System and method for photocathode illumination inspection
A high-brightness electron beam source is disclosed. The electron beam source may include a broadband illumination source configured to generate broadband illumination. A tunable spectral filter may be configured to filter the broadband illumination to provide filtered illumination having an excitation spectrum. The electron beam source may further include a photocathode configured to emit one or more electron beams in response to the filtered illumination, wherein emission from the photocathode is adjustable based on the excitation spectrum of the filtered illumination from the tunable spectral filter.
1. A high-brightness electron beam source comprising:
a broadband illumination source configured to generate broadband illumination;
a tunable spectral filter configured to filter the broadband illumination to provide filtered illumination having an excitation spectrum; and
a photocathode configured to emit one or more electron beams in response to the filtered illumination, wherein emission from the photocathode is adjustable based on the excitation spectrum of the filtered illumination from the tunable spectral filter,
wherein the tunable spectral filter is configured to generate the excitation spectrum including a first wavelength band configured to pump electrons in the photocathode to at least one intraband energy state, and a second wavelength band different from the first wavelength band, the second wavelength band configured to pump the electrons from the at least one intraband energy state to a vacuum state.
2. The high-brightness electron beam source of claim 1 , wherein the photocathode comprises:
an alkali halide photocathode.
3. The high-brightness electron beam source of claim 2 , wherein the alkali halide photocathode comprises:
at least one of CsBr, CsI, and Cs 2 Te.
4. The high-brightness electron beam source of claim 1 , wherein the tunable spectral filter is configured to provide the excitation spectrum selected to provide a selected balance between quantum efficiency of the photocathode and an energy spread of the one or more electron beams.
5. The high-brightness electron beam source of claim 1 , wherein the tunable spectral filter is configured to provide the excitation spectrum selected to provide emission from the photocathode in photoelectric mode.
6. The high-brightness electron beam source of claim 1 , wherein the tunable spectral filter is configured to provide the excitation spectrum selected to provide emission from the photocathode in photoemission mode.
7. The high-brightness electron beam source of claim 1 , wherein the photocathode comprises:
a CsBr photocathode.
8. The high-brightness electron beam source of claim 7 , wherein the two or more wavelength bands comprise:
the first wavelength band associated with photon energies in a range of approximately 4.6 eV to approximately 7.2 eV; and
the second wavelength band associated with photon energies greater than approximately 2.4 eV.
9. The high-brightness electron beam source of claim 1 , wherein the broadband illumination source comprises:
a continuous-wave illumination source, wherein the one or more electron beams emitted in response to the filtered illumination comprise one or more continuous electron beams.
10. The high-brightness electron beam source of claim 1 , wherein the broadband illumination source comprises:
a pulsed illumination source, wherein the one or more electron beams emitted in response to the filtered illumination comprise one or more pulsed electron beams.
11. The high-brightness electron beam source of claim 1 , wherein the broadband illumination source comprises:
at least one of a laser-produced plasma source or a laser-sustained plasma source.
12. The high-brightness electron beam source of claim 1 , wherein the broadband illumination source comprises:
at least one of a supercontinuum laser and a white-light laser.
13. The high-brightness electron beam source of claim 1 , wherein the broadband illumination source comprises:
at least one of an optical parametric oscillator and an optical parametric amplifier.
14. The high-brightness electron beam source of claim 1 , wherein the one or more electron beams comprise:
a single electron beam.
15. The high-brightness electron beam source of claim 14 , wherein the photocathode comprises:
at least one of a planar photocathode and a photocathode including a single emission tip.
16. The high-brightness electron beam source of claim 1 , wherein the one or more electron beams comprise:
two or more electron beams.
17. The high-brightness electron beam source of claim 16 , wherein the photocathode comprises:
at least one of a photocathode including two or more emission tips and a patterned photocathode providing two or more emission structures.
18. An inspection system comprising:
a high-brightness electron beam source comprising:
a broadband illumination source configured to generate broadband illumination;
a tunable spectral filter configured to filter the broadband illumination to provide filtered illumination having an excitation spectrum; and
a photocathode configured to emit one or more electron beams in response to the filtered illumination, wherein emission from the photocathode is adjustable based on the excitation spectrum of the filtered illumination from the tunable spectral filter, wherein the tunable spectral filter is configured to generate the excitation spectrum including a first wavelength band configured to pump electrons in the photocathode to at least one intraband energy state, and a second wavelength band different from the first wavelength band, the second wavelength band configured to pump the electrons from the at least one intraband energy state to a vacuum state; and
one or more electron focusing elements configured to direct the one or more electron beams from the high-brightness electron beam source to a sample; and
one or more detectors to detect radiation from the sample generated in response to the one or more electron beams.
19. The inspection system of claim 18 , wherein the one or more detectors comprise:
one or more electron detectors to detect at least one of secondary electrons or backscattered electrons emitted by the sample.
20. The inspection system of claim 18 , wherein the one or more detectors comprise:
at least one photodetector to detect photons emitted by the sample.
21. The inspection system of claim 18 , wherein the photocathode comprises:
an alkali halide photocathode.
22. The inspection system of claim 18 , wherein the tunable spectral filter is configured to provide the excitation spectrum selected to provide a selected balance between quantum efficiency of the photocathode and an energy spread of the one or more electron beams.
23. The inspection system of claim 18 , wherein the tunable spectral filter is configured to provide the excitation spectrum selected to provide emission from the photocathode in photoelectric mode.
24. The inspection system of claim 18 , wherein the tunable spectral filter is configured to provide the excitation spectrum selected to provide emission from the photocathode in photoemission mode.
25. The inspection system of claim 18 , wherein the broadband illumination source comprises:
a continuous-wave illumination source, wherein the one or more electron beams emitted in response to the filtered illumination comprise one or more continuous electron beams.
26. The inspection system of claim 18 , wherein the broadband illumination source comprises:
a pulsed illumination source, wherein the one or more electron beams emitted in response to the filtered illumination comprise one or more pulsed electron beams.
27. The inspection system of claim 18 , wherein the broadband illumination source comprises:
at least one of a laser-produced plasma source, a laser-sustained plasma source, a supercontinuum laser, a white-light laser, an optical parametric oscillator, and an optical parametric amplifier.
28. The inspection system of claim 18 , wherein the one or more electron beams comprise:
a single electron beam, wherein, the photocathode comprises:
at least one of a planar photocathode and a photocathode including a single emission tip.
29. The inspection system of claim 18 , wherein the one or more electron beams comprise:
two or more electron beams, wherein the photocathode comprises:
at least one of a photocathode including two or more emission tips and a patterned photocathode providing two or more emission structures.
30. A method for generating high-brightness electron beams comprising:
generating broadband illumination with a broadband illumination source;
filtering, with a tunable spectral filter, the broadband illumination to provide filtered illumination having an excitation spectrum including a first wavelength band and at least a second wavelength band different from the first wavelength band; and
emitting, with a photocathode, one or more electron beams in response to the filtered illumination, wherein emission from the photocathode is adjustable based on the excitation spectrum of the filtered illumination from the tunable spectral filter, the first wavelength band is configured to pump electrons in the photocathode to at least one intraband energy state, and the second wavelength band is configured to pump the electrons from the at least one intraband energy state to a vacuum state.
31. A high-brightness electron beam source comprising:
a broadband illumination source configured to generate broadband illumination;
a tunable spectral filter configured to filter the broadband illumination to provide filtered illumination having an excitation spectrum; and
a photocathode configured to emit one or more electron beams in response to the filtered illumination, wherein emission from the photocathode is adjustable based on the excitation spectrum of the filtered illumination from the tunable spectral filter,
wherein the tunable spectral filter is configured to provide the excitation spectrum selected to pump electrons in the photocathode to at least one of a resonant electronic band or a trap, wherein the photocathode includes a voltage source to generate an electric field to facilitate tunneling of the pumped electrons to generate the one or more electron beams.
32. An inspection system comprising:
a high-brightness electron beam source comprising:
a broadband illumination source configured to generate broadband illumination;
a tunable spectral filter configured to filter the broadband illumination to provide filtered illumination having an excitation spectrum; and
a photocathode configured to emit one or more electron beams in response to the filtered illumination, wherein emission from the photocathode is adjustable based on the excitation spectrum of the filtered illumination from the tunable spectral filter, wherein the tunable spectral filter is configured to provide the excitation spectrum selected to pump electrons in the photocathode to at least one of a resonant electronic band or a trap, wherein the photocathode includes a voltage source to generate an electric field to facilitate tunneling of the pumped electrons to generate the one or more electron beams; and
one or more electron focusing elements configured to direct the one or more electron beams from the high-brightness electron beam source to a sample; and
one or more detectors to detect radiation from the sample generated in response to the one or more electron beams.
33. A method for generating high-brightness electron beams comprising:
generating broadband illumination with a broadband illumination source;
filtering, with a tunable spectral filter, the broadband illumination to provide filtered illumination having an excitation spectrum; and
emitting, with a photocathode, one or more electron beams in response to the filtered illumination, wherein emission from the photocathode is adjustable based on the excitation spectrum of the filtered illumination from the tunable spectral filter, wherein the tunable spectral filter is configured to provide the excitation spectrum selected to pump electrons in the photocathode to at least one of a resonant electronic band or a trap, wherein the photocathode includes a voltage source to generate an electric field to facilitate tunneling of the pumped electrons to generate the one or more electron beams.