Driver placement in memories having stacked memory arrays
View Patent ↗A memory can have a stacked memory array that can have a plurality of levels of memory cells. Each respective level of memory cells can be commonly coupled to a respective access line. A plurality of drivers can be above the stacked memory array. Each respective driver can have a monocrystalline semiconductor with a conductive region coupled to a respective access line.
1. A memory, comprising:
a stacked memory array comprising a plurality of levels of memory cells, each respective level of memory cells commonly coupled to a respective access line; and
a plurality of drivers above the stacked memory array;
wherein each respective driver comprises a monocrystalline semiconductor fin comprising a conductive region coupled to a respective access line; and
wherein:
the conductive region is a first source/drain in a first portion of the monocrystalline semiconductor fin;
the monocrystalline semiconductor fin further comprises:
a second source/drain in a second portion of the monocrystalline semiconductor fin; and
a channel region in a third portion of the monocrystalline semiconductor fin between first and second portions; and
each respective driver comprises a gate that wraps around the channel region.
2. The memory of claim 1 , wherein each respective access line forms a respective step of a stairstep structure and the plurality of drivers is directly above the stairstep structure.
3. The memory of claim 1 , further comprising a dielectric between the stacked memory array and the monocrystalline semiconductor fin.
4. The memory of claim 1 , wherein the gate is common to the plurality of drivers.
5. The memory of claim 1 , wherein the second source/drain is coupled to receive an access signal to access the memory cells commonly coupled to the respective access line.
6. The memory of claim 1 , wherein the second source/drain is coupled to logic circuitry below the stacked memory array.
7. The memory of claim 1 , wherein the second source/drain is coupled to logic circuitry above the stacked memory array.
8. The memory of claim 1 , wherein each respective driver comprises a gate dielectric between the gate and the channel region.
9. The memory of claim 1 , wherein the gate comprises at least one of polysilicon and metal.
10. A memory comprising:
a stacked memory array comprising a stairstep structure comprising respective access line steps respectively commonly coupled to respective levels of memory cells of a plurality of levels of memory cells;
a plurality of monocrystalline semiconductor fins at a level above the stairstep structure, each respective monocrystalline semiconductor fin directly above a respective step, each respective monocrystalline semiconductor fin comprising:
a first source/drain coupled to the respective step;
a second source/drain coupled to receive a signal for accessing the respective level of memory cells; and
a channel region between the first and second source/drains; and
a gate commonly coupled to the channel regions.
11. The memory of claim 10 , further comprising a gate dielectric between each channel region and the gate that couples the gate to each channel region.
12. The memory of claim 11 , wherein the gate and the gate dielectric wrap around portions of the fins.
13. The memory of claim 10 , wherein
the first and second source/drains have a first conductivity level; and
each respective monocrystalline semiconductor fin further comprises a conductive region, having a second conductivity level lower that the first conductivity level, between the first source/drain and the channel region and between the second source/drain and the channel region.
14. A memory comprising:
a stacked memory array comprising a plurality of blocks, each respective block comprising a plurality of levels of memory cells, each respective level of memory cells commonly coupled to a respective access line of a plurality of access lines, each access line forming a respective step of a stairstep structure of the respective block such that the stairstep structures of the respective blocks respectively have steps at common levels;
a plurality of monocrystalline semiconductors at a level above the stairstep structures such that there is a respective monocrystalline semiconductor structure common to the steps at each of the common levels;
wherein each respective monocrystalline semiconductor comprises a first source/drain coupled to each of the steps at the common level, a second source/drain between the steps at the common level, and a channel region above each of the steps at the common level between the second source/drain and the first source/drain such that there is a channel region above each respective step of each respective block; and
a respective gate commonly coupled to the channel regions above each respective step of each respective block.
15. The memory of claim 14 , further comprising a dielectric between the stairstep structures and the plurality monocrystalline semiconductors.
16. The memory of claim 15 , wherein the dielectric comprises oxide.
17. A memory, comprising:
a stacked memory array comprising a plurality of levels of memory cells, each respective level of memory cells commonly coupled to a respective access line; and
a plurality of drivers above the stacked memory array;
wherein each respective driver comprises a plurality of monocrystalline semiconductor fins, with each respective monocrystalline semiconductor fin comprises a conductive region coupled to a respective access line; and
wherein:
the conductive region is a first source/drain in a first portion of each respective monocrystalline semiconductor fin;
each respective monocrystalline semiconductor fin further comprises:
a second source/drain in a second portion of each respective monocrystalline semiconductor fin; and
a channel region in a third portion of each respective monocrystalline semiconductor fin between first and second portions; and
each respective driver comprises a gate that wraps around the channel region.