of claim 6 , wherein the second adjacent, unselected wordline is on an opposite side of the selected wordline from the first adjacent, unselected wordline.
8. The memory device of claim 6 , wherein the at least one voltage regulator includes a first voltage regulator electrically coupled to the first adjacent, unselected wordline and a second voltage regulator electrically coupled to the second adjacent, unselected wordline.
9. The memory device of claim 6 , wherein the first desired inhibit voltage is equal to the second desired inhibit voltage.
10. The memory device of claim 1 , wherein the desired programming voltage is greater than or equal to two times the one or more desired inhibit voltages.
11. The memory device of claim 1 , wherein the at least one voltage regulator comprises:
an operational amplifier;
one or more resistors;
a first transistor electrically coupled to the operational amplifier; and
a second transistor electrically coupled to a driver of the selected wordline and to the one or more adjacent, unselected wordlines.
12. The memory device of claim 1 , wherein the one or more adjacent, unselected wordlines are electrically coupled to the selected wordline and to the at least one voltage regulator during the ramping of the one or more adjacent, unselected wordlines.
13. The memory device of claim 1 , wherein the memory cells are NAND memory cells.
14. A method for ramping a selected wordline and one or more adjacent, unselected wordlines in a memory device, the method comprising:
ramping the selected wordline to a desired programming voltage; and
ramping the one or more adjacent, unselected wordlines to one or more desired inhibit voltages such that the one or more adjacent, unselected wordlines reach the one or more desired inhibit voltages when the selected wordline reaches the desired programming voltage,
wherein the one or more adjacent, unselected wordlines are electrically coupled to the selected wordline.
15. The method of claim 14 , wherein ramping the selected wordline includes ramping the selected wordline to the desired programming voltage without floating the selected wordline.
16. The method of claim 15 , wherein ramping the selected wordline includes continuously ramping the selected wordline to the desired programming voltage, and wherein ramping the one or more adjacent, unselected wordlines includes continuously ramping the one or more adjacent, unselected wordlines to the one or more desired inhibit voltages.
17. The method of claim 15 , wherein ramping the one or more adjacent, unselected wordlines includes ramping the one or more adjacent, unselected wordlines to the one or more desired inhibit voltages in multiple steps.
18. The method of claim 14 , wherein ramping the one or more adjacent, unselected wordlines includes ramping the one or more adjacent, unselected wordlines to the one or more desired inhibit voltages using at least one voltage regulator that is electrically coupled to the one or more adjacent, unselected wordlines and to a driver of the selected wordline during ramping of the one or more adjacent, unselected wordlines.
19. The method of claim 14 , wherein the desired programming voltage is greater than or equal to two times the one or more desired inhibit voltages.
20. A memory system comprising:
a host device; and
a memory device including—
a controller,
at least one voltage regulator, and
a main memory electrically coupled to the controller, wherein the main memory includes a plurality of bitlines, a plurality of wordlines, and memory cells at intersections of the bitlines and the wordlines,
wherein the memory device is configured, in response to a programming command from the host device and/or the controller, to:
ramp a selected wordline in the plurality of wordlines to a desired programming voltage; and
ramp one or more adjacent, unselected wordlines to one or more desired inhibit voltages using the at least one voltage regulator,
wherein the one or more adjacent, unselected wordlines are electrically coupled to the selected wordline and to the at least one voltage regulator during the ramping of the one or more adjacent, unselected wordlines, and
wherein the memory device ramps the selected wordline and the one or more adjacent, unselected wordlines such that the one or more adjacent, unselected wordlines reach the one or more desired inhibit voltages when the selected wordline reaches the desired programming voltage.
21. The system of claim 20 , wherein the memory device is configured to ramp the selected wordline to the desired programming voltage without floating the selected wordline.
22. The system of claim 20 , wherein:
the at least one voltage regulator is electrically coupled to a driver of the selected wordline; and
the memory device is configured to ramp the one or more adjacent, unselected wordlines to the one or more desired inhibit voltages in steps by varying a reference voltage provided to the at least one voltage regulator.