Multi-dimensional usage space testing of memory components
A target vector representing a usage parameter corresponding to a test of a memory component is generated. A test sample is assigned to the target vector and a set of path variables are generated for the test sample. A test process of the test is executed using the test sample in accordance with the set of path variables to generate a test result. A failure associated with the test result is identified.
1. A method comprising:
generating a target vector representing a usage parameter corresponding to a test of a memory component;
assigning a test sample to the target vector;
randomly selecting a set of path variables to associate with the test sample;
executing, by a processing device, a test process of the test using the test sample in accordance with the set of path variables to generate a test result; and
identifying a failure associated with the test result.
2. The method of claim 1 , further comprising:
reserving one or more memory components as the test sample.
3. The method of claim 1 , further comprising:
generating a plurality of different target vectors, each of the different target vectors representing a different usage parameter.
4. The method of claim 3 , further comprising:
assigning a set of one or more test samples to each of the plurality of different target vectors.
5. The method of claim 4 , further comprising:
generating a set of randomly selected path variables to associate with each of the set of one or more test samples.
6. The method of claim 1 , further comprising:
receiving, via a connection with a test process corresponding to the test sample, feedback information comprising the test result.
7. A system comprising:
a memory component; and
a processing device, operatively coupled with the memory component, to:
generate a plurality of target vectors corresponding to a plurality of a first type of usage parameters of a memory component;
assign a first test sample to a target vector of the plurality of target vectors;
generate a first set of randomly selected path variables for the first test sample;
execute a first test process of the test using the first test sample in accordance with the first set of randomly selected path variables and the target vector to generate a first test result; and
identify a failure associated with the first test result.
8. The system of claim 7 , wherein the first type of usage parameters comprises at least one of: a count of writes, a count of reads, a block type, a partial program rate, an interrupt type, a time between writes, a time between reads, a block erase type, a read page fraction, an interrupt rate, a time between writes and reads, a block type rate, or an interrupt time.
9. The system of claim 7 , wherein the first set of path variables comprises one or more usage parameters exhibiting change during operation of a corresponding memory component.
10. The system of claim 7 , the processing device is further to:
assign a second test sample to the target vector of the plurality of target vectors;
generate a second set of randomly selected path variables for the second test sample; and
execute a second test process of the test using the second test sample in accordance with the second set of randomly selected path variables and the target vector to generate a second test result.
11. The system of claim 7 , the processing device is further to:
reserve a memory component of a test resource as the first test sample; and
assign connection information to the first test process executed using the first test sample.
12. The system of claim 7 , the processing device is further to:
receive, from the first test process via a connection established using the connection information, feedback information comprising the first test result.
13. A non-transitory computer readable medium comprising instructions, which when executed by a processing device, cause the processing device to perform operations comprising:
generating a target vector representing a usage parameter corresponding to a test of a memory component;
assigning a test sample to the target vector;
randomly selecting a set of path variables to associate with the test sample;
executing a test using the test sample in accordance with the set of path variables to generate a test result; and
identifying a failure associated with the test result.
14. The non-transitory computer readable medium of claim 13 , wherein the operations further comprise:
reserving one or more memory components as the test sample.
15. The non-transitory computer readable medium of claim 13 , wherein the operations further comprise:
generating a plurality of different target vectors, each of the different target vectors representing a different usage parameter.
16. The non-transitory computer readable medium of claim 15 , wherein the operations further comprise:
assigning a set of one or more test samples to each of the plurality of different target vectors.
17. The non-transitory computer readable medium of claim 16 , wherein the operations further comprise:
generating a set of randomly selected path variables to associate with each of the set of one or more test samples.
18. The non-transitory computer readable medium of claim 13 , wherein the operations further comprise:
receiving, via a connection with a test process corresponding to the first test sample, feedback information comprising the test result.